Limit and application range of the slope-diffraction method for wireless communications
We investigate the limitations on the use of the uniform theory of diffraction (UTD) slope-diffraction method for propagation past knife edges. The settled field that is diffracted past rows of buildings, as computed by numerical integration, has the characteristics of amplitude and phase variation...
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| Veröffentlicht in: | IEEE transactions on antennas and propagation 2003-09, Vol.51 (9), p.2512-2514 |
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| container_title | IEEE transactions on antennas and propagation |
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| creator | Kara, A. Bertoni, H.L. Yazgan, E. |
| description | We investigate the limitations on the use of the uniform theory of diffraction (UTD) slope-diffraction method for propagation past knife edges. The settled field that is diffracted past rows of buildings, as computed by numerical integration, has the characteristics of amplitude and phase variation with a scale length that is large compared to the wavelength and has small amplitude near the edges. Using this field, it is shown that the error in the UTD slope-diffraction method for diffraction past a final screen is connected with the Fresnel width, as compared to the scale length of the settled field. |
| doi_str_mv | 10.1109/TAP.2003.816389 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_proquest_miscellaneous_919946679</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>1229930</ieee_id><sourcerecordid>2586837961</sourcerecordid><originalsourceid>FETCH-LOGICAL-c349t-fd8a4383cc2ce913545eec76a68cb0d708696662d0c2d236531d0662c0db4be23</originalsourceid><addsrcrecordid>eNp9kU1LAzEQhoMoWKtnD16CBz1tm4_dNDmW4hcU9FDRW0iTWZuyu1mTXcR_79YKggdPw8s878DwIHROyYRSoqar-dOEEcInkgou1QEa0aKQGWOMHqIRIVRmionXY3SS0naIuczzEXpZ-tp32DQOm7atvDWdDw2OpnkDHErcbQCnKrSQOV-W0djvdQ3dJjhchog_fIQKUsI21HXf_BxIp-ioNFWCs585Rs-3N6vFfbZ8vHtYzJeZ5bnqstJJk3PJrWUWFOVFXgDYmTBC2jVxMyKFEkIwRyxzjIuCU0eGbIlb52tgfIyu93fbGN57SJ2ufbJQVaaB0CetqFK5EDM1kFf_kkxyQRSRA3j5B9yGPjbDF1oxWhClJB2g6R6yMaQUodRt9LWJn5oSvfOhBx9650PvfQyNi33DA8AvzZhSnPAvlemGZQ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>921509981</pqid></control><display><type>article</type><title>Limit and application range of the slope-diffraction method for wireless communications</title><source>IEEE Electronic Library (IEL)</source><creator>Kara, A. ; Bertoni, H.L. ; Yazgan, E.</creator><creatorcontrib>Kara, A. ; Bertoni, H.L. ; Yazgan, E.</creatorcontrib><description>We investigate the limitations on the use of the uniform theory of diffraction (UTD) slope-diffraction method for propagation past knife edges. The settled field that is diffracted past rows of buildings, as computed by numerical integration, has the characteristics of amplitude and phase variation with a scale length that is large compared to the wavelength and has small amplitude near the edges. Using this field, it is shown that the error in the UTD slope-diffraction method for diffraction past a final screen is connected with the Fresnel width, as compared to the scale length of the settled field.</description><identifier>ISSN: 0018-926X</identifier><identifier>EISSN: 1558-2221</identifier><identifier>DOI: 10.1109/TAP.2003.816389</identifier><identifier>CODEN: IETPAK</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Amplitudes ; Antennas ; Antennas and propagation ; Buildings ; Cutlery ; Diffraction ; Mathematical models ; Moment methods ; Optical propagation ; Optical reflection ; Optical surface waves ; Physical optics ; Spline ; Surface reconstruction ; Surface topography ; Wavelengths ; Wireless communication</subject><ispartof>IEEE transactions on antennas and propagation, 2003-09, Vol.51 (9), p.2512-2514</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2003</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c349t-fd8a4383cc2ce913545eec76a68cb0d708696662d0c2d236531d0662c0db4be23</citedby><cites>FETCH-LOGICAL-c349t-fd8a4383cc2ce913545eec76a68cb0d708696662d0c2d236531d0662c0db4be23</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1229930$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>315,782,786,798,27931,27932,54765</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1229930$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Kara, A.</creatorcontrib><creatorcontrib>Bertoni, H.L.</creatorcontrib><creatorcontrib>Yazgan, E.</creatorcontrib><title>Limit and application range of the slope-diffraction method for wireless communications</title><title>IEEE transactions on antennas and propagation</title><addtitle>TAP</addtitle><description>We investigate the limitations on the use of the uniform theory of diffraction (UTD) slope-diffraction method for propagation past knife edges. The settled field that is diffracted past rows of buildings, as computed by numerical integration, has the characteristics of amplitude and phase variation with a scale length that is large compared to the wavelength and has small amplitude near the edges. Using this field, it is shown that the error in the UTD slope-diffraction method for diffraction past a final screen is connected with the Fresnel width, as compared to the scale length of the settled field.