Investigation of the structure and dielectric properties of doped barium titanates

This work examined the influence of zirconium concentration on barium titanate (BZT) BaZr x Ti 1− x O 3 , with ( x = 0, 0.15, 0.50, 0.75, and 1), produced by the tartrate precursor technique. The Fourier transform infrared (FTIR) spectra support the X-ray diffraction (XRD) results regarding formatio...

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Veröffentlicht in:RSC advances 2024-01, Vol.14 (5), p.3335-3345
Hauptverfasser: Salem, Mohamed M, Darwish, Moustafa A, Altarawneh, Aseel M, Alibwaini, Yamen A, Ghazy, Ryad, Hemeda, Osama M, Zhou, Di, Trukhanova, Ekaterina L, Trukhanov, Alex V, Trukhanov, Sergei V, Mostafa, Maha
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Sprache:eng
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Zusammenfassung:This work examined the influence of zirconium concentration on barium titanate (BZT) BaZr x Ti 1− x O 3 , with ( x = 0, 0.15, 0.50, 0.75, and 1), produced by the tartrate precursor technique. The Fourier transform infrared (FTIR) spectra support the X-ray diffraction (XRD) results regarding formation of the perovskite structure. Grain size grows with Zr concentration, suggesting that the presence of Zr ions enlarges the grains. The transmission electron microscopy (TEM) images demonstrated that, due to their nano size, nanocrystallites are agglomerated in most images with irregular morphologies and average particle sizes from 20.75 nm to 63.75 nm. Increasing Zr content diminished the piezoelectric coefficient ( d 33 ) and the grain size. The value of d 33 decreases by increasing Zr content, and there is an inverse relationship between grain size and d 33 . The remnant polarization of BZT increases with increasing Zr 4+ content, which may be suitable for permanent memory device applications. This work examined the influence of zirconium concentration on barium titanate (BZT) BaZr x Ti 1− x O 3 , with ( x = 0, 0.15, 0.50, 0.75, and 1), produced by the tartrate precursor technique.
ISSN:2046-2069
2046-2069
DOI:10.1039/d3ra05885a