Optical features of a LiF crystal soft X-ray imaging detector irradiated by free electron laser pulses

Optical features of point defects photoluminescence in LiF crystals, irradiated by soft X-ray pulses of the Free Electron Laser with wavelengths of 17.2 - 61.5 nm, were measured. We found that peak of photoluminescence spectra lies near of 530 nm and are associated with emission of F3+ centers. Our...

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Veröffentlicht in:Optics express 2012-02, Vol.20 (4), p.3424-3433
Hauptverfasser: Pikuz, Tatiana, Faenov, Anatoly, Fukuda, Yuji, Kando, Masaki, Bolton, Paul, Mitrofanov, Alexander, Vinogradov, Alexander, Nagasono, Mitsuru, Ohashi, Haruhiko, Yabashi, Makina, Tono, Kensuke, Senba, Yashinori, Togashi, Tadashi, Ishikawa, Tetsuya
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container_issue 4
container_start_page 3424
container_title Optics express
container_volume 20
creator Pikuz, Tatiana
Faenov, Anatoly
Fukuda, Yuji
Kando, Masaki
Bolton, Paul
Mitrofanov, Alexander
Vinogradov, Alexander
Nagasono, Mitsuru
Ohashi, Haruhiko
Yabashi, Makina
Tono, Kensuke
Senba, Yashinori
Togashi, Tadashi
Ishikawa, Tetsuya
description Optical features of point defects photoluminescence in LiF crystals, irradiated by soft X-ray pulses of the Free Electron Laser with wavelengths of 17.2 - 61.5 nm, were measured. We found that peak of photoluminescence spectra lies near of 530 nm and are associated with emission of F3+ centers. Our results suggest that redistribution of photoluminescence peak intensity from the red to the green part of the spectra is associated with a shortening of the applied laser pulses down to pico - or femtosecond durations. Dependence of peak intensity of photoluminescence spectra from the soft X-ray irradiation fluence was measured and the absence of quenching phenomena, even at relatively high fluencies was found, which is very important for wide applications of LiF crystal X-ray imaging detectors.
doi_str_mv 10.1364/OE.20.003424
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title Optical features of a LiF crystal soft X-ray imaging detector irradiated by free electron laser pulses
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