Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping

Atomic force microscopy (AFM) uses a pyramidal tip attached to a cantilever to probe the force response of a surface. The deflections of the tip can be measured to ~10 pN by a laser and sectored detector, which can be converted to image topography. Amplitude modulation or “tapping mode” AFM involves...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	Journal of Visualized Experiments 2014-10 (92), p.e52164-e52164
Hauptverfasser:	Kroeger, Marie E., Sorenson, Blaire A., Thomas, J. Santoro, Stojković, Emina A., Tsonchev, Stefan, Nicholson, Kenneth T.
Format:	Artikel
Sprache:	eng
Schlagworte:	Aluminum Silicates - chemistry Mechanical Phenomena Microscopy, Atomic Force - instrumentation Microscopy, Atomic Force - methods Nanotechnology Photoreceptor Cells - chemistry Physics Phytochrome - chemistry
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!