RISING beamline (BL28XU) for rechargeable battery analysis
The newly installed BL28XU beamline at SPring‐8 is dedicated to in situ structural and electronic analysis of rechargeable batteries. It supports the time range (1 ms to 100 s) and spatial range (1 µm to 1 mm) needed for battery analysis. Electrochemical apparatus for battery charging and dischargin...
Gespeichert in:
| Veröffentlicht in: | Journal of synchrotron radiation 2014-01, Vol.21 (1), p.268-272 |
|---|---|
| Hauptverfasser: | , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 272 |
|---|---|
| container_issue | 1 |
| container_start_page | 268 |
| container_title | Journal of synchrotron radiation |
| container_volume | 21 |
| creator | Tanida, H. Fukuda, K. Murayama, H. Orikasa, Y. Arai, H. Uchimoto, Y. Matsubara, E. Uruga, T. Takeshita, K. Takahashi, S. Sano, M. Aoyagi, H. Watanabe, A. Nariyama, N. Ohashi, H. Yumoto, H. Koyama, T. Senba, Y. Takeuchi, T. Furukawa, Y. Ohata, T. Matsushita, T. Ishizawa, Y. Kudo, T. Kimura, H. Yamazaki, H. Tanaka, T. Bizen, T. Seike, T. Goto, S. Ohno, H. Takata, M. Kitamura, H. Ishikawa, T. Ohta, T. Ogumi, Z. |
| description | The newly installed BL28XU beamline at SPring‐8 is dedicated to in situ structural and electronic analysis of rechargeable batteries. It supports the time range (1 ms to 100 s) and spatial range (1 µm to 1 mm) needed for battery analysis. Electrochemical apparatus for battery charging and discharging are available in experimental hutches and in a preparation room. Battery analysis can be carried out efficiently and effectively using X‐ray diffraction, X‐ray absorption fine‐structure analysis and hard X‐ray photoelectron spectroscopy. Here, the design and performance of the beamline are described, and preliminary results are presented. |
| doi_str_mv | 10.1107/S1600577513025733 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_24P</sourceid><recordid>TN_cdi_pubmedcentral_primary_oai_pubmedcentral_nih_gov_3874024</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>1490730496</sourcerecordid><originalsourceid>FETCH-LOGICAL-c6143-56835a54d2b9a6567cf1c13fe9ce01e836c4eaad4dcbb96cb9f3f04ce3996e173</originalsourceid><addsrcrecordid>eNqNkU1v1DAQhi0EomXhB3BBkbiUQ8CT8UfMoRL9YNmyLBLbCjhZjnfSpmST1s4C--9J2LIqcICTrZnnfe2Zl7HHwJ8DcP1iDopzqbUE5JnUiHfY7lBKh9rdW_cd9iDGS85B6Qzvs51MoJJG5Lvs5YfJfDIbJwW5ZV01lOwdTLP809mzpGxDEshfuHBOrqgpKVzXUVgnrnH1OlbxIbtXujrSo5tzxM5eH58evkmn78eTw1fT1CsQmEqVo3RSLLLCOCWV9iV4wJKMJw6Uo_KCnFuIhS8Ko3xhSiy58ITGKAKNI7a_8b1aFUtaeGq64Gp7FaqlC2vbusr-3mmqC3vefrWYa8H7UUds78YgtNcrip1dVtFTXbuG2lW0IIzATECu_wflGrkwqkef_oFetqvQ72agNGQS4efbsKF8aGMMVG7_DdwOIdq_Quw1T24PvFX8Sq0HzAb4VtW0_rejPZl_zibHEvhgnm60Vezo-1brwherNGppP87G9uR0Nn579C63B_gDbRe0cA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1471253124</pqid></control><display><type>article</type><title>RISING beamline (BL28XU) for rechargeable battery analysis</title><source>Wiley Online Library Open Access</source><creator>Tanida, H. ; Fukuda, K. ; Murayama, H. ; Orikasa, Y. ; Arai, H. ; Uchimoto, Y. ; Matsubara, E. ; Uruga, T. ; Takeshita, K. ; Takahashi, S. ; Sano, M. ; Aoyagi, H. ; Watanabe, A. ; Nariyama, N. ; Ohashi, H. ; Yumoto, H. ; Koyama, T. ; Senba, Y. ; Takeuchi, T. ; Furukawa, Y. ; Ohata, T. ; Matsushita, T. ; Ishizawa, Y. ; Kudo, T. ; Kimura, H. ; Yamazaki, H. ; Tanaka, T. ; Bizen, T. ; Seike, T. ; Goto, S. ; Ohno, H. ; Takata, M. ; Kitamura, H. ; Ishikawa, T. ; Ohta, T. ; Ogumi, Z.