A low-power 10-bit ADC in a 0.25- mu m CMOS: design considerations and test results
This paper presents the design and test of a low power analog-to-digital converter (ADC) implemented in a commercial 0.25 mu m CMOS technology. The circuit has been developed to serve as a building block in multichannel data acquisition systems for high energy physics (HEP) applications. Therefore,...
Gespeichert in:
Veröffentlicht in: | IEEE transactions on nuclear science 2001-08, Vol.48 (4) |
---|---|
Hauptverfasser: | , , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | 4 |
container_start_page | |
container_title | IEEE transactions on nuclear science |
container_volume | 48 |
creator | Rivetti, A Anelli, G Anghinolfi, F Mazza, G Rotondo, F |
description | This paper presents the design and test of a low power analog-to-digital converter (ADC) implemented in a commercial 0.25 mu m CMOS technology. The circuit has been developed to serve as a building block in multichannel data acquisition systems for high energy physics (HEP) applications. Therefore, medium resolution (10 bits), very low power consumption, and high modularity are the key features of the design. In HEP experiments, the resistance of the electronics to the ionizing radiation is often a primary issue. Hence, the ADC has been laid out using a radiation-tolerant approach. The test results show that the chip operates as a full 10-bit converter up to a clock frequency of 30 MHz. No degradation in performance has been measured after a total dose of 10 Mrd (SiO sub(2)) |
doi_str_mv | 10.1109/23.958755 |
format | Article |
fullrecord | <record><control><sourceid>proquest</sourceid><recordid>TN_cdi_proquest_miscellaneous_914658142</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>914658142</sourcerecordid><originalsourceid>FETCH-LOGICAL-p185t-bdb108cde3d24987429afe96852e1e36ac05a0780c46a656d7dfdd1e7ed20c613</originalsourceid><addsrcrecordid>eNotjr1OwzAURj2ARCkMvMHdmBxsx3ZstihAQSrqUJgrx75BRvkjTtTXJxJM3znL0UfIHWcZ58w-iDyzyhRKXZANY9xQK629Itcpfa8qFVMbciyhHc50HM44AWe0jjOUTxXEHhywTCgK3QIdVO-H4yMETPGrBz_0KQac3BxXAtcHmDHNMGFa2jndkMvGtQlv_3dLPl-eP6pXuj_s3qpyT0du1EzrUHNmfMA8CGlNIYV1DVptlECOuXaeKccKw7zUTisditCEwLHAIJjXPN-S-7_uOA0_y3rg1MXksW1dj8OSTpZLrQyXIv8FpwpNqA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>914658142</pqid></control><display><type>article</type><title>A low-power 10-bit ADC in a 0.25- mu m CMOS: design considerations and test results</title><source>IEEE Electronic Library (IEL)</source><creator>Rivetti, A ; Anelli, G ; Anghinolfi, F ; Mazza, G ; Rotondo, F</creator><creatorcontrib>Rivetti, A ; Anelli, G ; Anghinolfi, F ; Mazza, G ; Rotondo, F</creatorcontrib><description>This paper presents the design and test of a low power analog-to-digital converter (ADC) implemented in a commercial 0.25 mu m CMOS technology. The circuit has been developed to serve as a building block in multichannel data acquisition systems for high energy physics (HEP) applications. Therefore, medium resolution (10 bits), very low power consumption, and high modularity are the key features of the design. In HEP experiments, the resistance of the electronics to the ionizing radiation is often a primary issue. Hence, the ADC has been laid out using a radiation-tolerant approach. The test results show that the chip operates as a full 10-bit converter up to a clock frequency of 30 MHz. No degradation in performance has been measured after a total dose of 10 Mrd (SiO sub(2))</description><identifier>ISSN: 0018-9499</identifier><identifier>DOI: 10.1109/23.958755</identifier><language>eng</language><subject>Blocking ; CMOS ; Converters ; Design engineering ; Electronics ; Energy (nuclear) ; Ionizing radiation ; Power consumption</subject><ispartof>IEEE transactions on nuclear science, 2001-08, Vol.48 (4)</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27901,27902</link.rule.ids></links><search><creatorcontrib>Rivetti, A</creatorcontrib><creatorcontrib>Anelli, G</creatorcontrib><creatorcontrib>Anghinolfi, F</creatorcontrib><creatorcontrib>Mazza, G</creatorcontrib><creatorcontrib>Rotondo, F</creatorcontrib><title>A low-power 10-bit ADC in a 0.25- mu m CMOS: design considerations and test results</title><title>IEEE transactions on nuclear science</title><description>This paper presents the design and test of a low power analog-to-digital converter (ADC) implemented in a commercial 0.25 mu m CMOS technology. The circuit has been developed to serve as a building block in multichannel data acquisition systems for high energy physics (HEP) applications. Therefore, medium resolution (10 bits), very low power consumption, and high modularity are the key features of the