Zone‐doubled Fresnel zone plates for high‐resolution hard X‐ray full‐field transmission microscopy

Full‐field transmission X‐ray microscopy is a unique non‐destructive technique for three‐dimensional imaging of specimens at the nanometer scale. Here, the use of zone‐doubled Fresnel zone plates to achieve a spatial resolution better than 20 nm in the hard X‐ray regime (8–10 keV) is reported. By ob...

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Veröffentlicht in:J Synchrotron Rad 2012-09, Vol.19 (5), p.705-709
Hauptverfasser: Vila‐Comamala, Joan, Pan, Yongsheng, Lombardo, Jeffrey J., Harris, William M., Chiu, Wilson K. S., David, Christian, Wang, Yuxin
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Sprache:eng
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Zusammenfassung:Full‐field transmission X‐ray microscopy is a unique non‐destructive technique for three‐dimensional imaging of specimens at the nanometer scale. Here, the use of zone‐doubled Fresnel zone plates to achieve a spatial resolution better than 20 nm in the hard X‐ray regime (8–10 keV) is reported. By obtaining a tomographic reconstruction of a Ni/YSZ solid‐oxide fuel cell, the feasibility of performing three‐dimensional imaging of scientifically relevant samples using such high‐spatial‐resolution Fresnel zone plates is demonstrated.
ISSN:1600-5775
0909-0495
1600-5775
DOI:10.1107/S0909049512029640