High resolution quantitative piezoresponse force microscopy of BiFeO3 nanofibers with dramatically enhanced sensitivity
Piezoresponse force microscopy (PFM) has emerged as the tool of choice for characterizing piezoelectricity and ferroelectricity of low-dimensional nanostructures, yet quantitative analysis of such low-dimensional ferroelectrics is extremely challenging. In this communication, we report a dual freque...
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| Veröffentlicht in: | Nanoscale 2012-01, Vol.4 (2), p.48-413 |
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| creator | Xie, Shuhong Gannepalli, Anil Chen, Qian Nataly Liu, Yuanming Zhou, Yichun Proksch, Roger Li, Jiangyu |
| description | Piezoresponse force microscopy (PFM) has emerged as the tool of choice for characterizing piezoelectricity and ferroelectricity of low-dimensional nanostructures, yet quantitative analysis of such low-dimensional ferroelectrics is extremely challenging. In this communication, we report a dual frequency resonance tracking technique to probe nanocrystalline BiFeO
3
nanofibers with substantially enhanced piezoresponse sensitivity, while simultaneously determining its piezoelectric coefficient quantitatively and correlating quality factor mappings with dissipative domain switching processes. This technique can be applied to probe the piezoelectricity and ferroelectricity of a wide range of low-dimensional nanostructures or materials with extremely small piezoelectric effects.
We probe BiFeO
3
nanofiber and its dissipative domain switching quantitatively using high sensitivity dual frequency resonance tracking piezoresponse force microscopy. |
| doi_str_mv | 10.1039/c1nr11099c |
| format | Article |
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3
nanofibers with substantially enhanced piezoresponse sensitivity, while simultaneously determining its piezoelectric coefficient quantitatively and correlating quality factor mappings with dissipative domain switching processes. This technique can be applied to probe the piezoelectricity and ferroelectricity of a wide range of low-dimensional nanostructures or materials with extremely small piezoelectric effects.
We probe BiFeO
3
nanofiber and its dissipative domain switching quantitatively using high sensitivity dual frequency resonance tracking piezoresponse force microscopy.</description><identifier>ISSN: 2040-3364</identifier><identifier>EISSN: 2040-3372</identifier><identifier>DOI: 10.1039/c1nr11099c</identifier><identifier>PMID: 22101512</identifier><language>eng</language><publisher>England</publisher><subject>Bismuth - chemistry ; Elastic Modulus ; Ferric Compounds - chemistry ; Materials Testing - methods ; Micro-Electrical-Mechanical Systems - methods ; Microscopy, Atomic Force - methods ; Nanostructures - chemistry ; Nanostructures - ultrastructure ; Particle Size ; Sensitivity and Specificity ; Tensile Strength</subject><ispartof>Nanoscale, 2012-01, Vol.4 (2), p.48-413</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/22101512$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Xie, Shuhong</creatorcontrib><creatorcontrib>Gannepalli, Anil</creatorcontrib><creatorcontrib>Chen, Qian Nataly</creatorcontrib><creatorcontrib>Liu, Yuanming</creatorcontrib><creatorcontrib>Zhou, Yichun</creatorcontrib><creatorcontrib>Proksch, Roger</creatorcontrib><creatorcontrib>Li, Jiangyu</creatorcontrib><title>High resolution quantitative piezoresponse force microscopy of BiFeO3 nanofibers with dramatically enhanced sensitivity</title><title>Nanoscale</title><addtitle>Nanoscale</addtitle><description>Piezoresponse force microscopy (PFM) has emerged as the tool of choice for characterizing piezoelectricity and ferroelectricity of low-dimensional nanostructures, yet quantitative analysis of such low-dimensional ferroelectrics is extremely challenging. In this communication, we report a dual frequency resonance tracking technique to probe nanocrystalline BiFeO
3
nanofibers with substantially enhanced piezoresponse sensitivity, while simultaneously determining its piezoelectric coefficient quantitatively and correlating quality factor mappings with dissipative domain switching processes. This technique can be applied to probe the piezoelectricity and ferroelectricity of a wide range of low-dimensional nanostructures or materials with extremely small piezoelectric effects.
