New AFM Nanotribology Method Using a T-Shape Cantilever with an Off-Axis Tip for Friction Coefficient Measurement with Minimized Abbé Error
A new AFM (atomic force microscopy) nanotribology method using a T-shape cantilever with an off-axis tip (Nat Nanotechnol 2:507-514, 2007) has been developed for measuring friction coefficient at nanometer scale. In this method, signals due to both bending and twisting of the T-shape AFM cantilever...
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| Veröffentlicht in: | Tribology letters 2011, Vol.41 (1), p.313-318 |
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| creator | Liu, Yu Leung, Kar Man Nie, Heng-yong Lau, Woon Ming Yang, Jun |
| description | A new AFM (atomic force microscopy) nanotribology method using a T-shape cantilever with an off-axis tip (Nat Nanotechnol 2:507-514, 2007) has been developed for measuring friction coefficient at nanometer scale. In this method, signals due to both bending and twisting of the T-shape AFM cantilever are detected simultaneously. For a T-shape AFM cantilever, the bending is caused by the normal load and the twisting is caused by both the normal and the lateral loads. The twisting generated by the normal load is calibrated in advance. Consequently, the twisting only due to the lateral load can be decoupled from the total lateral voltage signal. And the friction coefficient can be finally determined based on a conversion relationship between the normal and lateral voltage signals of the AFM photodetector. A practical procedure for minimizing Abbé error in friction coefficient measurement has also been introduced. The proposed new method is simple and accurate, and requires the least operation for friction coefficient measurement at nanometer scale. |
| doi_str_mv | 10.1007/s11249-010-9699-9 |
| format | Article |
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In this method, signals due to both bending and twisting of the T-shape AFM cantilever are detected simultaneously. For a T-shape AFM cantilever, the bending is caused by the normal load and the twisting is caused by both the normal and the lateral loads. The twisting generated by the normal load is calibrated in advance. Consequently, the twisting only due to the lateral load can be decoupled from the total lateral voltage signal. And the friction coefficient can be finally determined based on a conversion relationship between the normal and lateral voltage signals of the AFM photodetector. A practical procedure for minimizing Abbé error in friction coefficient measurement has also been introduced. The proposed new method is simple and accurate, and requires the least operation for friction coefficient measurement at nanometer scale.</description><identifier>ISSN: 1023-8883</identifier><identifier>EISSN: 1573-2711</identifier><identifier>DOI: 10.1007/s11249-010-9699-9</identifier><language>eng</language><publisher>Boston: Boston : Springer US</publisher><subject>AFM ; Atomic force microscopy ; Bending ; Chemistry and Materials Science ; Coefficient of friction ; Corrosion and Coatings ; Electric potential ; Error analysis ; Friction ; Friction coefficient ; Lateral loads ; Load ; Materials Science ; Microscopes ; Nanostructure ; Nanotechnology ; Nanotribology ; Original Paper ; Physical Chemistry ; Surfaces and Interfaces ; T shape ; T-shape cantilever ; Theoretical and Applied Mechanics ; Thin Films ; Tribology ; Twisting ; Voltage</subject><ispartof>Tribology letters, 2011, Vol.41 (1), p.313-318</ispartof><rights>Springer Science+Business Media, LLC 2010</rights><rights>Tribology Letters is a copyright of Springer, (2010). All Rights Reserved.