</creator><creatorcontrib>Tanida, H. ; Fukuda, K. ; Murayama, H. ; Orikasa, Y. ; Arai, H. ; Uchimoto, Y. ; Matsubara, E. ; Uruga, T. ; Takeshita, K. ; Takahashi, S. ; Sano, M. ; Aoyagi, H. ; Watanabe, A. ; Nariyama, N. ; Ohashi, H. ; Yumoto, H. ; Koyama, T. ; Senba, Y. ; Takeuchi, T. ; Furukawa, Y. ; Ohata, T. ; Matsushita, T. ; Ishizawa, Y. ; Kudo, T. ; Kimura, H. ; Yamazaki, H. ; Tanaka, T. ; Bizen, T. ; Seike, T. ; Goto, S. ; Ohno, H. ; Takata, M. ; Kitamura, H. ; Ishikawa, T. ; Ohta, T. ; Ogumi, Z.</creatorcontrib><description>The newly installed BL28XU beamline at SPring‐8 is dedicated to in situ structural and electronic analysis of rechargeable batteries. It supports the time range (1 ms to 100 s) and spatial range (1 µm to 1 mm) needed for battery analysis. Electrochemical apparatus for battery charging and discharging are available in experimental hutches and in a preparation room. Battery analysis can be carried out efficiently and effectively using X‐ray diffraction, X‐ray absorption fine‐structure analysis and hard X‐ray photoelectron spectroscopy. Here, the design and performance of the beamline are described, and preliminary results are presented.</description><identifier>ISSN: 1600-5775</identifier><identifier>ISSN: 0909-0495</identifier><identifier>EISSN: 1600-5775</identifier><identifier>DOI: 10.1107/S1600577513025733</identifier><identifier>PMID: 24365948</identifier><language>eng</language><publisher>5 Abbey Square, Chester, Cheshire CH1 2HU, England: International Union of Crystallography</publisher><subject>Beamlines ; Charging ; in situ analysis ; lithium-ion battery ; time X-ray diffraction ; X-ray absorption fine structure</subject><ispartof>Journal of synchrotron radiation, 2014-01, Vol.21 (1), p.268-272</ispartof><rights>H. Tanida et al. 2014</rights><rights>H. Tanida et al. 2014</rights><rights>H. Tanida et al. 2014 2014</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c6143-56835a54d2b9a6567cf1c13fe9ce01e836c4eaad4dcbb96cb9f3f04ce3996e173</citedby><cites>FETCH-LOGICAL-c6143-56835a54d2b9a6567cf1c13fe9ce01e836c4eaad4dcbb96cb9f3f04ce3996e173</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://www.ncbi.nlm.nih.gov/pmc/articles/PMC3874024/pdf/$$EPDF$$P50$$Gpubmedcentral$$Hfree_for_read</linktopdf><linktohtml>$$Uhttps://www.ncbi.nlm.nih.gov/pmc/articles/PMC3874024/$$EHTML$$P50$$Gpubmedcentral$$Hfree_for_read</linktohtml><link.rule.ids>230,314,723,776,780,881,1411,11541,27901,27902,45550,45551,46027,46451,53766,53768</link.rule.ids><linktorsrc>$$Uhttps://onlinelibrary.wiley.com/doi/abs/10.1107%2FS1600577513025733$$EView_record_in_Wiley-Blackwell$$FView_record_in_$$GWiley-Blackwell</linktorsrc><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/24365948$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Tanida, H.</creatorcontrib><creatorcontrib>Fukuda, K.</creatorcontrib><creatorcontrib>Murayama, H.</creatorcontrib><creatorcontrib>Orikasa, Y.</creatorcontrib><creatorcontrib>Arai, H.</creatorcontrib><creatorcontrib>Uchimoto, Y.</creatorcontrib><creatorcontrib>Matsubara, E.</creatorcontrib><creatorcontrib>Uruga, T.</creatorcontrib><creatorcontrib>Takeshita, K.</creatorcontrib><creatorcontrib>Takahashi, S.</creatorcontrib><creatorcontrib>Sano, M.</creatorcontrib><creatorcontrib>Aoyagi, H.</creatorcontrib><creatorcontrib>Watanabe, A.</creatorcontrib><creatorcontrib>Nariyama, N.</creatorcontrib><creatorcontrib>Ohashi, H.