Time-lapse misorientation maps for the analysis of electron backscatter diffraction data from evolving microstructures
A “time-lapse misorientation map” is defined here as a map which shows the orientation change at each point in an evolving crystalline microstructure between two different times. Electron backscatter diffraction data from in situ heating experiments can be used to produce such maps, which then highl...
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| Veröffentlicht in: | Scripta materialia 2011-10, Vol.65 (7), p.600-603 |
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| container_title | Scripta materialia |
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| creator | Wheeler, J. Cross, A. Drury, M. Hough, R.M. Mariani, E. Piazolo, S. Prior, D.J. |
| description | A “time-lapse misorientation map” is defined here as a map which shows the orientation change at each point in an evolving crystalline microstructure between two different times. Electron backscatter diffraction data from in situ heating experiments can be used to produce such maps, which then highlight areas of microstructural change and also yield statistics indicative of how far different types of boundary (with different misorientations) have moved. |
| doi_str_mv | 10.1016/j.scriptamat.2011.06.035 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_919905908</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S1359646211003745</els_id><sourcerecordid>919905908</sourcerecordid><originalsourceid>FETCH-LOGICAL-c400t-cc3fe1e03d889319b1d7766930e8df76e1ea87d29029da2e0dbf94cf14eea2233</originalsourceid><addsrcrecordid>eNqFkEFv2zAMhY1hBZa1-w-69WSXkh3ZOnbB2g4I0Et6FhiJ2pTZViYpBvLvqywDdtyJBPneA_lVFePQcODy4dAkE_0x44S5EcB5A7KBdv2hWvGhF_XQreXH0rdrVctOik_V55QOACC54Ktq2fmJ6hGPidjkU4ie5ozZh5lNZchciCz_JIYzjufkEwuO0Ugmx6LYo_mVDOZMkVnvXETzx2kxI3MxTIyWMC5-_lGyTQwpx5PJp0jprrpxOCb68rfeVm9P33abl3r7-vx987itTQeQa2NaR5ygtcOgWq723Pa9lKoFGqzrZdnh0FuhQCiLgsDuneqM4x0RCtG2t9X9NfcYw-8TpazLk4bGEWcKp6QVVwrWCoaiHK7Ky50pktPH6CeMZ81BX0jrg_5HWl9Ia5C6kC7Wr1crlU8WT7EIC0ZD1sdCStvg_x_yDm9dkMc</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>919905908</pqid></control><display><type>article</type><title>Time-lapse misorientation maps for the analysis of electron backscatter diffraction data from evolving microstructures</title><source>Elsevier ScienceDirect Journals Complete</source><creator>Wheeler, J. ; Cross, A. ; Drury, M. ; Hough, R.M. ; Mariani, E. ; Piazolo, S. ; Prior, D.J.</creator><creatorcontrib>Wheeler, J. ; Cross, A. ; Drury, M. ; Hough, R.M. ; Mariani, E. ; Piazolo, S. ; Prior, D.J.</creatorcontrib><description>A “time-lapse misorientation map” is defined here as a map which shows the orientation change at each point in an evolving crystalline microstructure between two different times. Electron backscatter diffraction data from in situ heating experiments can be used to produce such maps, which then highlight areas of microstructural change and also yield statistics indicative of how far different types of boundary (with different misorientations) have moved.</description><identifier>ISSN: 1359-6462</identifier><identifier>EISSN: 1872-8456</identifier><identifier>DOI: 10.1016/j.scriptamat.2011.06.035</identifier><language>eng</language><publisher>Elsevier Ltd</publisher><subject>Annealing ; Boundaries ; Crystal structure ; Electron back scatter diffraction ; Electron backscatter diffraction ; Grain coarsening ; Heating ; Microstructure ; Misorientation ; Orientation mapping ; Statistics</subject><ispartof>Scripta materialia, 2011-10, Vol.65 (7), p.600-603</ispartof><rights>2011 Acta Materialia Inc.</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c400t-cc3fe1e03d889319b1d7766930e8df76e1ea87d29029da2e0dbf94cf14eea2233</citedby><cites>FETCH-LOGICAL-c400t-cc3fe1e03d889319b1d7766930e8df76e1ea87d29029da2e0dbf94cf14eea2233</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/j.scriptamat.2011.06.035$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,780,784,3550,27924,27925,45995</link.rule.ids></links><search><creatorcontrib>Wheeler, J.</creatorcontrib><creatorcontrib>Cross, A.</creatorcontrib><creatorcontrib>Drury, M.</creatorcontrib><creatorcontrib>Hough, R.M.</creatorcontrib><creatorcontrib>Mariani, E.</creatorcontrib><creatorcontrib>Piazolo, S.</creatorcontrib><creatorcontrib>Prior, D.J.</creatorcontrib><title>Time-lapse misorientation maps for the analysis of electron backscatter diffraction data from evolving microstructures</title><title>Scripta materialia</title><description>A “time-lapse misorientation map” is defined here as a map which shows the orientation change at each point in an evolving crystalline microstructure between two different times. Electron backscatter diffraction data from in situ heating experiments can be used to produce such maps, which then highlight areas of microstructural change and also yield statistics indicative of how far different types of boundary (with different misorientations) have moved.