Thermal conductivity vs depth profiling using the hot disk technique—Analysis of anisotropic, inhomogeneous structures
A recently developed method for analyzing the thermal conductivity vs depth variation near a sample surface has been extended to include inhomogeneous samples with anisotropy. If not considered, the anisotropy ratio in the sample structure can distort the depth-position data of the original test met...
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| Veröffentlicht in: | Review of scientific instruments 2023-07, Vol.94 (7) |
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| container_title | Review of scientific instruments |
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| creator | Sizov, A. Mihiretie, B. Ma, Y. Gustafsson, S. E. Gustavsson, M. |
| description | A recently developed method for analyzing the thermal conductivity vs depth variation near a sample surface has been extended to include inhomogeneous samples with anisotropy. If not considered, the anisotropy ratio in the sample structure can distort the depth-position data of the original test method. The anisotropy ratio is introduced in the original computational scheme in order to improve the depth-position estimations for inhomogeneous structures with anisotropy. The proposed approach has been tested in experiments and shown to improve depth position mapping. |
| doi_str_mv | 10.1063/5.0145902 |
| format | Article |
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| ispartof | Review of scientific instruments, 2023-07, Vol.94 (7) |
| issn | 0034-6748 1089-7623 1089-7623 |
| language | eng |
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| source | American Institute of Physics; Alma/SFX Local Collection; SWEPUB Freely available online |
| subjects | Anisotropy Depth profiling Electric Conductivity Heat transfer Scientific apparatus & instruments Thermal Conductivity |
| title | Thermal conductivity vs depth profiling using the hot disk technique—Analysis of anisotropic, inhomogeneous structures |
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