</creatorcontrib><creatorcontrib>Yumoto, H.</creatorcontrib><creatorcontrib>Koyama, T.</creatorcontrib><creatorcontrib>Senba, Y.</creatorcontrib><creatorcontrib>Takeuchi, T.</creatorcontrib><creatorcontrib>Furukawa, Y.</creatorcontrib><creatorcontrib>Ohata, T.</creatorcontrib><creatorcontrib>Matsushita, T.</creatorcontrib><creatorcontrib>Ishizawa, Y.</creatorcontrib><creatorcontrib>Kudo, T.</creatorcontrib><creatorcontrib>Kimura, H.</creatorcontrib><creatorcontrib>Yamazaki, H.</creatorcontrib><creatorcontrib>Tanaka, T.</creatorcontrib><creatorcontrib>Bizen, T.</creatorcontrib><creatorcontrib>Seike, T.</creatorcontrib><creatorcontrib>Goto, S.</creatorcontrib><creatorcontrib>Ohno, H.</creatorcontrib><creatorcontrib>Takata, M.</creatorcontrib><creatorcontrib>Kitamura, H.</creatorcontrib><creatorcontrib>Ishikawa, T.</creatorcontrib><creatorcontrib>Ohta, T.</creatorcontrib><creatorcontrib>Ogumi, Z.</creatorcontrib><title>RISING beamline (BL28XU) for rechargeable battery analysis</title><title>Journal of synchrotron radiation</title><addtitle>Jnl of Synchrotron Radiation</addtitle><description>The newly installed BL28XU beamline at SPring‐8 is dedicated to in situ structural and electronic analysis of rechargeable batteries. It supports the time range (1 ms to 100 s) and spatial range (1 µm to 1 mm) needed for battery analysis. Electrochemical apparatus for battery charging and discharging are available in experimental hutches and in a preparation room. Battery analysis can be carried out efficiently and effectively using X‐ray diffraction, X‐ray absorption fine‐structure analysis and hard X‐ray photoelectron spectroscopy. Here, the design and performance of the beamline are described, and preliminary results are presented.</description><subject>Beamlines</subject><subject>Charging</subject><subject>in situ analysis</subject><subject>lithium-ion battery</subject><subject>time X-ray diffraction</subject><subject>X-ray absorption fine structure</subject><issn>1600-5775</issn><issn>0909-0495</issn><issn>1600-5775</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2014</creationdate><recordtype>article</recordtype><recordid>eNqNkU1v1DAQhi0EomXhB3BBkbiUQ8CT8UfMoRL9YNmyLBLbCjhZjnfSpmST1s4C--9J2LIqcICTrZnnfe2Zl7HHwJ8DcP1iDopzqbUE5JnUiHfY7lBKh9rdW_cd9iDGS85B6Qzvs51MoJJG5Lvs5YfJfDIbJwW5ZV01lOwdTLP809mzpGxDEshfuHBOrqgpKVzXUVgnrnH1OlbxIbtXujrSo5tzxM5eH58evkmn78eTw1fT1CsQmEqVo3RSLLLCOCWV9iV4wJKMJw6Uo_KCnFuIhS8Ko3xhSiy58ITGKAKNI7a_8b1aFUtaeGq64Gp7FaqlC2vbusr-3mmqC3vefrWYa8H7UUds78YgtNcrip1dVtFTXbuG2lW0IIzATECu_wflGrkwqkef_oFetqvQ72agNGQS4efbsKF8aGMMVG7_DdwOIdq_Quw1T24PvFX8Sq0HzAb4VtW0_rejPZl_zibHEvhgnm60Vezo-1brwherNGppP87G9uR0Nn579C63B_gDbRe0cA</recordid><startdate>201401</startdate><enddate>201401</enddate><creator>Tanida, H.</creator><creator>Fukuda, K.</creator><creator>Murayama, H.</creator><creator>Orikasa, Y.</creator><creator>Arai, H.</creator><creator>Uchimoto, Y.</creator><creator>Matsubara, E.</creator><creator>Uruga, T.</creator><creator>Takeshita, K.</creator><creator>Takahashi, S.</creator><creator>Sano, M.</creator><creator>Aoyagi, H.</creator><creator>Watanabe, A.</creator><creator>Nariyama, N.</creator><creator>Ohashi, H.</creator><creator>Yumoto, H.</creator><creator>Koyama, T.</creator><creator>Senba, Y.</creator><creator>Takeuchi, T.</creator><creator>Furukawa, Y.</creator><creator>Ohata, T.</creator><creator>Matsushita, T.</creator><creator>Ishizawa, Y.