The effect of junction temperature on the optoelectrical properties of InGaN/GaN multiple quantum well light-emitting diodes

Thermal effects on the optoelectrical characteristics of green InGaN/GaN multiple quantum well (MQW) light-emitting diodes (LEDs) have been investigated in detail for a broad temperature range, from 30 °C to 100 °C. The current-dependent electroluminescence (EL) spectra, current–voltage ( I– V) curv...

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Veröffentlicht in:Journal of luminescence 2012-02, Vol.132 (2), p.429-433
Hauptverfasser: Wang, Jen-Cheng, Fang, Chia-Hui, Wu, Ya-Fen, Chen, Wei-Jen, Kuo, Da-Chuan, Fan, Ping-Lin, Jiang, Joe-Air, Nee, Tzer-En
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container_end_page 433
container_issue 2
container_start_page 429
container_title Journal of luminescence
container_volume 132
creator Wang, Jen-Cheng
Fang, Chia-Hui
Wu, Ya-Fen
Chen, Wei-Jen
Kuo, Da-Chuan
Fan, Ping-Lin
Jiang, Joe-Air
Nee, Tzer-En
description Thermal effects on the optoelectrical characteristics of green InGaN/GaN multiple quantum well (MQW) light-emitting diodes (LEDs) have been investigated in detail for a broad temperature range, from 30 °C to 100 °C. The current-dependent electroluminescence (EL) spectra, current–voltage ( I– V) curves and luminescence intensity–current ( L– I) characteristics of green InGaN/GaN MQW LEDs have been measured to characterize the thermal-related effects on the optoelectrical properties of the InGaN/GaN MQW LEDs. The experimental results show that both the forward voltages decreased with a slope of −3.7 mV/K and the emission peak wavelength increased with a slope of +0.02 nm/K with increasing temperature, indicating a change in the contact resistance between the metal and GaN layers and the existence of a band gap shrinkage effect. The junction temperature estimated from the forward voltage and the emission peak shift varied from 25.6 to 14.5 °C and from 22.4 to 35.6 °C, respectively. At the same time, the carrier temperature decreased from 371.2 to 348.1 °C as estimated from the slope of high-energy side of the emission spectra. With increasing injection current, there was found to be a strong current-dependent blueshift of −0.15 nm/mA in the emission peak wavelength of the EL spectra. This could be attributed to not only the stronger band-filling effect but also the enhanced quantum confinement effect that resulted from the piezoelectric polarization and spontaneous polarization in InGaN/GaN heterostructures. We also demonstrate a helpful and easy way to measure and calculate the junction temperature of InGaN/GaN MQW LEDs. ► We examine the effect of junction temperature on the optoelectrical properties. ► Not only the band-filling effect but also the quantum confinement effect. ► Piezoelectric polarization and the spontaneous polarization in InGaN/GaN structures. ► Carrier transport was responsible for the influences on the optoelectrical characteristics.
doi_str_mv 10.1016/j.jlumin.2011.09.001
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The current-dependent electroluminescence (EL) spectra, current–voltage ( I– V) curves and luminescence intensity–current ( L– I) characteristics of green InGaN/GaN MQW LEDs have been measured to characterize the thermal-related effects on the optoelectrical properties of the InGaN/GaN MQW LEDs. The experimental results show that both the forward voltages decreased with a slope of −3.7 mV/K and the emission peak wavelength increased with a slope of +0.02 nm/K with increasing temperature, indicating a change in the contact resistance between the metal and GaN layers and the existence of a band gap shrinkage effect. The junction temperature estimated from the forward voltage and the emission peak shift varied from 25.6 to 14.5 °C and from 22.4 to 35.6 °C, respectively. At the same time, the carrier temperature decreased from 371.2 to 348.1 °C as estimated from the slope of high-energy side of the emission spectra. With increasing injection current, there was found to be a strong current-dependent blueshift of −0.15 nm/mA in the emission peak wavelength of the EL spectra. This could be attributed to not only the stronger band-filling effect but also the enhanced quantum confinement effect that resulted from the piezoelectric polarization and spontaneous polarization in InGaN/GaN heterostructures. We also demonstrate a helpful and easy way to measure and calculate the junction temperature of InGaN/GaN MQW LEDs. ► We examine the effect of junction temperature on the optoelectrical properties. ► Not only the band-filling effect but also the quantum confinement effect. ► Piezoelectric polarization and the spontaneous polarization in InGaN/GaN structures. ► Carrier transport was responsible for the influences on the optoelectrical characteristics.</description><identifier>ISSN: 0022-2313</identifier><identifier>EISSN: 1872-7883</identifier><identifier>DOI: 10.1016/j.jlumin.2011.09.001</identifier><identifier>CODEN: JLUMA8</identifier><language>eng</language><publisher>Amsterdam: Elsevier B.V</publisher><subject>Applied sciences ; Electric potential ; Electronics ; Emission ; Exact sciences and technology ; Gallium nitride (GaN) ; Gallium nitrides ; Heterostructure ; Indium gallium nitrides ; Junction temperature ; Light-emitting diode (LED) ; Light-emitting diodes ; Multiple quantum well (MQW) ; Optoelectronic devices ; Polarization ; Quantum confinement ; Semiconductor electronics. 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With increasing injection current, there was found to be a strong current-dependent blueshift of −0.15 nm/mA in the emission peak wavelength of the EL spectra. This could be attributed to not only the stronger band-filling effect but also the enhanced quantum confinement effect that resulted from the piezoelectric polarization and spontaneous polarization in InGaN/GaN heterostructures. We also demonstrate a helpful and easy way to measure and calculate the junction temperature of InGaN/GaN MQW LEDs. ► We examine the effect of junction temperature on the optoelectrical properties. ► Not only the band-filling effect but also the quantum confinement effect. ► Piezoelectric polarization and the spontaneous polarization in InGaN/GaN structures. ► Carrier transport was responsible for the influences on the optoelectrical characteristics.</description><subject>Applied sciences</subject><subject>Electric potential</subject><subject>Electronics</subject><subject>Emission</subject><subject>Exact sciences and technology</subject><subject>Gallium nitride (GaN)</subject><subject>Gallium nitrides</subject><subject>Heterostructure</subject><subject>Indium gallium nitrides</subject><subject>Junction temperature</subject><subject>Light-emitting diode (LED)</subject><subject>Light-emitting diodes</subject><subject>Multiple quantum well (MQW)</subject><subject>Optoelectronic devices</subject><subject>Polarization</subject><subject>Quantum confinement</subject><subject>Semiconductor electronics. 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subjects Applied sciences
Electric potential
Electronics
Emission
Exact sciences and technology
Gallium nitride (GaN)
Gallium nitrides
Heterostructure
Indium gallium nitrides
Junction temperature
Light-emitting diode (LED)
Light-emitting diodes
Multiple quantum well (MQW)
Optoelectronic devices
Polarization
Quantum confinement
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Wavelengths
title The effect of junction temperature on the optoelectrical properties of InGaN/GaN multiple quantum well light-emitting diodes
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