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c372t-c67d3ae7459a53093cabdfbb11edc29288713554d570567205969c3471a4e1403</citedby><cites>FETCH-LOGICAL-c372t-c67d3ae7459a53093cabdfbb11edc29288713554d570567205969c3471a4e1403</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s11249-010-9699-9$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s11249-010-9699-9$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>314,778,782,4012,27906,27907,27908,41471,42540,51302</link.rule.ids></links><search><creatorcontrib>Liu, Yu</creatorcontrib><creatorcontrib>Leung, Kar Man</creatorcontrib><creatorcontrib>Nie, Heng-yong</creatorcontrib><creatorcontrib>Lau, Woon Ming</creatorcontrib><creatorcontrib>Yang, Jun</creatorcontrib><title>New AFM Nanotribology Method Using a T-Shape Cantilever with an Off-Axis Tip for Friction Coefficient Measurement with Minimized Abbé Error</title><title>Tribology letters</title><addtitle>Tribol Lett</addtitle><description>A new AFM (atomic force microscopy) nanotribology method using a T-shape cantilever with an off-axis tip (Nat Nanotechnol 2:507-514, 2007) has been developed for measuring friction coefficient at nanometer scale. 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The proposed new method is simple and accurate, and requires the least operation for friction coefficient measurement at nanometer scale.</description><subject>AFM</subject><subject>Atomic force microscopy</subject><subject>Bending</subject><subject>Chemistry and Materials Science</subject><subject>Coefficient of friction</subject><subject>Corrosion and Coatings</subject><subject>Electric potential</subject><subject>Error analysis</subject><subject>Friction</subject><subject>Friction coefficient</subject><subject>Lateral loads</subject><subject>Load</subject><subject>Materials Science</subject><subject>Microscopes</subject><subject>Nanostructure</subject><subject>Nanotechnology</subject><subject>Nanotribology</subject><subject>Original Paper</subject><subject>Physical Chemistry</subject><subject>Surfaces and Interfaces</subject><subject>T shape</subject><subject>T-shape cantilever</subject><subject>Theoretical and Applied Mechanics</subject><subject>Thin Films</subject><subject>Tribology</subject><subject>Twisting</subject><subject>Voltage</subject><issn>1023-8883</issn><issn>1573-2711</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2011</creationdate><recordtype>article</recordtype><sourceid>AFKRA</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><recordid>eNp9kcFuEzEQhlcIJErpA_SEJQ6cXDz2em0fo6gBpKY9NDlbXq83cbWxg71pKc_Ai_AcvFgdtlIlDpxmDt_3azR_VZ0DuQBCxOcMQGuFCRCsGqWwelWdABcMUwHwuuyEMiylZG-rdznfkQISyU-qX9fuAc0WS3RtQhyTb-MQN49o6cZt7NA6-7BBBq3w7dbsHZqbMPrB3buEHvy4RSagm77Hsx8-o5Xfoz4mtEjejj4GNI-u7731Lowlz-RDcrvj_tdc-uB3_qfr0Kxt__xGlynF9L5605shu7PneVqtF5er-Vd8dfPl23x2hS0TdMS2ER0zTtRcGc6IYta0Xd-2AK6zVFEpBTDO644LwhtBCS8vsawWYGoHNWGn1acpd5_i94PLo975bN0wmODiIWvVMMmE4LyQH_8h7-IhhXKcplQCqxshaaFgomyKOSfX633yO5MeNRB9rEdP9ejydX2sR6vi0MnJhQ0bl16S_yd9mKTeRG02yWe9vqUEGAFFaQ2SPQFENZtS</recordid><startdate>2011</startdate><enddate>2011</enddate><creator>Liu, Yu</creator><creator>Leung, Kar Man</creator><creator>Nie, Heng-yong</creator><creator>Lau, Woon Ming</creator><creator>Yang, Jun</creator><general>Boston : Springer US</general><general>Springer US</general><general>Springer Nature B.V</general><scope>FBQ</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>AFKRA</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>HCIFZ</scope><scope>KB.</scope><scope>L6V</scope><scope>M7S</scope><scope>PDBOC</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>PTHSS</scope><scope>7SR</scope><scope>7TB</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>FR3</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>2011</creationdate><title>New AFM Nanotribology Method Using a T-Shape Cantilever with an Off-Axis Tip for Friction Coefficient Measurement with Minimized Abbé Error</title><author>Liu, Yu ; Leung, Kar Man ; Nie, Heng-yong ; Lau, Woon Ming ; Yang, Jun</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c372t-c67d3ae7459a53093cabdfbb11edc29288713554d570567205969c3471a4e1403</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2011</creationdate><topic>AFM</topic><topic>Atomic force microscopy</topic><topic>Bending</topic><topic>Chemistry and Materials Science</topic><topic>Coefficient of friction</topic><topic>Corrosion and Coatings</topic><topic>Electric potential</topic><topic>Error analysis</topic><topic>Friction</topic><topic>Friction