</description><subject>Amplitudes</subject><subject>Antennas</subject><subject>Antennas and propagation</subject><subject>Buildings</subject><subject>Cutlery</subject><subject>Diffraction</subject><subject>Mathematical models</subject><subject>Moment methods</subject><subject>Optical propagation</subject><subject>Optical reflection</subject><subject>Optical surface waves</subject><subject>Physical optics</subject><subject>Spline</subject><subject>Surface reconstruction</subject><subject>Surface topography</subject><subject>Wavelengths</subject><subject>Wireless communication</subject><issn>0018-926X</issn><issn>1558-2221</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2003</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNp9kU1LAzEQhoMoWKtnD16CBz1tm4_dNDmW4hcU9FDRW0iTWZuyu1mTXcR_79YKggdPw8s878DwIHROyYRSoqar-dOEEcInkgou1QEa0aKQGWOMHqIRIVRmionXY3SS0naIuczzEXpZ-tp32DQOm7atvDWdDw2OpnkDHErcbQCnKrSQOV-W0djvdQ3dJjhchog_fIQKUsI21HXf_BxIp-ioNFWCs585Rs-3N6vFfbZ8vHtYzJeZ5bnqstJJk3PJrWUWFOVFXgDYmTBC2jVxMyKFEkIwRyxzjIuCU0eGbIlb52tgfIyu93fbGN57SJ2ufbJQVaaB0CetqFK5EDM1kFf_kkxyQRSRA3j5B9yGPjbDF1oxWhClJB2g6R6yMaQUodRt9LWJn5oSvfOhBx9650PvfQyNi33DA8AvzZhSnPAvlemGZQ</recordid><startdate>20030901</startdate><enddate>20030901</enddate><creator>Kara, A.</creator><creator>Bertoni, H.L.</creator><creator>Yazgan, E.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><scope>F28</scope><scope>FR3</scope></search><sort><creationdate>20030901</creationdate><title>Limit and application range of the slope-diffraction method for wireless communications</title><author>Kara, A. ; Bertoni, H.L. ; Yazgan, E.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c349t-fd8a4383cc2ce913545eec76a68cb0d708696662d0c2d236531d0662c0db4be23</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2003</creationdate><topic>Amplitudes</topic><topic>Antennas</topic><topic>Antennas and propagation</topic><topic>Buildings</topic><topic>Cutlery</topic><topic>Diffraction</topic><topic>Mathematical models</topic><topic>Moment methods</topic><topic>Optical propagation</topic><topic>Optical reflection</topic><topic>Optical surface waves</topic><topic>Physical optics</topic><topic>Spline</topic><topic>Surface reconstruction</topic><topic>Surface topography</topic><topic>Wavelengths</topic><topic>Wireless communication</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kara, A.</creatorcontrib><creatorcontrib>Bertoni, H.L.</creatorcontrib><creatorcontrib>Yazgan, E.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><jtitle>IEEE transactions on antennas and propagation</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Kara, A.</au><au>Bertoni, H.L.</au><au>Yazgan, E.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Limit and application range of the slope-diffraction method for wireless communications</atitle><jtitle>IEEE transactions on antennas and propagation</jtitle><stitle>TAP</stitle><date>2003-09-01</date><risdate>2003</risdate><volume>51</volume><issue>9</issue><spage>2512</spage><epage>2514</epage><pages>2512-2514</pages><issn>0018-926X</issn><eissn>1558-2221</eissn><coden>IETPAK</coden><abstract>We investigate the limitations on the use of the uniform theory of diffraction (UTD) slope-diffraction method for propagation past knife edges. The settled field that is diffracted past rows of buildings, as computed by numerical integration, has the characteristics of amplitude and phase variation with a scale length that is large compared to the wavelength and has small amplitude near the edges. Using this field, it is shown that the error in the UTD slope-diffraction method for diffraction past a final screen is connected with the Fresnel width, as compared to the scale length of the settled field.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TAP.2003.816389</doi><tpages>3</tpages></addata></record> |
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| source | IEEE Electronic Library (IEL) |
| subjects | Amplitudes Antennas Antennas and propagation Buildings Cutlery Diffraction Mathematical models Moment methods Optical propagation Optical reflection Optical surface waves Physical optics Spline Surface reconstruction Surface topography Wavelengths Wireless communication |
| title | Limit and application range of the slope-diffraction method for wireless communications |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-04T00%3A29%3A21IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Limit%20and%20application%20range%20of%20the%20slope-diffraction%20method%20for%20wireless%20communications&rft.jtitle=IEEE%20transactions%20on%20antennas%20and%20propagation&rft.au=Kara,%20A.&rft.date=2003-09-01&rft.volume=51&rft.issue=9&rft.spage=2512&rft.epage=2514&rft.pages=2512-2514&rft.issn=0018-926X&rft.eissn=1558-2221&rft.coden=IETPAK&rft_id=info:doi/10.1109/TAP.2003.816389&rft_dat=%3Cproquest_RIE%3E2586837961%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=921509981&rft_id=info:pmid/&rft_ieee_id=1229930&rfr_iscdi=true |