An assessment of the resolution limitation due to radiation-damage in X-ray diffraction microscopy

X-ray diffraction microscopy (XDM) is a new form of X-ray imaging that is being practiced at several third-generation synchrotron-radiation X-ray facilities. Nine years have elapsed since the technique was first introduced and it has made rapid progress in demonstrating high-resolution three-dimensi...

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Veröffentlicht in:	Journal of electron spectroscopy and related phenomena 2009-03, Vol.170 (1), p.4-12
Hauptverfasser:	Howells, M.R., Beetz, T., Chapman, H.N., Cui, C., Holton, J.M., Jacobsen, C.J., Kirz, J., Lima, E., Marchesini, S., Miao, H., Sayre, D., Shapiro, D.A., Spence, J.C.H., Starodub, D.
Format:	Artikel
Sprache:	eng
Schlagworte:	Coherent X-rays Diffraction imaging Dose fractionation Frozen-hydrated samples Radiation damage
Online-Zugang:	Volltext
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