Localization of an absorber in a turbid semi-infinite medium by spatially resolved continuous-wave diffuse reflectance measurements
A method to locate an absorber embedded in a semi-infinite turbid medium by spatially-resolved continuous-wave (SRCW) diffuse reflectance measurements is introduced. The depth of the absorber is assessed by single wavelength SRCW diffuse reflectance measurements by two detectors in a radial row. The...
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| Veröffentlicht in: | Journal of Biomedical Optics 2011-08, Vol.16 (8), p.086010-086010 |
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| container_title | Journal of Biomedical Optics |
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| creator | Aksel, Ertugrul B Turkoglu, Ahu N Akin, Ata Ercan, Ayse Ece |
| description | A method to locate an absorber embedded in a semi-infinite turbid medium by spatially-resolved continuous-wave (SRCW) diffuse reflectance measurements is introduced. The depth of the absorber is assessed by single wavelength SRCW diffuse reflectance measurements by two detectors in a radial row. The ratio of perturbations introduced by the defect at two detectors is used to be matched with the ratio-versus-depth curve, which are generated by approximate formulas of continuous wave diffuse reflectance. The error due to approximation and the error in depth assessment are studied for different cases revealing favorable source-detector placements with respect to planar position of the defect. The effect of lateral displacement of the source with respect to defect is studied. A strategy to overcome errors introduced by erroneous prediction of background medium optical properties is suggested. Theoretical results indicate that the depth of the absorber can be obtained with 0.1 mm precision independent of its absorption coefficient and its size for the values chosen in the study. The approach is tested experimentally and it is observed that theoretical results fit with experimental data. |
| doi_str_mv | 10.1117/1.3615238 |
| format | Article |
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The depth of the absorber is assessed by single wavelength SRCW diffuse reflectance measurements by two detectors in a radial row. The ratio of perturbations introduced by the defect at two detectors is used to be matched with the ratio-versus-depth curve, which are generated by approximate formulas of continuous wave diffuse reflectance. The error due to approximation and the error in depth assessment are studied for different cases revealing favorable source-detector placements with respect to planar position of the defect. The effect of lateral displacement of the source with respect to defect is studied. A strategy to overcome errors introduced by erroneous prediction of background medium optical properties is suggested. Theoretical results indicate that the depth of the absorber can be obtained with 0.1 mm precision independent of its absorption coefficient and its size for the values chosen in the study. 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Turkoglu, Ahu N ; Akin, Ata ; Ercan, Ayse Ece</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c394t-791b6336911fee0a9848d897de3ab444c7e8fadd94e6e8f6416f404fefc548113</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2011</creationdate><topic>Absorption</topic><topic>Approximation</topic><topic>Assessments</topic><topic>Computer Simulation</topic><topic>Defects</topic><topic>Detectors</topic><topic>Diffusion</topic><topic>Emulsions - chemistry</topic><topic>Error analysis</topic><topic>Infrared Rays</topic><topic>Light</topic><topic>Models, Chemical</topic><topic>Nephelometry and Turbidimetry - methods</topic><topic>Phospholipids - chemistry</topic><topic>Reflectance</topic><topic>Reflectivity</topic><topic>Scattering, Radiation</topic><topic>Signal Processing, Computer-Assisted</topic><topic>Soybean Oil - chemistry</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Aksel, Ertugrul B</creatorcontrib><creatorcontrib>Turkoglu, Ahu N</creatorcontrib><creatorcontrib>Akin, Ata</creatorcontrib><creatorcontrib>Ercan, Ayse Ece</creatorcontrib><collection>Medline</collection><collection>MEDLINE</collection><collection>MEDLINE (Ovid)</collection><collection>MEDLINE</collection><collection>MEDLINE</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of Biomedical Optics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Aksel, Ertugrul B</au><au>Turkoglu, Ahu N</au><au>Akin, Ata</au><au>Ercan, Ayse Ece</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Localization of an absorber in a turbid semi-infinite medium by spatially resolved continuous-wave diffuse reflectance measurements</atitle><jtitle>Journal of Biomedical Optics</jtitle><addtitle>J Biomed Opt</addtitle><date>2011-08-01</date><risdate>2011</risdate><volume>16</volume><issue>8</issue><spage>086010</spage><epage>086010</epage><pages>086010-086010</pages><issn>1083-3668</issn><issn>1560-2281</issn><eissn>1560-2281</eissn><coden>JBOPFO</coden><abstract>A method to locate an absorber embedded in a semi-infinite turbid medium by spatially-resolved continuous-wave (SRCW) diffuse reflectance measurements is introduced. The depth of the absorber is assessed by single wavelength SRCW diffuse reflectance measurements by two detectors in a radial row. The ratio of perturbations introduced by the defect at two detectors is used to be matched with the ratio-versus-depth curve, which are generated by approximate formulas of continuous wave diffuse reflectance. The error due to approximation and the error in depth assessment are studied for different cases revealing favorable source-detector placements with respect to planar position of the defect. The effect of lateral displacement of the source with respect to defect is studied. A strategy to overcome errors introduced by erroneous prediction of background medium optical properties is suggested. Theoretical results indicate that the depth of the absorber can be obtained with 0.1 mm precision independent of its absorption coefficient and its size for the values chosen in the study. 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| source | MEDLINE; EZB-FREE-00999 freely available EZB journals; PubMed Central |
| subjects | Absorption Approximation Assessments Computer Simulation Defects Detectors Diffusion Emulsions - chemistry Error analysis Infrared Rays Light Models, Chemical Nephelometry and Turbidimetry - methods Phospholipids - chemistry Reflectance Reflectivity Scattering, Radiation Signal Processing, Computer-Assisted Soybean Oil - chemistry |
| title | Localization of an absorber in a turbid semi-infinite medium by spatially resolved continuous-wave diffuse reflectance measurements |
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