A compact design of a characterization station for far UV photodetectors

A compact design of a characterization station for far UV photodetectors

A newly fabricated characterization station is presented. It is a compact, cost-effective, and easily adjustable apparatus. Each part including 4-pin probe, manipulators, operating temperature, and applied bias can be independently controlled. The station can provide highly reliable, reproducible, a...

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Veröffentlicht in:Review of scientific instruments 2018-01, Vol.89 (1), p.015001-015001
Hauptverfasser: Feng, Peter X., Aldalbahi, Ali
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Sprache:eng
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Nanostructured materials
Operating temperature
Scientific apparatus & instruments
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Aldalbahi, Ali
description A newly fabricated characterization station is presented. It is a compact, cost-effective, and easily adjustable apparatus. Each part including 4-pin probe, manipulators, operating temperature, and applied bias can be independently controlled. The station can provide highly reliable, reproducible, and economical methods to quickly conduct and complete the characterizations of a large amount of sensing materials within a short period of time. It is particularly suitable for studies of various nanostructured materials and their related thermal effect, polarization effect, sensitivity, and electrical and electronic properties.
doi_str_mv 10.1063/1.5002656
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source AIP Journals Complete; Alma/SFX Local Collection
subjects Nanostructured materials
Operating temperature
Scientific apparatus & instruments
title A compact design of a characterization station for far UV photodetectors
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