Bismuth incorporation and the role of ordering in GaAsBi/GaAs structures
The structure and composition of single GaAsBi/GaAs epilayers grown by molecular beam epitaxy were investigated by optical and transmission electron microscopy techniques. Firstly, the GaAsBi layers exhibit two distinct regions and a varying Bi composition profile in the growth direction. In the low...
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Veröffentlicht in: | Nanoscale research letters 2014-01, Vol.9 (1), p.23-23, Article 23 |
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Sprache: | eng |
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