XPS Depth-Profiling Studies of Chlorophyll Binding to Poly(cysteine methacrylate) Scaffolds in Pigment–Polymer Antenna Complexes Using a Gas Cluster Ion Source

X-ray photoelectron spectroscopy (XPS) depth-profiling with an argon gas cluster ion source (GCIS) was used to characterize the spatial distribution of chlorophyll a (Chl) within a poly­(cysteine methacrylate) (PCysMA) brush grown by surface-initiated atom-transfer radical polymerization (ATRP) from...

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Veröffentlicht in:	Langmuir 2024-07, Vol.40 (28), p.14527-14539
Hauptverfasser:	Csányi, Evelin, Hammond, Deborah B., Bower, Benjamin, Johnson, Edwin C., Lishchuk, Anna, Armes, Steven P., Dong, Zhaogang, Leggett, Graham J.
Format:	Artikel
Sprache:	eng
Schlagworte:	chlorophyll cysteine elemental composition gold nitrogen polymerization X-ray photoelectron spectroscopy
Online-Zugang:	Volltext
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