Influence of the Polymeric Matrix on the Optical and Electrical Properties of Copper Porphine-Based Semiconductor Hybrid Films

In this study, we assessed the electrical and optical behavior of semiconductor hybrid films fabricated from octaethyl-21H,23H-porphine copper (CuP), embedded in polymethylmethacrylate (PMMA), and polystyrene (PS). The hybrid films were characterized structurally and morphologically using infrared s...

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Veröffentlicht in:	Polymers 2023-07, Vol.15 (14), p.3125
Hauptverfasser:	Sánchez Vergara, Maria Elena, Hernández Méndez, Joaquín André, González Verdugo, Daniela, Giammattei Funes, Isabella María, Lozada Flores, Octavio
Format:	Artikel
Sprache:	eng
Schlagworte:	Analysis Atomic force microscopy Chemical bonds Copper Crystallization Diffraction Electric properties Electrical properties Glass substrates Information storage Infrared spectroscopy Manufacturing Microscopy Molecular weight Morphology Optical properties Optics Optoelectronic devices Polymers Polymethyl methacrylate Polymethylmethacrylate Polystyrene resins Semiconductors Sensors Silicon Thin films VOCs Volatile organic compounds X-rays
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