Chemical Identification in the Specular and Off-Specular Rough-Surface Scattered Terahertz Spectra Using Wavelet Shrinkage
We present the development and implementation of a novel wavelet shrinkage technique for the retrieval of obscured characteristic resonant signatures in the scattered terahertz (THz) reflectivity of molecular crystals. In this implementation, the wavelet basis functions associated with the absorptio...
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description | We present the development and implementation of a novel wavelet shrinkage technique for the retrieval of obscured characteristic resonant signatures in the scattered terahertz (THz) reflectivity of molecular crystals. In this implementation, the wavelet basis functions associated with the absorption features were identified using the second-order total variation of the wavelet coefficients. Additionally, wavelet coefficients at certain scales were modified using the phase function corrections and wavelet hard thresholding. Reconstruction of the original spectra using these modified wavelet coefficients yielded the exact resonant frequencies of the chemicals, which were otherwise unrecognizable in the spectral artifacts of the rough surface scattering. We examined the robustness of this method over controlled levels of rough surface scattering, validated using the Kirchhoff approximation, in spectroscopic targets made from \alpha -lactose monohydrate and 4-aminobenzoic acid (PABA), which have close spectral lines. We successfully retrieved the spectral absorption fingerprints in both specular and off-specular reflection geometries. This technique can be utilized for stand-off material characterization using the THz reflection spectroscopy in uncontrolled environments and potentially can be adopted for other broadband spectroscopic modalities. |
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Hassan</creator><creatorcontrib>Khani, Mahmoud E. ; Arbab, M. Hassan</creatorcontrib><description>We present the development and implementation of a novel wavelet shrinkage technique for the retrieval of obscured characteristic resonant signatures in the scattered terahertz (THz) reflectivity of molecular crystals. In this implementation, the wavelet basis functions associated with the absorption features were identified using the second-order total variation of the wavelet coefficients. Additionally, wavelet coefficients at certain scales were modified using the phase function corrections and wavelet hard thresholding. Reconstruction of the original spectra using these modified wavelet coefficients yielded the exact resonant frequencies of the chemicals, which were otherwise unrecognizable in the spectral artifacts of the rough surface scattering. We examined the robustness of this method over controlled levels of rough surface scattering, validated using the Kirchhoff approximation, in spectroscopic targets made from <inline-formula> <tex-math notation="LaTeX">\alpha </tex-math></inline-formula>-lactose monohydrate and 4-aminobenzoic acid (PABA), which have close spectral lines. We successfully retrieved the spectral absorption fingerprints in both specular and off-specular reflection geometries. This technique can be utilized for stand-off material characterization using the THz reflection spectroscopy in uncontrolled environments and potentially can be adopted for other broadband spectroscopic modalities.</description><identifier>ISSN: 2169-3536</identifier><identifier>EISSN: 2169-3536</identifier><identifier>DOI: 10.1109/ACCESS.2021.3059424</identifier><identifier>PMID: 35433152</identifier><identifier>CODEN: IAECCG</identifier><language>eng</language><publisher>PISCATAWAY: IEEE</publisher><subject>Absorption spectra ; Basis functions ; Broadband ; Chemical identification ; Coefficient of variation ; Computer Science ; Computer Science, Information Systems ; Engineering ; Engineering, Electrical & Electronic ; Lactose ; Line spectra ; maximal overlap discrete wavelet transform (MODWT) ; off-specular scattered spectra ; phase function effects ; pyramid algorithm ; reflection-mode spectroscopy ; Resonant frequencies ; Resonant frequency ; Robustness ; rough surface scattering ; Rough surfaces ; Scattering ; Science & Technology ; Shrinkage ; Spectroscopy ; Spectrum analysis ; Specular reflection ; Surface chemistry ; Surface roughness ; Surface waves ; Technology ; Telecommunications ; Terahertz frequencies ; terahertz time-domain spectroscopy (THz-TDS) ; Wavelet coefficients ; wavelet shrinkage</subject><ispartof>IEEE access, 2021, Vol.9, p.29746-29754</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. 