A charge coupled device camera with electron decelerator for intermediate voltage electron microscopy

Electron microscopists are increasingly turning to intermediate voltage electron microscopes (IVEMs) operating at 300 - 400 kV for a wide range of studies. They are also increasingly taking advantage of slow-scan charge coupled device (CCD) cameras, which have become widely used on electron microsco...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	Review of scientific instruments 2008-04, Vol.79 (4), p.043702-043702-10
Hauptverfasser:	Downing, Kenneth H., Mooney, Paul E.
Format:	Artikel
Sprache:	eng
Schlagworte:	Crystallography - instrumentation Crystallography - methods Electrons Equipment Design Equipment Failure Analysis Image Enhancement - instrumentation Image Enhancement - methods Microscopy and Imaging Microscopy, Electron - instrumentation Microscopy, Electron - methods Signal Processing, Computer-Assisted - instrumentation
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!