Scanning thermal imaging by near-field fluorescence spectroscopy

Scanning thermal imaging by near-field fluorescence spectroscopy

A scanning thermal microscope that uses a fluorescent particle as a temperature probe has been developed. The particle, made of a rare-earth ion-doped fluoride glass, is glued at the extremity of a sharp tungsten tip and scanned on the surface of an electronic device. The temperature of the device i...

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Veröffentlicht in:Nanotechnology 2009-03, Vol.20 (11), p.115703-115703
Hauptverfasser: Saïdi, Elika, Samson, Benjamin, Aigouy, Lionel, Volz, Sebastian, Löw, Peter, Bergaud, Christian, Mortier, Michel
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container_end_page 115703
container_issue 11
container_start_page 115703
container_title Nanotechnology
container_volume 20
creator Saïdi, Elika
Samson, Benjamin
Aigouy, Lionel
Volz, Sebastian
Löw, Peter
Bergaud, Christian
Mortier, Michel
description A scanning thermal microscope that uses a fluorescent particle as a temperature probe has been developed. The particle, made of a rare-earth ion-doped fluoride glass, is glued at the extremity of a sharp tungsten tip and scanned on the surface of an electronic device. The temperature of the device is determined by measuring the fluorescence spectrum of the particle at every point on the surface and by comparing the intensity variations of two emission lines. As an example, we will show some images obtained on a nickel stripe 1 microm wide, heated by an electrical current. A good agreement is observed with a simulation of the temperature field on the device.
doi_str_mv 10.1088/0957-4484/20/11/115703
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title Scanning thermal imaging by near-field fluorescence spectroscopy
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