A study on crack propagation and electrical resistance change of sputtered aluminum thin film on poly ethylene terephthalate substrate under stretching

This work is designed to study crack development and resistance changes in aluminum thin films under stretching. Crack development and relative electrical resistance change (∆R/R 0) of aluminum thin film on 127-μm poly ethylene terephthalate substrates were investigated as a function of engineering...

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Veröffentlicht in:	Thin solid films 2011-09, Vol.519 (22), p.7918-7924
Hauptverfasser:	Hamasha, Mohammad M., Alzoubi, Khalid, Switzer, James C., Lu, Susan, Desu, Seshu B., Poliks, Mark
Format:	Artikel
Sprache:	eng
Schlagworte:	Aluminum Condensed matter: structure, mechanical and thermal properties Crack propagation Cracks Cross-disciplinary physics: materials science rheology Deposition by sputtering Electrical resistance Ethylene Exact sciences and technology Materials science Mechanical and acoustical properties Methods of deposition of films and coatings film growth and epitaxy Physical properties of thin films, nonelectronic Physics Poly ethylene terephthalate Strain Strain rate Stretching Structure and morphology thickness Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) Thick films Thin film structure and morphology Thin films
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