We probe BiFeO
3
nanofiber and its dissipative domain switching quantitatively using high sensitivity dual frequency resonance tracking piezoresponse force microscopy.</description><subject>Bismuth - chemistry</subject><subject>Elastic Modulus</subject><subject>Ferric Compounds - chemistry</subject><subject>Materials Testing - methods</subject><subject>Micro-Electrical-Mechanical Systems - methods</subject><subject>Microscopy, Atomic Force - methods</subject><subject>Nanostructures - chemistry</subject><subject>Nanostructures - ultrastructure</subject><subject>Particle Size</subject><subject>Sensitivity and Specificity</subject><subject>Tensile Strength</subject><issn>2040-3364</issn><issn>2040-3372</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2012</creationdate><recordtype>article</recordtype><sourceid>EIF</sourceid><recordid>eNp9kMtOwzAQRS0EoqWwYQ8yHxDwI2mcJVSUIlXqBtbVxA9qlNjBTqnC12OpUHasZkb36EhzEbqk5JYSXt1J6gKlpKrkERozkpOM85IdH_ZpPkJnMb4TMq34lJ-iEWOU0IKyMdot7NsGBx19s-2td_hjC663PfT2U-PO6i-fws67qLHxQWrcWhl8lL4bsDf4wc71imMHzhtb6xDxzvYbrAK0SSGhaQas3Qac1ApH7aJNYtsP5-jEQBP1xc-coNf548tskS1XT8-z-2XWUSH6rFYSWJG-JLTUlVQCgMiiYpAXvK4FMJGunFIpwUhOBM8rMAJMXjNRUlXyCbree7tt3Wq17oJtIQzr3wYScLMHQpSH9K_RdadMYq7-Y_g3nXh1_g</recordid><startdate>20120121</startdate><enddate>20120121</enddate><creator>Xie, Shuhong</creator><creator>Gannepalli, Anil</creator><creator>Chen, Qian Nataly</creator><creator>Liu, Yuanming</creator><creator>Zhou, Yichun</creator><creator>Proksch, Roger</creator><creator>Li, Jiangyu</creator><scope>CGR</scope><scope>CUY</scope><scope>CVF</scope><scope>ECM</scope><scope>EIF</scope><scope>NPM</scope></search><sort><creationdate>20120121</creationdate><title>High resolution quantitative piezoresponse force microscopy of BiFeO3 nanofibers with dramatically enhanced sensitivity</title><author>Xie, Shuhong ; Gannepalli, Anil ; Chen, Qian Nataly ; Liu, Yuanming ; Zhou, Yichun ; Proksch, Roger ; Li, Jiangyu</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-p188t-bdca25103017e9cd8aa0c592a453bb8a28c59411ccafc308349af8af4b2871d73</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2012</creationdate><topic>Bismuth - chemistry</topic><topic>Elastic Modulus</topic><topic>Ferric Compounds - chemistry</topic><topic>Materials Testing - methods</topic><topic>Micro-Electrical-Mechanical Systems - methods</topic><topic>Microscopy, Atomic Force - methods</topic><topic>Nanostructures - chemistry</topic><topic>Nanostructures - ultrastructure</topic><topic>Particle Size</topic><topic>Sensitivity and Specificity</topic><topic>Tensile Strength</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Xie, Shuhong</creatorcontrib><creatorcontrib>Gannepalli, Anil</creatorcontrib><creatorcontrib>Chen, Qian Nataly</creatorcontrib><creatorcontrib>Liu, Yuanming</creatorcontrib><creatorcontrib>Zhou, Yichun</creatorcontrib><creatorcontrib>Proksch, Roger</creatorcontrib><creatorcontrib>Li, Jiangyu</creatorcontrib><collection>Medline</collection><collection>MEDLINE</collection><collection>MEDLINE (Ovid)</collection><collection>MEDLINE</collection><collection>MEDLINE</collection><collection>PubMed</collection><jtitle>Nanoscale</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Xie, Shuhong</au><au>Gannepalli, Anil</au><au>Chen, Qian Nataly</au><au>Liu, Yuanming</au><au>Zhou, Yichun</au><au>Proksch, Roger</au><au>Li, Jiangyu</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>High resolution quantitative piezoresponse force microscopy of BiFeO3 nanofibers with dramatically enhanced sensitivity</atitle><jtitle>Nanoscale</jtitle><addtitle>Nanoscale</addtitle><date>2012-01-21</date><risdate>2012</risdate><volume>4</volume><issue>2</issue><spage>48</spage><epage>413</epage><pages>48-413</pages><issn>2040-3364</issn><eissn>2040-3372</eissn><abstract>Piezoresponse force microscopy (PFM) has emerged as the tool of choice for characterizing piezoelectricity and ferroelectricity of low-dimensional nanostructures, yet quantitative analysis of such low-dimensional ferroelectrics is extremely challenging. In this communication, we report a dual frequency resonance tracking technique to probe nanocrystalline BiFeO
3
nanofibers with substantially enhanced piezoresponse sensitivity, while simultaneously determining its piezoelectric coefficient quantitatively and correlating quality factor mappings with dissipative domain switching processes. This technique can be applied to probe the piezoelectricity and ferroelectricity of a wide range of low-dimensional nanostructures or materials with extremely small piezoelectric effects.
We probe BiFeO
3
nanofiber and its dissipative domain switching quantitatively using high sensitivity dual frequency resonance tracking piezoresponse force microscopy.</abstract><cop>England</cop><pmid>22101512</pmid><doi>10.1039/c1nr11099c</doi><tpages>6</tpages></addata></record> |
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| ispartof | Nanoscale, 2012-01, Vol.4 (2), p.48-413 |
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| source | MEDLINE; Royal Society Of Chemistry Journals 2008-; Alma/SFX Local Collection |
| subjects | Bismuth - chemistry Elastic Modulus Ferric Compounds - chemistry Materials Testing - methods Micro-Electrical-Mechanical Systems - methods Microscopy, Atomic Force - methods Nanostructures - chemistry Nanostructures - ultrastructure Particle Size Sensitivity and Specificity Tensile Strength |
| title | High resolution quantitative piezoresponse force microscopy of BiFeO3 nanofibers with dramatically enhanced sensitivity |
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