Tester business abounds
At the recent International Test Conference in Atlantic City NJ, vendors of automatic test equipment revealed multiple contracts and orders for advanced testers.
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| Veröffentlicht in: | Electronic News 1999-10, Vol.45 (41), p.33 |
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| creator | Dorsch, Jeff |
| description | At the recent International Test Conference in Atlantic City NJ, vendors of automatic test equipment revealed multiple contracts and orders for advanced testers. |
| format | Article |
| fullrecord | <record><control><sourceid>proquest</sourceid><recordid>TN_cdi_proquest_reports_209734056</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>45553215</sourcerecordid><originalsourceid>FETCH-proquest_reports_2097340560</originalsourceid><addsrcrecordid>eNpjYeA0NDAz1DUzMzLhYOAqLs4yAAIzCzNOBvGQ1OKS1CKFpNLizLzU4mKFxKT80ryUYh4G1rTEnOJUXijNzaDo5hri7KFbUJRfWArUE1-UWpBfVFIcb2RgaW5sYmBqZkCMGgBPPSgx</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>209734056</pqid></control><display><type>article</type><title>Tester business abounds</title><source>Research Library</source><source>Research Library (Alumni Edition)</source><source>Research Library Prep</source><source>ProQuest Central</source><creator>Dorsch, Jeff</creator><creatorcontrib>Dorsch, Jeff</creatorcontrib><description>At the recent International Test Conference in Atlantic City NJ, vendors of automatic test equipment revealed multiple contracts and orders for advanced testers.</description><identifier>ISSN: 1061-6624</identifier><language>eng</language><publisher>New York: Reed Business Information, a division of Reed Elsevier, Inc</publisher><subject>CMOS ; Conferences ; Contracts ; Factory orders ; Semiconductors ; Silicon ; Test equipment ; Test systems</subject><ispartof>Electronic News, 1999-10, Vol.45 (41), p.33</ispartof><rights>Copyright Electronic News Oct 11, 1999</rights><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>312,776</link.rule.ids></links><search><creatorcontrib>Dorsch, Jeff</creatorcontrib><title>Tester business abounds</title><title>Electronic News</title><description>At the recent International Test Conference in Atlantic City NJ, vendors of automatic test equipment revealed multiple contracts and orders for advanced testers.</description><subject>CMOS</subject><subject>Conferences</subject><subject>Contracts</subject><subject>Factory orders</subject><subject>Semiconductors</subject><subject>Silicon</subject><subject>Test equipment</subject><subject>Test systems</subject><issn>1061-6624</issn><fulltext>false</fulltext><rsrctype>article</rsrctype><creationdate>1999</creationdate><recordtype>article</recordtype><sourceid>8G5</sourceid><sourceid>BENPR</sourceid><sourceid>GUQSH</sourceid><sourceid>M2O</sourceid><recordid>eNpjYeA0NDAz1DUzMzLhYOAqLs4yAAIzCzNOBvGQ1OKS1CKFpNLizLzU4mKFxKT80ryUYh4G1rTEnOJUXijNzaDo5hri7KFbUJRfWArUE1-UWpBfVFIcb2RgaW5sYmBqZkCMGgBPPSgx</recordid><startdate>19991011</startdate><enddate>19991011</enddate><creator>Dorsch, Jeff</creator><general>Reed Business Information, a division of Reed Elsevier, Inc</general><scope>3V.</scope><scope>7RQ</scope><scope>7WY</scope><scope>7XB</scope><scope>883</scope><scope>88K</scope><scope>8AL</scope><scope>8FE</scope><scope>8FG</scope><scope>8FK</scope><scope>8FL</scope><scope>8G5</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BEZIV</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>FRNLG</scope><scope>GNUQQ</scope><scope>GUQSH</scope><scope>HCIFZ</scope><scope>JQ2</scope><scope>K60</scope><scope>K6~</scope><scope>K7-</scope><scope>L.-</scope><scope>L6V</scope><scope>M0F</scope><scope>M0N</scope><scope>M2O</scope><scope>M2T</scope><scope>M7S</scope><scope>MBDVC</scope><scope>P5Z</scope><scope>P62</scope><scope>PQBIZ</scope><scope>PQBZA</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PTHSS</scope><scope>Q9U</scope><scope>U9A</scope></search><sort><creationdate>19991011</creationdate><title>Tester business abounds</title><author>Dorsch, Jeff</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-proquest_reports_2097340560</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1999</creationdate><topic>CMOS</topic><topic>Conferences</topic><topic>Contracts</topic><topic>Factory orders</topic><topic>Semiconductors</topic><topic>Silicon</topic><topic>Test equipment</topic><topic>Test systems</topic><creatorcontrib>Dorsch, Jeff</creatorcontrib><collection>ProQuest Central (Corporate)</collection><collection>Career & Technical Education Database</collection><collection>ABI/INFORM Collection</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>ABI/INFORM Trade & Industry (Alumni Edition)</collection><collection>Telecommunications (Alumni Edition)</collection><collection>Computing Database (Alumni Edition)</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>ABI/INFORM Collection (Alumni Edition)</collection><collection>Research Library (Alumni Edition)</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies & Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Business Premium Collection</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>Business Premium Collection (Alumni)</collection><collection>ProQuest Central Student</collection><collection>Research Library Prep</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Computer Science Collection</collection><collection>ProQuest Business Collection (Alumni Edition)</collection><collection>ProQuest Business Collection</collection><collection>Computer Science Database</collection><collection>ABI/INFORM Professional Advanced</collection><collection>ProQuest Engineering Collection</collection><collection>ABI/INFORM Trade & Industry</collection><collection>Computing Database</collection><collection>Research Library</collection><collection>Telecommunications Database</collection><collection>Engineering Database</collection><collection>Research Library (Corporate)</collection><collection>Advanced Technologies & Aerospace Database</collection><collection>ProQuest Advanced Technologies & Aerospace Collection</collection><collection>ProQuest One Business</collection><collection>ProQuest One Business (Alumni)</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>Engineering Collection</collection><collection>ProQuest Central Basic</collection><jtitle>Electronic News</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>no_fulltext</fulltext></delivery><addata><au>Dorsch, Jeff</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Tester business abounds</atitle><jtitle>Electronic News</jtitle><date>1999-10-11</date><risdate>1999</risdate><volume>45</volume><issue>41</issue><spage>33</spage><pages>33-</pages><issn>1061-6624</issn><abstract>At the recent International Test Conference in Atlantic City NJ, vendors of automatic test equipment revealed multiple contracts and orders for advanced testers.</abstract><cop>New York</cop><pub>Reed Business Information, a division of Reed Elsevier, Inc</pub></addata></record> |
| fulltext | no_fulltext |
| identifier | ISSN: 1061-6624 |
| ispartof | Electronic News, 1999-10, Vol.45 (41), p.33 |
| issn | 1061-6624 |
| language | eng |
| recordid | cdi_proquest_reports_209734056 |
| source | Research Library; Research Library (Alumni Edition); Research Library Prep; ProQuest Central |
| subjects | CMOS Conferences Contracts Factory orders Semiconductors Silicon Test equipment Test systems |
| title | Tester business abounds |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-08T18%3A36%3A14IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Tester%20business%20abounds&rft.jtitle=Electronic%20News&rft.au=Dorsch,%20Jeff&rft.date=1999-10-11&rft.volume=45&rft.issue=41&rft.spage=33&rft.pages=33-&rft.issn=1061-6624&rft_id=info:doi/&rft_dat=%3Cproquest%3E45553215%3C/proquest%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=209734056&rft_id=info:pmid/&rfr_iscdi=true |