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Hassan</creatorcontrib><title>Chemical Identification in the Specular and Off-Specular Rough-Surface Scattered Terahertz Spectra Using Wavelet Shrinkage</title><title>IEEE access</title><addtitle>Access</addtitle><addtitle>IEEE ACCESS</addtitle><addtitle>IEEE Access</addtitle><description>We present the development and implementation of a novel wavelet shrinkage technique for the retrieval of obscured characteristic resonant signatures in the scattered terahertz (THz) reflectivity of molecular crystals. In this implementation, the wavelet basis functions associated with the absorption features were identified using the second-order total variation of the wavelet coefficients. Additionally, wavelet coefficients at certain scales were modified using the phase function corrections and wavelet hard thresholding. Reconstruction of the original spectra using these modified wavelet coefficients yielded the exact resonant frequencies of the chemicals, which were otherwise unrecognizable in the spectral artifacts of the rough surface scattering. We examined the robustness of this method over controlled levels of rough surface scattering, validated using the Kirchhoff approximation, in spectroscopic targets made from <inline-formula> <tex-math notation="LaTeX">\alpha </tex-math></inline-formula>-lactose monohydrate and 4-aminobenzoic acid (PABA), which have close spectral lines. We successfully retrieved the spectral absorption fingerprints in both specular and off-specular reflection geometries. This technique can be utilized for stand-off material characterization using the THz reflection spectroscopy in uncontrolled environments and potentially can be adopted for other broadband spectroscopic modalities.</description><subject>Absorption spectra</subject><subject>Basis functions</subject><subject>Broadband</subject><subject>Chemical identification</subject><subject>Coefficient of variation</subject><subject>Computer Science</subject><subject>Computer Science, Information Systems</subject><subject>Engineering</subject><subject>Engineering, Electrical & Electronic</subject><subject>Lactose</subject><subject>Line spectra</subject><subject>maximal overlap discrete wavelet transform (MODWT)</subject><subject>off-specular scattered spectra</subject><subject>phase function effects</subject><subject>pyramid algorithm</subject><subject>reflection-mode spectroscopy</subject><subject>Resonant frequencies</subject><subject>Resonant frequency</subject><subject>Robustness</subject><subject>rough surface scattering</subject><subject>Rough surfaces</subject><subject>Scattering</subject><subject>Science & Technology</subject><subject>Shrinkage</subject><subject>Spectroscopy</subject><subject>Spectrum analysis</subject><subject>Specular reflection</subject><subject>Surface chemistry</subject><subject>Surface roughness</subject><subject>Surface waves</subject><subject>Technology</subject><subject>Telecommunications</subject><subject>Terahertz frequencies</subject><subject>terahertz time-domain spectroscopy (THz-TDS)</subject><subject>Wavelet coefficients</subject><subject>wavelet shrinkage</subject><issn>2169-3536</issn><issn>2169-3536</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2021</creationdate><recordtype>article</recordtype><sourceid>ESBDL</sourceid><sourceid>RIE</sourceid><sourceid>HGBXW</sourceid><sourceid>DOA</sourceid><recordid>eNqNkl9r2zAUxc3YWEvXT1AYhr0MijP9taWXQTHdFigUlpY9Clm-jpU5VibLHeunnxxnWbun6UXi6neOdKWTJBcYLTBG8sNVWV6vVguCCF5QxCUj7EVySnAuM8pp_vLJ-iQ5H4YNikPEEi9eJyeUM0oxJ6fJY9nC1hrdpcsa-mCbuA7W9ant09BCutqBGTvtU93X6W3TZMfCVzeu22w1-kabyEVZAA91egdet-DD414bvE7vB9uv02_6AToI6ar1tv-u1_AmedXoboDzw3yW3H-6viu_ZDe3n5fl1U1mOJYhy1GBcYV4IXBTgBZM1gXniDEZexCAGgJ5LlmuBZcSYeAVodDUWmioq0owepYsZ9_a6Y3aebvV_pdy2qp9wfm10j5Y04HChTaiELQGoExQENrEwwTVuWaiYSZ6fZy9dmO1hdrEJ_O6e2b6fKe3rVq7ByURkgWfLvP-YODdjxGGoLZ2MNB1ugc3DorknKD4N3RC3_2Dbtzo-_hUijBJucxnQzpTxrth8NAcL4ORmqKi5qioKSrqEJWoevu0j6PmTzAicDkDP6FyzWAs9AaOWMxSTggSBE-xwpEW_0-XNuwjVrqxD1F6MUstwF9JbI_lFNHfOt7jwg</recordid><startdate>2021</startdate><enddate>2021</enddate><creator>Khani, Mahmoud E.</creator><creator>Arbab, M. Hassan</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>ESBDL</scope><scope>RIA</scope><scope>RIE</scope><scope>BLEPL</scope><scope>DTL</scope><scope>HGBXW</scope><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SC</scope><scope>7SP</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>JQ2</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope><scope>7X8</scope><scope>5PM</scope><scope>DOA</scope><orcidid>https://orcid.org/0000-0002-3058-6247</orcidid><orcidid>https://orcid.org/0000-0002-6565-3358</orcidid></search><sort><creationdate>2021</creationdate><title>Chemical Identification in the Specular and Off-Specular Rough-Surface Scattered Terahertz Spectra Using Wavelet Shrinkage</title><author>Khani, Mahmoud E. ; Arbab, M. Hassan</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c519t-60711b05781f7ea849d75504494338e0f2e66946a859901e5b23efda8aedbb843</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2021</creationdate><topic>Absorption spectra</topic><topic>Basis functions</topic><topic>Broadband</topic><topic>Chemical identification</topic><topic>Coefficient of variation</topic><topic>Computer Science</topic><topic>Computer Science, Information Systems</topic><topic>Engineering</topic><topic>Engineering, Electrical & Electronic</topic><topic>Lactose</topic><topic>Line spectra</topic><topic>maximal overlap discrete wavelet transform (MODWT)</topic><topic>off-specular scattered spectra</topic><topic>phase function effects</topic><topic>pyramid algorithm</topic><topic>reflection-mode spectroscopy</topic><topic>Resonant frequencies</topic><topic>Resonant frequency</topic><topic>Robustness</topic><topic>rough surface scattering</topic><topic>Rough surfaces</topic><topic>Scattering</topic><topic>Science & Technology</topic><topic>Shrinkage</topic><topic>Spectroscopy</topic><topic>Spectrum analysis</topic><topic>Specular reflection</topic><topic>Surface chemistry</topic><topic>Surface roughness</topic><topic>Surface waves</topic><topic>Technology</topic><topic>Telecommunications</topic><topic>Terahertz frequencies</topic><topic>terahertz time-domain spectroscopy (THz-TDS)</topic><topic>Wavelet coefficients</topic><topic>wavelet shrinkage</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Khani, Mahmoud E.</creatorcontrib><creatorcontrib>Arbab, M. Hassan</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE Open Access Journals</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>Web of Science Core Collection</collection><collection>Science Citation Index Expanded</collection><collection>Web of Science - Science Citation Index Expanded - 2021</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>Computer and Information Systems Abstracts</collection><collection>Electronics & Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><collection>MEDLINE - Academic</collection><collection>PubMed Central (Full Participant titles)</collection><collection>DOAJ Directory of Open Access Journals</collection><jtitle>IEEE access</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Khani, Mahmoud E.</au><au>Arbab, M. Hassan</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Chemical Identification in the Specular and Off-Specular Rough-Surface Scattered Terahertz Spectra Using Wavelet Shrinkage</atitle><jtitle>IEEE access</jtitle><stitle>Access</stitle><stitle>IEEE ACCESS</stitle><addtitle>IEEE Access</addtitle><date>2021</date><risdate>2021</risdate><volume>9</volume><spage>29746</spage><epage>29754</epage><pages>29746-29754</pages><issn>2169-3536</issn><eissn>2169-3536</eissn><coden>IAECCG</coden><abstract>We present the development and implementation of a novel wavelet shrinkage technique for the retrieval of obscured characteristic resonant signatures in the scattered terahertz (THz) reflectivity of molecular crystals. In this implementation, the wavelet basis functions associated with the absorption features were identified using the second-order total variation of the wavelet coefficients. Additionally, wavelet coefficients at certain scales were modified using the phase function corrections and wavelet hard thresholding. Reconstruction of the original spectra using these modified wavelet coefficients yielded the exact resonant frequencies of the chemicals, which were otherwise unrecognizable in the spectral artifacts of the rough surface scattering. We examined the robustness of this method over controlled levels of rough surface scattering, validated using the Kirchhoff approximation, in spectroscopic targets made from <inline-formula> <tex-math notation="LaTeX">\alpha </tex-math></inline-formula>-lactose monohydrate and 4-aminobenzoic acid (PABA), which have close spectral lines. We successfully retrieved the spectral absorption fingerprints in both specular and off-specular reflection geometries. This technique can be utilized for stand-off material characterization using the THz reflection spectroscopy in uncontrolled environments and potentially can be adopted for other broadband spectroscopic modalities.</abstract><cop>PISCATAWAY</cop><pub>IEEE</pub><pmid>35433152</pmid><doi>10.1109/ACCESS.2021.3059424</doi><tpages>9</tpages><orcidid>https://orcid.org/0000-0002-3058-6247</orcidid><orcidid>https://orcid.org/0000-0002-6565-3358</orcidid><oa>free_for_read</oa></addata></record> |
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subjects | Absorption spectra Basis functions Broadband Chemical identification Coefficient of variation Computer Science Computer Science, Information Systems Engineering Engineering, Electrical & Electronic Lactose Line spectra maximal overlap discrete wavelet transform (MODWT) off-specular scattered spectra phase function effects pyramid algorithm reflection-mode spectroscopy Resonant frequencies Resonant frequency Robustness rough surface scattering Rough surfaces Scattering Science & Technology Shrinkage Spectroscopy Spectrum analysis Specular reflection Surface chemistry Surface roughness Surface waves Technology Telecommunications Terahertz frequencies terahertz time-domain spectroscopy (THz-TDS) Wavelet coefficients wavelet shrinkage |
title | Chemical Identification in the Specular and Off-Specular Rough-Surface Scattered Terahertz Spectra Using Wavelet Shrinkage |
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