coefficient</topic><topic>Lateral loads</topic><topic>Load</topic><topic>Materials Science</topic><topic>Microscopes</topic><topic>Nanostructure</topic><topic>Nanotechnology</topic><topic>Nanotribology</topic><topic>Original Paper</topic><topic>Physical Chemistry</topic><topic>Surfaces and Interfaces</topic><topic>T shape</topic><topic>T-shape cantilever</topic><topic>Theoretical and Applied Mechanics</topic><topic>Thin Films</topic><topic>Tribology</topic><topic>Twisting</topic><topic>Voltage</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Liu, Yu</creatorcontrib><creatorcontrib>Leung, Kar Man</creatorcontrib><creatorcontrib>Nie, Heng-yong</creatorcontrib><creatorcontrib>Lau, Woon Ming</creatorcontrib><creatorcontrib>Yang, Jun</creatorcontrib><collection>AGRIS</collection><collection>CrossRef</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central UK/Ireland</collection><collection>ProQuest Central</collection><collection>Technology Collection (ProQuest)</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central Korea</collection><collection>SciTech Premium Collection</collection><collection>Materials Science Database</collection><collection>ProQuest Engineering Collection</collection><collection>Engineering Database</collection><collection>Materials Science Collection</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Engineering Collection</collection><collection>Engineered Materials Abstracts</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Engineering Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Tribology letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Liu, Yu</au><au>Leung, Kar Man</au><au>Nie, Heng-yong</au><au>Lau, Woon Ming</au><au>Yang, Jun</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>New AFM Nanotribology Method Using a T-Shape Cantilever with an Off-Axis Tip for Friction Coefficient Measurement with Minimized Abbé Error</atitle><jtitle>Tribology letters</jtitle><stitle>Tribol Lett</stitle><date>2011</date><risdate>2011</risdate><volume>41</volume><issue>1</issue><spage>313</spage><epage>318</epage><pages>313-318</pages><issn>1023-8883</issn><eissn>1573-2711</eissn><abstract>A new AFM (atomic force microscopy) nanotribology method using a T-shape cantilever with an off-axis tip (Nat Nanotechnol 2:507-514, 2007) has been developed for measuring friction coefficient at nanometer scale. In this method, signals due to both bending and twisting of the T-shape AFM cantilever are detected simultaneously. For a T-shape AFM cantilever, the bending is caused by the normal load and the twisting is caused by both the normal and the lateral loads. The twisting generated by the normal load is calibrated in advance. Consequently, the twisting only due to the lateral load can be decoupled from the total lateral voltage signal. And the friction coefficient can be finally determined based on a conversion relationship between the normal and lateral voltage signals of the AFM photodetector. A practical procedure for minimizing Abbé error in friction coefficient measurement has also been introduced. The proposed new method is simple and accurate, and requires the least operation for friction coefficient measurement at nanometer scale.</abstract><cop>Boston</cop><pub>Boston : Springer US</pub><doi>10.1007/s11249-010-9699-9</doi><tpages>6</tpages></addata></record> |
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| subjects | AFM Atomic force microscopy Bending Chemistry and Materials Science Coefficient of friction Corrosion and Coatings Electric potential Error analysis Friction Friction coefficient Lateral loads Load Materials Science Microscopes Nanostructure Nanotechnology Nanotribology Original Paper Physical Chemistry Surfaces and Interfaces T shape T-shape cantilever Theoretical and Applied Mechanics Thin Films Tribology Twisting Voltage |
| title | New AFM Nanotribology Method Using a T-Shape Cantilever with an Off-Axis Tip for Friction Coefficient Measurement with Minimized Abbé Error |
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