Instrumental characterization of clay by XRF, XRD and FTIR

Instrumental characterization of clay by XRF, XRD and FTIR

Instrumental characterizations of the clay were performed by different techniques such as XRF, XRD and FTIR. XRF shows the chemical compositions of the clay where Al-oxide and silica oxide are present in major quantity whereas XRD confirms the presence of these minerals in clay. FTIR studies show th...

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Veröffentlicht in:Bulletin of materials science 2007-06, Vol.30 (3), p.235-238
Hauptverfasser: Nayak, Preeti Sagar, Singh, B. K.
Format: Artikel
Sprache:eng
Schlagworte:
Aluminum
Aluminum oxide
Chemical composition
Clay
Clay minerals
Hematite
Minerals
Oxides
Quartz
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Singh, B. K.
description Instrumental characterizations of the clay were performed by different techniques such as XRF, XRD and FTIR. XRF shows the chemical compositions of the clay where Al-oxide and silica oxide are present in major quantity whereas XRD confirms the presence of these minerals in clay. FTIR studies show the presence of quartz, alumina, haematite and different mineral matters.
doi_str_mv 10.1007/s12034-007-0042-5
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source Indian Academy of Sciences; EZB-FREE-00999 freely available EZB journals; ProQuest Central UK/Ireland; Free Full-Text Journals in Chemistry; SpringerLink Journals - AutoHoldings; ProQuest Central
subjects Aluminum
Aluminum oxide
Chemical composition
Clay
Clay minerals
Hematite
Minerals
Oxides
Quartz
title Instrumental characterization of clay by XRF, XRD and FTIR
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