New AFM Nanotribology Method Using a T-Shape Cantilever with an Off-Axis Tip for Friction Coefficient Measurement with Minimized Abbé Error

A new AFM (atomic force microscopy) nanotribology method using a T-shape cantilever with an off-axis tip (Nat Nanotechnol 2:507-514, 2007) has been developed for measuring friction coefficient at nanometer scale. In this method, signals due to both bending and twisting of the T-shape AFM cantilever...

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Veröffentlicht in:	Tribology letters 2011, Vol.41 (1), p.313-318
Hauptverfasser:	Liu, Yu, Leung, Kar Man, Nie, Heng-yong, Lau, Woon Ming, Yang, Jun
Format:	Artikel
Sprache:	eng
Schlagworte:	AFM Atomic force microscopy Bending Chemistry and Materials Science Coefficient of friction Corrosion and Coatings Electric potential Error analysis Friction Friction coefficient Lateral loads Load Materials Science Microscopes Nanostructure Nanotechnology Nanotribology Original Paper Physical Chemistry Surfaces and Interfaces T shape T-shape cantilever Theoretical and Applied Mechanics Thin Films Tribology Twisting Voltage
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