Fundamental parameters line profile fitting in laboratory diffractometers

The fundamental parameters approach to line profile fitting uses physically based models to generate the line profile shapes. Fundamental parameters profile fitting (FPPF) has been used to synthesize and fit data from both parallel beam and divergent beam diffractometers. The refined parameters are...

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Veröffentlicht in:	Journal of research of the National Institute of Standards and Technology 2004-01, Vol.109 (1), p.1-25
Hauptverfasser:	Cheary, R.W, Coelho, A.A, Cline, J.P
Format:	Artikel
Sprache:	eng
Schlagworte:	Diffraction Microstructure Optical properties Powder coatings R&D Research & development X-rays
Online-Zugang:	Volltext
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