design. In HEP experiments, the resistance of the electronics to the ionizing radiation is often a primary issue. Hence, the ADC has been laid out using a radiation-tolerant approach. The test results show that the chip operates as a full 10-bit converter up to a clock frequency of 30 MHz. No degradation in performance has been measured after a total dose of 10 Mrd (SiO sub(2))</description><subject>Blocking</subject><subject>CMOS</subject><subject>Converters</subject><subject>Design engineering</subject><subject>Electronics</subject><subject>Energy (nuclear)</subject><subject>Ionizing radiation</subject><subject>Power consumption</subject><issn>0018-9499</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2001</creationdate><recordtype>article</recordtype><recordid>eNotjr1OwzAURj2ARCkMvMHdmBxsx3ZstihAQSrqUJgrx75BRvkjTtTXJxJM3znL0UfIHWcZ58w-iDyzyhRKXZANY9xQK629Itcpfa8qFVMbciyhHc50HM44AWe0jjOUTxXEHhywTCgK3QIdVO-H4yMETPGrBz_0KQac3BxXAtcHmDHNMGFa2jndkMvGtQlv_3dLPl-eP6pXuj_s3qpyT0du1EzrUHNmfMA8CGlNIYV1DVptlECOuXaeKccKw7zUTisditCEwLHAIJjXPN-S-7_uOA0_y3rg1MXksW1dj8OSTpZLrQyXIv8FpwpNqA</recordid><startdate>20010801</startdate><enddate>20010801</enddate><creator>Rivetti, A</creator><creator>Anelli, G</creator><creator>Anghinolfi, F</creator><creator>Mazza, G</creator><creator>Rotondo, F</creator><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>F28</scope><scope>FR3</scope><scope>L7M</scope></search><sort><creationdate>20010801</creationdate><title>A low-power 10-bit ADC in a 0.25- mu m CMOS: design considerations and test results</title><author>Rivetti, A ; Anelli, G ; Anghinolfi, F ; Mazza, G ; Rotondo, F</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-p185t-bdb108cde3d24987429afe96852e1e36ac05a0780c46a656d7dfdd1e7ed20c613</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2001</creationdate><topic>Blocking</topic><topic>CMOS</topic><topic>Converters</topic><topic>Design engineering</topic><topic>Electronics</topic><topic>Energy (nuclear)</topic><topic>Ionizing radiation</topic><topic>Power consumption</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Rivetti, A</creatorcontrib><creatorcontrib>Anelli, G</creatorcontrib><creatorcontrib>Anghinolfi, F</creatorcontrib><creatorcontrib>Mazza, G</creatorcontrib><creatorcontrib>Rotondo, F</creatorcontrib><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on nuclear science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Rivetti, A</au><au>Anelli, G</au><au>Anghinolfi, F</au><au>Mazza, G</au><au>Rotondo, F</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A low-power 10-bit ADC in a 0.25- mu m CMOS: design considerations and test results</atitle><jtitle>IEEE transactions on nuclear science</jtitle><date>2001-08-01</date><risdate>2001</risdate><volume>48</volume><issue>4</issue><issn>0018-9499</issn><abstract>This paper presents the design and test of a low power analog-to-digital converter (ADC) implemented in a commercial 0.25 mu m CMOS technology. The circuit has been developed to serve as a building block in multichannel data acquisition systems for high energy physics (HEP) applications. Therefore, medium resolution (10 bits), very low power consumption, and high modularity are the key features of the design. In HEP experiments, the resistance of the electronics to the ionizing radiation is often a primary issue. Hence, the ADC has been laid out using a radiation-tolerant approach. The test results show that the chip operates as a full 10-bit converter up to a clock frequency of 30 MHz. No degradation in performance has been measured after a total dose of 10 Mrd (SiO sub(2))</abstract><doi>10.1109/23.958755</doi></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0018-9499 |
ispartof | IEEE transactions on nuclear science, 2001-08, Vol.48 (4) |
issn | 0018-9499 |
language | eng |
recordid | cdi_proquest_miscellaneous_914658142 |
source | IEEE Electronic Library (IEL) |
subjects | Blocking CMOS Converters Design engineering Electronics Energy (nuclear) Ionizing radiation Power consumption |
title | A low-power 10-bit ADC in a 0.25- mu m CMOS: design considerations and test results |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-02T23%3A46%3A53IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=A%20low-power%2010-bit%20ADC%20in%20a%200.25-%20mu%20m%20CMOS:%20design%20considerations%20and%20test%20results&rft.jtitle=IEEE%20transactions%20on%20nuclear%20science&rft.au=Rivetti,%20A&rft.date=2001-08-01&rft.volume=48&rft.issue=4&rft.issn=0018-9499&rft_id=info:doi/10.1109/23.958755&rft_dat=%3Cproquest%3E914658142%3C/proquest%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=914658142&rft_id=info:pmid/&rfr_iscdi=true |