</description><subject>Annealing</subject><subject>Boundaries</subject><subject>Crystal structure</subject><subject>Electron back scatter diffraction</subject><subject>Electron backscatter diffraction</subject><subject>Grain coarsening</subject><subject>Heating</subject><subject>Microstructure</subject><subject>Misorientation</subject><subject>Orientation mapping</subject><subject>Statistics</subject><issn>1359-6462</issn><issn>1872-8456</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2011</creationdate><recordtype>article</recordtype><recordid>eNqFkEFv2zAMhY1hBZa1-w-69WSXkh3ZOnbB2g4I0Et6FhiJ2pTZViYpBvLvqywDdtyJBPneA_lVFePQcODy4dAkE_0x44S5EcB5A7KBdv2hWvGhF_XQreXH0rdrVctOik_V55QOACC54Ktq2fmJ6hGPidjkU4ie5ozZh5lNZchciCz_JIYzjufkEwuO0Ugmx6LYo_mVDOZMkVnvXETzx2kxI3MxTIyWMC5-_lGyTQwpx5PJp0jprrpxOCb68rfeVm9P33abl3r7-vx987itTQeQa2NaR5ygtcOgWq723Pa9lKoFGqzrZdnh0FuhQCiLgsDuneqM4x0RCtG2t9X9NfcYw-8TpazLk4bGEWcKp6QVVwrWCoaiHK7Ky50pktPH6CeMZ81BX0jrg_5HWl9Ia5C6kC7Wr1crlU8WT7EIC0ZD1sdCStvg_x_yDm9dkMc</recordid><startdate>20111001</startdate><enddate>20111001</enddate><creator>Wheeler, J.</creator><creator>Cross, A.</creator><creator>Drury, M.</creator><creator>Hough, R.M.</creator><creator>Mariani, E.</creator><creator>Piazolo, S.</creator><creator>Prior, D.J.</creator><general>Elsevier Ltd</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope></search><sort><creationdate>20111001</creationdate><title>Time-lapse misorientation maps for the analysis of electron backscatter diffraction data from evolving microstructures</title><author>Wheeler, J. ; Cross, A. ; Drury, M. ; Hough, R.M. ; Mariani, E. ; Piazolo, S. ; Prior, D.J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c400t-cc3fe1e03d889319b1d7766930e8df76e1ea87d29029da2e0dbf94cf14eea2233</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2011</creationdate><topic>Annealing</topic><topic>Boundaries</topic><topic>Crystal structure</topic><topic>Electron back scatter diffraction</topic><topic>Electron backscatter diffraction</topic><topic>Grain coarsening</topic><topic>Heating</topic><topic>Microstructure</topic><topic>Misorientation</topic><topic>Orientation mapping</topic><topic>Statistics</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Wheeler, J.</creatorcontrib><creatorcontrib>Cross, A.</creatorcontrib><creatorcontrib>Drury, M.</creatorcontrib><creatorcontrib>Hough, R.M.</creatorcontrib><creatorcontrib>Mariani, E.</creatorcontrib><creatorcontrib>Piazolo, S.</creatorcontrib><creatorcontrib>Prior, D.J.</creatorcontrib><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>Scripta materialia</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Wheeler, J.</au><au>Cross, A.</au><au>Drury, M.</au><au>Hough, R.M.</au><au>Mariani, E.</au><au>Piazolo, S.</au><au>Prior, D.J.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Time-lapse misorientation maps for the analysis of electron backscatter diffraction data from evolving microstructures</atitle><jtitle>Scripta materialia</jtitle><date>2011-10-01</date><risdate>2011</risdate><volume>65</volume><issue>7</issue><spage>600</spage><epage>603</epage><pages>600-603</pages><issn>1359-6462</issn><eissn>1872-8456</eissn><abstract>A “time-lapse misorientation map” is defined here as a map which shows the orientation change at each point in an evolving crystalline microstructure between two different times. Electron backscatter diffraction data from in situ heating experiments can be used to produce such maps, which then highlight areas of microstructural change and also yield statistics indicative of how far different types of boundary (with different misorientations) have moved.</abstract><pub>Elsevier Ltd</pub><doi>10.1016/j.scriptamat.2011.06.035</doi><tpages>4</tpages><oa>free_for_read</oa></addata></record> |
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| language | eng |
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| source | Elsevier ScienceDirect Journals Complete |
| subjects | Annealing Boundaries Crystal structure Electron back scatter diffraction Electron backscatter diffraction Grain coarsening Heating Microstructure Misorientation Orientation mapping Statistics |
| title | Time-lapse misorientation maps for the analysis of electron backscatter diffraction data from evolving microstructures |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-27T08%3A04%3A57IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Time-lapse%20misorientation%20maps%20for%20the%20analysis%20of%20electron%20backscatter%20diffraction%20data%20from%20evolving%20microstructures&rft.jtitle=Scripta%20materialia&rft.au=Wheeler,%20J.&rft.date=2011-10-01&rft.volume=65&rft.issue=7&rft.spage=600&rft.epage=603&rft.pages=600-603&rft.issn=1359-6462&rft.eissn=1872-8456&rft_id=info:doi/10.1016/j.scriptamat.2011.06.035&rft_dat=%3Cproquest_cross%3E919905908%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=919905908&rft_id=info:pmid/&rft_els_id=S1359646211003745&rfr_iscdi=true |