</creator><creator>Kudo, T.</creator><creator>Kimura, H.</creator><creator>Yamazaki, H.</creator><creator>Tanaka, T.</creator><creator>Bizen, T.</creator><creator>Seike, T.</creator><creator>Goto, S.</creator><creator>Ohno, H.</creator><creator>Takata, M.</creator><creator>Kitamura, H.</creator><creator>Ishikawa, T.</creator><creator>Ohta, T.</creator><creator>Ogumi, Z.</creator><general>International Union of Crystallography</general><general>John Wiley & Sons, Inc</general><scope>BSCLL</scope><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7U5</scope><scope>8FD</scope><scope>JQ2</scope><scope>L7M</scope><scope>7X8</scope><scope>7SP</scope><scope>7TB</scope><scope>FR3</scope><scope>5PM</scope></search><sort><creationdate>201401</creationdate><title>RISING beamline (BL28XU) for rechargeable battery analysis</title><author>Tanida, H. ; Fukuda, K. ; Murayama, H. ; Orikasa, Y. ; Arai, H. ; Uchimoto, Y. ; Matsubara, E. ; Uruga, T. ; Takeshita, K. ; Takahashi, S. ; Sano, M. ; Aoyagi, H. ; Watanabe, A. ; Nariyama, N. ; Ohashi, H. ; Yumoto, H. ; Koyama, T. ; Senba, Y. ; Takeuchi, T. ; Furukawa, Y. ; Ohata, T. ; Matsushita, T. ; Ishizawa, Y. ; Kudo, T. ; Kimura, H. ; Yamazaki, H. ; Tanaka, T. ; Bizen, T. ; Seike, T. ; Goto, S. ; Ohno, H. ; Takata, M. ; Kitamura, H. ; Ishikawa, T. ; Ohta, T. ; Ogumi, Z.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c6143-56835a54d2b9a6567cf1c13fe9ce01e836c4eaad4dcbb96cb9f3f04ce3996e173</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2014</creationdate><topic>Beamlines</topic><topic>Charging</topic><topic>in situ analysis</topic><topic>lithium-ion battery</topic><topic>time X-ray diffraction</topic><topic>X-ray absorption fine structure</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Tanida, H.</creatorcontrib><creatorcontrib>Fukuda, K.</creatorcontrib><creatorcontrib>Murayama, H.</creatorcontrib><creatorcontrib>Orikasa, Y.</creatorcontrib><creatorcontrib>Arai, H.</creatorcontrib><creatorcontrib>Uchimoto, Y.</creatorcontrib><creatorcontrib>Matsubara, E.</creatorcontrib><creatorcontrib>Uruga, T.</creatorcontrib><creatorcontrib>Takeshita, K.</creatorcontrib><creatorcontrib>Takahashi, S.</creatorcontrib><creatorcontrib>Sano, M.</creatorcontrib><creatorcontrib>Aoyagi, H.</creatorcontrib><creatorcontrib>Watanabe, A.</creatorcontrib><creatorcontrib>Nariyama, N.</creatorcontrib><creatorcontrib>Ohashi, H.</creatorcontrib><creatorcontrib>Yumoto, H.</creatorcontrib><creatorcontrib>Koyama, T.</creatorcontrib><creatorcontrib>Senba, Y.</creatorcontrib><creatorcontrib>Takeuchi, T.</creatorcontrib><creatorcontrib>Furukawa, Y.</creatorcontrib><creatorcontrib>Ohata, T.</creatorcontrib><creatorcontrib>Matsushita, T.</creatorcontrib><creatorcontrib>Ishizawa, Y.</creatorcontrib><creatorcontrib>Kudo, T.</creatorcontrib><creatorcontrib>Kimura, H.</creatorcontrib><creatorcontrib>Yamazaki, H.</creatorcontrib><creatorcontrib>Tanaka, T.</creatorcontrib><creatorcontrib>Bizen, T.</creatorcontrib><creatorcontrib>Seike, T.</creatorcontrib><creatorcontrib>Goto, S.</creatorcontrib><creatorcontrib>Ohno, H.</creatorcontrib><creatorcontrib>Takata, M.</creatorcontrib><creatorcontrib>Kitamura, H.</creatorcontrib><creatorcontrib>Ishikawa, T.</creatorcontrib><creatorcontrib>Ohta, T.</creatorcontrib><creatorcontrib>Ogumi, Z.