X-ray based tools for the investigation of buried interfaces in organic electronic devices

[Display omitted] ► We fabricated orthogonal soluble polymer stacks and probed the buried interface by X-ray reflectivity. ► Depending on the used solvent of the organic semiconducting material the interface morphology changed significantly. ► Grazing incidence X-ray diffraction exhibits the molecul...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Veröffentlicht in:	Organic electronics 2013-02, Vol.14 (2), p.479-487
Hauptverfasser:	Neuhold, Alfred, Brandner, Hannes, Ausserlechner, Simon J., Lorbek, Stefan, Neuschitzer, Markus, Zojer, Egbert, Teichert, Christian, Resel, Roland
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Atomic force microscopy Buried interface morphology Condensed matter: structure, mechanical and thermal properties Electron, ion, and scanning probe microscopy Electronics Exact sciences and technology Grazing incidence X-ray diffraction Interface structure and roughness Mobility enhancement Molecular electronics, nanoelectronics Organic thin film transistor Physics Scanning probe microscopy: scanning tunneling, atomic force, scanning optical, magnetic force, etc Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Solid surfaces and solid-solid interfaces Structure of solids and liquids crystallography Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) Transistors X-ray reflectivity
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Schreiben Sie den ersten Kommentar!