Encapsulated tips for reliable nanoscale conduction in scanning probe technologies
Nanoscale tip apexes of conducting cantilever probes are important enablers for several conducting probe technologies that require reliable long-term operation, while preserving the nanoscale integrity of the tip apex. In this paper, the concept of an encapsulated tip with a nanoscale conducting cor...
Gespeichert in:
| Veröffentlicht in: | Nanotechnology 2009-03, Vol.20 (10), p.105701-105701 |
|---|---|
| Hauptverfasser: | , , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 105701 |
|---|---|
| container_issue | 10 |
| container_start_page | 105701 |
| container_title | Nanotechnology |
| container_volume | 20 |
| creator | Bhaskaran, Harish Sebastian, Abu Drechsler, Ute Despont, Michel |
| description | Nanoscale tip apexes of conducting cantilever probes are important enablers for several conducting probe technologies that require reliable long-term operation, while preserving the nanoscale integrity of the tip apex. In this paper, the concept of an encapsulated tip with a nanoscale conducting core is presented. A method to fabricate such tips on conducting silicon microcantilevers is described. Long-term conduction and wear reliability of these nanoscale tips are evaluated systematically, and their ability to operate for sliding distances greater than 2 m in conduction and 11 m in wear on amorphous carbon is demonstrated. These results are expected to have an impact on the future of conducting probe-based technologies such as probe-based nanometrology, data storage and nanolithography. |
| doi_str_mv | 10.1088/0957-4484/20/10/105701 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_pubme</sourceid><recordid>TN_cdi_pubmed_primary_19417529</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>67201721</sourcerecordid><originalsourceid>FETCH-LOGICAL-c389t-8c1d99cd583464c67523590c800c8c2b8e12b66e27178ed8b9f6d72b2476ecc83</originalsourceid><addsrcrecordid>eNqNkE1LxDAQhoMo7rr6F5acvNXNpG0-jrKsH7AgiJ5DmqZrpJvUpj34703ZRQ96EBIShuedGR6ElkBugAixIrLkWVGIYkXJCqZTcgInaA45g4yVVJyi-Tc0QxcxvhMCICicoxnIAnhJ5Rw9b7zRXRxbPdgaD66LuAk97m3rdNVa7LUP0ej0M8HXoxlc8Nh5nGreO7_DXR8qiwdr3nxow87ZeInOGt1Ge3V8F-j1bvOyfsi2T_eP69ttZnIhh0wYqKU0dSnyghWGpX3yUhIjSLqGVsICrRizlAMXthaVbFjNaUULzqwxIl-g60PftMLHaOOg9i4a27ba2zBGxTglwCkkkB1A04cYe9uornd73X8qIGqyqSZRahKlKDkUJ5spuDxOGKu9rX9iR30JgAPgQvf_ptnvzN-s6uom_wK54Yxv</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>67201721</pqid></control><display><type>article</type><title>Encapsulated tips for reliable nanoscale conduction in scanning probe technologies</title><source>MEDLINE</source><source>IOP Publishing Journals</source><source>Institute of Physics (IOP) Journals - HEAL-Link</source><creator>Bhaskaran, Harish ; Sebastian, Abu ; Drechsler, Ute ; Despont, Michel</creator><creatorcontrib>Bhaskaran, Harish ; Sebastian, Abu ; Drechsler, Ute ; Despont, Michel</creatorcontrib><description>Nanoscale tip apexes of conducting cantilever probes are important enablers for several conducting probe technologies that require reliable long-term operation, while preserving the nanoscale integrity of the tip apex. In this paper, the concept of an encapsulated tip with a nanoscale conducting core is presented. A method to fabricate such tips on conducting silicon microcantilevers is described. Long-term conduction and wear reliability of these nanoscale tips are evaluated systematically, and their ability to operate for sliding distances greater than 2 m in conduction and 11 m in wear on amorphous carbon is demonstrated. These results are expected to have an impact on the future of conducting probe-based technologies such as probe-based nanometrology, data storage and nanolithography.