</creatorcontrib><collection>Istex</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>MEDLINE - Academic</collection><collection>Electronics & Communications Abstracts</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>Engineering Research Database</collection><collection>PubMed Central (Full Participant titles)</collection><jtitle>Journal of synchrotron radiation</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Tanida, H.</au><au>Fukuda, K.</au><au>Murayama, H.</au><au>Orikasa, Y.</au><au>Arai, H.</au><au>Uchimoto, Y.</au><au>Matsubara, E.</au><au>Uruga, T.</au><au>Takeshita, K.</au><au>Takahashi, S.</au><au>Sano, M.</au><au>Aoyagi, H.</au><au>Watanabe, A.</au><au>Nariyama, N.</au><au>Ohashi, H.</au><au>Yumoto, H.</au><au>Koyama, T.</au><au>Senba, Y.</au><au>Takeuchi, T.</au><au>Furukawa, Y.</au><au>Ohata, T.</au><au>Matsushita, T.</au><au>Ishizawa, Y.</au><au>Kudo, T.</au><au>Kimura, H.</au><au>Yamazaki, H.</au><au>Tanaka, T.</au><au>Bizen, T.</au><au>Seike, T.</au><au>Goto, S.</au><au>Ohno, H.</au><au>Takata, M.</au><au>Kitamura, H.</au><au>Ishikawa, T.</au><au>Ohta, T.</au><au>Ogumi, Z.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>RISING beamline (BL28XU) for rechargeable battery analysis</atitle><jtitle>Journal of synchrotron radiation</jtitle><addtitle>Jnl of Synchrotron Radiation</addtitle><date>2014-01</date><risdate>2014</risdate><volume>21</volume><issue>1</issue><spage>268</spage><epage>272</epage><pages>268-272</pages><issn>1600-5775</issn><issn>0909-0495</issn><eissn>1600-5775</eissn><abstract>The newly installed BL28XU beamline at SPring‐8 is dedicated to in situ structural and electronic analysis of rechargeable batteries. It supports the time range (1 ms to 100 s) and spatial range (1 µm to 1 mm) needed for battery analysis. Electrochemical apparatus for battery charging and discharging are available in experimental hutches and in a preparation room. Battery analysis can be carried out efficiently and effectively using X‐ray diffraction, X‐ray absorption fine‐structure analysis and hard X‐ray photoelectron spectroscopy. Here, the design and performance of the beamline are described, and preliminary results are presented.</abstract><cop>5 Abbey Square, Chester, Cheshire CH1 2HU, England</cop><pub>International Union of Crystallography</pub><pmid>24365948</pmid><doi>10.1107/S1600577513025733</doi><tpages>5</tpages><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISSN: 1600-5775 |
| ispartof | Journal of synchrotron radiation, 2014-01, Vol.21 (1), p.268-272 |
| issn | 1600-5775 0909-0495 1600-5775 |
| language | eng |
| recordid | cdi_pubmedcentral_primary_oai_pubmedcentral_nih_gov_3874024 |
| source | Wiley Online Library Open Access |
| subjects | Beamlines Charging in situ analysis lithium-ion battery time X-ray diffraction X-ray absorption fine structure |
| title | RISING beamline (BL28XU) for rechargeable battery analysis |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-08T01%3A10%3A53IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_24P&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=RISING%20beamline%20(BL28XU)%20for%20rechargeable%20battery%20analysis&rft.jtitle=Journal%20of%20synchrotron%20radiation&rft.au=Tanida,%20H.&rft.date=2014-01&rft.volume=21&rft.issue=1&rft.spage=268&rft.epage=272&rft.pages=268-272&rft.issn=1600-5775&rft.eissn=1600-5775&rft_id=info:doi/10.1107/S1600577513025733&rft_dat=%3Cproquest_24P%3E1490730496%3C/proquest_24P%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1471253124&rft_id=info:pmid/24365948&rfr_iscdi=true |