Invited Review Article: Multi-tip scanning tunneling microscopy: Experimental techniques and data analysis

In scanning tunneling microscopy, we witness in recent years a paradigm shift from “just imaging” to detailed spectroscopic measurements at the nanoscale and multi-tip scanning tunneling microscope (STM) is a technique following this trend. It is capable of performing nanoscale charge transport meas...

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Veröffentlicht in:	Review of Scientific Instruments 2018-10, Vol.89 (10), p.101101-101101
Hauptverfasser:	Voigtländer, Bert, Cherepanov, Vasily, Korte, Stefan, Leis, Arthur, Cuma, David, Just, Sven, Lüpke, Felix
Format:	Artikel
Sprache:	eng
Schlagworte:	Charge transport Data acquisition Data analysis Electrical measurement Microscopy Nanoelectronics Nanostructure Nanotechnology devices Nanowires Potentiometric analysis Scanning tunneling microscopy Scientific apparatus & instruments Substrates Tips
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