</description><identifier>ISSN: 0957-4484</identifier><identifier>EISSN: 1361-6528</identifier><identifier>DOI: 10.1088/0957-4484/20/10/105701</identifier><identifier>PMID: 19417529</identifier><language>eng</language><publisher>England: IOP Publishing</publisher><subject>Electric Conductivity ; Equipment Design ; Equipment Failure Analysis ; Micro-Electrical-Mechanical Systems - instrumentation ; Microelectrodes ; Microscopy, Scanning Probe - instrumentation ; Microscopy, Scanning Probe - methods ; Nanotechnology - methods ; Transducers</subject><ispartof>Nanotechnology, 2009-03, Vol.20 (10), p.105701-105701</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c389t-8c1d99cd583464c67523590c800c8c2b8e12b66e27178ed8b9f6d72b2476ecc83</citedby><cites>FETCH-LOGICAL-c389t-8c1d99cd583464c67523590c800c8c2b8e12b66e27178ed8b9f6d72b2476ecc83</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://iopscience.iop.org/article/10.1088/0957-4484/20/10/105701/pdf$$EPDF$$P50$$Giop$$H</linktopdf><link.rule.ids>314,780,784,27924,27925,53830,53910</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/19417529$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Bhaskaran, Harish</creatorcontrib><creatorcontrib>Sebastian, Abu</creatorcontrib><creatorcontrib>Drechsler, Ute</creatorcontrib><creatorcontrib>Despont, Michel</creatorcontrib><title>Encapsulated tips for reliable nanoscale conduction in scanning probe technologies</title><title>Nanotechnology</title><addtitle>Nanotechnology</addtitle><description>Nanoscale tip apexes of conducting cantilever probes are important enablers for several conducting probe technologies that require reliable long-term operation, while preserving the nanoscale integrity of the tip apex. In this paper, the concept of an encapsulated tip with a nanoscale conducting core is presented. A method to fabricate such tips on conducting silicon microcantilevers is described. Long-term conduction and wear reliability of these nanoscale tips are evaluated systematically, and their ability to operate for sliding distances greater than 2 m in conduction and 11 m in wear on amorphous carbon is demonstrated. These results are expected to have an impact on the future of conducting probe-based technologies such as probe-based nanometrology, data storage and nanolithography.</description><subject>Electric Conductivity</subject><subject>Equipment Design</subject><subject>Equipment Failure Analysis</subject><subject>Micro-Electrical-Mechanical Systems - instrumentation</subject><subject>Microelectrodes</subject><subject>Microscopy, Scanning Probe - instrumentation</subject><subject>Microscopy, Scanning Probe - methods</subject><subject>Nanotechnology - methods</subject><subject>Transducers</subject><issn>0957-4484</issn><issn>1361-6528</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2009</creationdate><recordtype>article</recordtype><sourceid>EIF</sourceid><recordid>eNqNkE1LxDAQhoMo7rr6F5acvNXNpG0-jrKsH7AgiJ5DmqZrpJvUpj34703ZRQ96EBIShuedGR6ElkBugAixIrLkWVGIYkXJCqZTcgInaA45g4yVVJyi-Tc0QxcxvhMCICicoxnIAnhJ5Rw9b7zRXRxbPdgaD66LuAk97m3rdNVa7LUP0ej0M8HXoxlc8Nh5nGreO7_DXR8qiwdr3nxow87ZeInOGt1Ge3V8F-j1bvOyfsi2T_eP69ttZnIhh0wYqKU0dSnyghWGpX3yUhIjSLqGVsICrRizlAMXthaVbFjNaUULzqwxIl-g60PftMLHaOOg9i4a27ba2zBGxTglwCkkkB1A04cYe9uornd73X8qIGqyqSZRahKlKDkUJ5spuDxOGKu9rX9iR30JgAPgQvf_ptnvzN-s6uom_wK54Yxv</recordid><startdate>20090311</startdate><enddate>20090311</enddate><creator>Bhaskaran, Harish</creator><creator>Sebastian, Abu</creator><creator>Drechsler, Ute</creator><creator>Despont, Michel</creator><general>IOP Publishing</general><scope>CGR</scope><scope>CUY</scope><scope>CVF</scope><scope>ECM</scope><scope>EIF</scope><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope></search><sort><creationdate>20090311</creationdate><title>Encapsulated tips for reliable nanoscale conduction in scanning probe technologies</title><author>Bhaskaran, Harish ; Sebastian, Abu ; Drechsler, Ute ; Despont, Michel</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c389t-8c1d99cd583464c67523590c800c8c2b8e12b66e27178ed8b9f6d72b2476ecc83</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2009</creationdate><topic>Electric Conductivity</topic><topic>Equipment Design</topic><topic>Equipment Failure Analysis</topic><topic>Micro-Electrical-Mechanical Systems - instrumentation</topic><topic>Microelectrodes</topic><topic>Microscopy, Scanning Probe - instrumentation</topic><topic>Microscopy, Scanning Probe - methods</topic><topic>Nanotechnology - methods</topic><topic>Transducers</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Bhaskaran, Harish</creatorcontrib><creatorcontrib>Sebastian, Abu</creatorcontrib><creatorcontrib>Drechsler, Ute</creatorcontrib><creatorcontrib>Despont, Michel</creatorcontrib><collection>Medline</collection><collection>MEDLINE</collection><collection>MEDLINE (Ovid)</collection><collection>MEDLINE</collection><collection>MEDLINE</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><jtitle>Nanotechnology</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Bhaskaran, Harish</au><au>Sebastian, Abu</au><au>Drechsler, Ute</au><au>Despont, Michel</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Encapsulated tips for reliable nanoscale conduction in scanning probe technologies</atitle><jtitle>Nanotechnology</jtitle><addtitle>Nanotechnology</addtitle><date>2009-03-11</date><risdate>2009</risdate><volume>20</volume><issue>10</issue><spage>105701</spage><epage>105701</epage><pages>105701-105701</pages><issn>0957-4484</issn><eissn>1361-6528</eissn><abstract>Nanoscale tip apexes of conducting cantilever probes are important enablers for several conducting probe technologies that require reliable long-term operation, while preserving the nanoscale integrity of the tip apex. In this paper, the concept of an encapsulated tip with a nanoscale conducting core is presented. A method to fabricate such tips on conducting silicon microcantilevers is described. Long-term conduction and wear reliability of these nanoscale tips are evaluated systematically, and their ability to operate for sliding distances greater than 2 m in conduction and 11 m in wear on amorphous carbon is demonstrated. These results are expected to have an impact on the future of conducting probe-based technologies such as probe-based nanometrology, data storage and nanolithography.</abstract><cop>England</cop><pub>IOP Publishing</pub><pmid>19417529</pmid><doi>10.1088/0957-4484/20/10/105701</doi><tpages>1</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0957-4484 |
| ispartof | Nanotechnology, 2009-03, Vol.20 (10), p.105701-105701 |
| issn | 0957-4484 1361-6528 |
| language | eng |
| recordid | cdi_pubmed_primary_19417529 |
| source | MEDLINE; IOP Publishing Journals; Institute of Physics (IOP) Journals - HEAL-Link |
| subjects | Electric Conductivity Equipment Design Equipment Failure Analysis Micro-Electrical-Mechanical Systems - instrumentation Microelectrodes Microscopy, Scanning Probe - instrumentation Microscopy, Scanning Probe - methods Nanotechnology - methods Transducers |
| title | Encapsulated tips for reliable nanoscale conduction in scanning probe technologies |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-05T11%3A19%3A53IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_pubme&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Encapsulated%20tips%20for%20reliable%20nanoscale%20conduction%20in%20scanning%20probe%20technologies&rft.jtitle=Nanotechnology&rft.au=Bhaskaran,%20Harish&rft.date=2009-03-11&rft.volume=20&rft.issue=10&rft.spage=105701&rft.epage=105701&rft.pages=105701-105701&rft.issn=0957-4484&rft.eissn=1361-6528&rft_id=info:doi/10.1088/0957-4484/20/10/105701&rft_dat=%3Cproquest_pubme%3E67201721%3C/proquest_pubme%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=67201721&rft_id=info:pmid/19417529&rfr_iscdi=true |