Phase transformations in Pt/Fe bilayers during post annealing probed by resistometry

X-ray diffraction (XRD), secondary neutral mass spectrometry (SNMS) depth profiling, and electrical resistivity measurements were used to follow the phase transformations in Pt/Fe bi-layered thin films during annealing. Initially, the electrical resistivity increases linearly with temperature up to...

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Veröffentlicht in:	Journal of physics. Condensed matter 2019-07, Vol.31 (28), p.285401-285401
Hauptverfasser:	Shamis, O V, Safonova, N Y, Voron, M M, Burmak, A P, Sidorenko, S I, Katona, G L, Gulyas, S, Beke, D L, Albrecht, M, Vladymyrskyi, I A
Format:	Artikel
Sprache:	eng
Schlagworte:	chemical ordering electrical resistivity FePt magnetic thin films
Online-Zugang:	Volltext
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