Spatial Localization of Defects in Halide Perovskites Using Photothermal Deflection Spectroscopy

Photothermal deflection spectroscopy (PDS) emerges as a highly sensitive noncontact technique for measuring absorption spectra and serves for studying defect states within semiconductor thin films. In our study, we applied PDS to methyl­ammonium lead bromide single crystals. By analyzing the frequen...

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Veröffentlicht in:	The journal of physical chemistry letters 2024-02, Vol.15 (5), p.1273-1278
Hauptverfasser:	Vlk, Ales, Remes, Zdenek, Landova, Lucie, Ridzonova, Katarina, Hlavac, Robert, Fejfar, Antonin, Ledinsky, Martin
Format:	Artikel
Sprache:	eng
Schlagworte:	Letter Physical Insights into Materials and Molecular Properties
Online-Zugang:	Volltext
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