Temperature insensitive quantum dot lasers: are we really there yet?

Twenty five years ago Arakawa suggested that by confining carriers in three dimensions (in quantum dots) a temperature insensitive threshold current (I th ) could be achieved in semiconductor lasers. In this paper we discuss investigations on state-of-the-art 1.3 μm InAs/GaAs undoped and p-doped qua...

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Veröffentlicht in:Journal of materials science. Materials in electronics 2009, Vol.20 (Suppl 1), p.272-276
Hauptverfasser: Massé, N. F., Marko, I. P., Adams, A. R., Sweeney, S. J.
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Sprache:eng
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Zusammenfassung:Twenty five years ago Arakawa suggested that by confining carriers in three dimensions (in quantum dots) a temperature insensitive threshold current (I th ) could be achieved in semiconductor lasers. In this paper we discuss investigations on state-of-the-art 1.3 μm InAs/GaAs undoped and p-doped quantum dot lasers for telecommunication applications and discuss the extent to which this original hypothesis has been verified. In this study, the threshold current and its radiative component (I rad ) are measured as a function of temperature and pressure. The results show that although the radiative component of the threshold current can be temperature insensitive in undoped quantum dot lasers, a strong contribution from non-radiative Auger recombination makes the threshold current highly temperature sensitive. We find that p-doped devices can have a temperature insensitive I th over a limited range around room temperature resulting from an interplay between an increasing non-radiative Auger current and decreasing radiative current. The decrease in I rad , also observed below 200 K in undoped devices, is attributed to an improvement in the carrier transport with increasing temperature. Gain measurements show that even if p-doping is successful in reducing the effect of gain saturation, the modal net gain of p-doped devices is less than in undoped lasers due to increased non-radiative recombination and non-thermal carrier distribution.
ISSN:0957-4522
1573-482X
DOI:10.1007/s10854-008-9574-8