Testing content-addressable memories using functional fault models and march-like algorithms
Functional tests for content-addressable memories (CAM's) are presented in this paper. In addition to several traditional functional fault models for RAM's, we also consider the fault models based on physical defects, such as shorts between two circuit nodes and transistor stuck-on and stu...
Gespeichert in:
| Veröffentlicht in: | IEEE transactions on computer-aided design of integrated circuits and systems 2000-05, Vol.19 (5), p.577-588 |
|---|---|
| Hauptverfasser: | , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 588 |
|---|---|
| container_issue | 5 |
| container_start_page | 577 |
| container_title | IEEE transactions on computer-aided design of integrated circuits and systems |
| container_volume | 19 |
| creator | Lin, Kun-Jin Wu, Cheng-Wen |
| description | Functional tests for content-addressable memories (CAM's) are presented in this paper. In addition to several traditional functional fault models for RAM's, we also consider the fault models based on physical defects, such as shorts between two circuit nodes and transistor stuck-on and stuck open faults. Accordingly, several functional fault models are proposed. In order to make our approach suited to various application-specific CAM's, we propose tests which require only three fundamental types of operation (i.e., write, erase, and compare), and the test results can be observed entirely from the single-bit Hit output. A complete, compact test is also proposed, which has low complexity and is suitable for modern high-density and large-capacity CAMs-it requires only 2N+3w+2 compare operations and 8N write operations to cover the functional fault models discussed, where N is the number of words and w is the word length. |
| doi_str_mv | 10.1109/43.845082 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_proquest_miscellaneous_914641622</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>845082</ieee_id><sourcerecordid>26613330</sourcerecordid><originalsourceid>FETCH-LOGICAL-c398t-1715e0be9e9cdec798f2c375b4e74e9e5dcb4371ba7a566378e54d544ca9bc553</originalsourceid><addsrcrecordid>eNqF0TtPwzAQAGALgUQpDKxMEQOIIcXP2B5RxUuqxFI2pMhxLm2KkxQ7Gfj3uErFwECnk-6-O-nuELokeEYI1veczRQXWNEjNCGayZQTQY7RBFOpUowlPkVnIWwwJlxQPUEfSwh93a4S27U9tH1qytJDCKZwkDTQdL6GkAxhR6qhtX3dtcYllRlcnzRdCS4kpi2Txni7Tl39CYlxq9jVr5twjk4q4wJc7OMUvT89Lucv6eLt-XX-sEgt06pPiSQCcAEatC3BSq0qapkUBQfJY1aUtuBMksJII7KMSQWCl4Jza3RhhWBTdDvO3frua4gL5U0dLDhnWuiGkGvCM04ySqO8-VdSjSXTGT8MlaREcXkYZhlhjOEIr__ATTf4eMyQKyUwx1SxiO5GZH0Xgocq3_o63vY7JzjfPTjnLB8fHO3VaGsA-HX74g82saBF</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>885040283</pqid></control><display><type>article</type><title>Testing content-addressable memories using functional fault models and march-like algorithms</title><source>IEEE Electronic Library (IEL)</source><creator>Lin, Kun-Jin ; Wu, Cheng-Wen</creator><creatorcontrib>Lin, Kun-Jin ; Wu, Cheng-Wen</creatorcontrib><description>Functional tests for content-addressable memories (CAM's) are presented in this paper. In addition to several traditional functional fault models for RAM's, we also consider the fault models based on physical defects, such as shorts between two circuit nodes and transistor stuck-on and stuck open faults. Accordingly, several functional fault models are proposed. In order to make our approach suited to various application-specific CAM's, we propose tests which require only three fundamental types of operation (i.e., write, erase, and compare), and the test results can be observed entirely from the single-bit Hit output. A complete, compact test is also proposed, which has low complexity and is suitable for modern high-density and large-capacity CAMs-it requires only 2N+3w+2 compare operations and 8N write operations to cover the functional fault models discussed, where N is the number of words and w is the word length.</description><identifier>ISSN: 0278-0070</identifier><identifier>EISSN: 1937-4151</identifier><identifier>DOI: 10.1109/43.845082</identifier><identifier>CODEN: ITCSDI</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Algorithms ; Application software ; CADCAM ; Circuit faults ; Circuit testing ; Circuits ; Computer aided design ; Computer aided manufacturing ; Computer networks ; Design engineering ; Faults ; Integrated circuits ; Logic testing ; Mathematical models ; Random access memory ; Read-write memory ; Signal processing algorithms ; Stuck open faults</subject><ispartof>IEEE transactions on computer-aided design of integrated circuits and systems, 2000-05, Vol.19 (5), p.577-588</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2000</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c398t-1715e0be9e9cdec798f2c375b4e74e9e5dcb4371ba7a566378e54d544ca9bc553</citedby><cites>FETCH-LOGICAL-c398t-1715e0be9e9cdec798f2c375b4e74e9e5dcb4371ba7a566378e54d544ca9bc553</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/845082$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/845082$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Lin, Kun-Jin</creatorcontrib><creatorcontrib>Wu, Cheng-Wen</creatorcontrib><title>Testing content-addressable memories using functional fault models and march-like algorithms</title><title>IEEE transactions on computer-aided design of integrated circuits and systems</title><addtitle>TCAD</addtitle><description>Functional tests for content-addressable memories (CAM's) are presented in this paper. In addition to several traditional functional fault models for RAM's, we also consider the fault models based on physical defects, such as shorts between two circuit nodes and transistor stuck-on and stuck open faults. Accordingly, several functional fault models are proposed. In order to make our approach suited to various application-specific CAM's, we propose tests which require only three fundamental types of operation (i.e., write, erase, and compare), and the test results can be observed entirely from the single-bit Hit output. A complete, compact test is also proposed, which has low complexity and is suitable for modern high-density and large-capacity CAMs-it requires only 2N+3w+2 compare operations and 8N write operations to cover the functional fault models discussed, where N is the number of words and w is the word length.</description><subject>Algorithms</subject><subject>Application software</subject><subject>CADCAM</subject><subject>Circuit faults</subject><subject>Circuit testing</subject><subject>Circuits</subject><subject>Computer aided design</subject><subject>Computer aided manufacturing</subject><subject>Computer networks</subject><subject>Design engineering</subject><subject>Faults</subject><subject>Integrated circuits</subject><subject>Logic testing</subject><subject>Mathematical models</subject><subject>Random access memory</subject><subject>Read-write memory</subject><subject>Signal processing algorithms</subject><subject>Stuck open faults</subject><issn>0278-0070</issn><issn>1937-4151</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2000</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNqF0TtPwzAQAGALgUQpDKxMEQOIIcXP2B5RxUuqxFI2pMhxLm2KkxQ7Gfj3uErFwECnk-6-O-nuELokeEYI1veczRQXWNEjNCGayZQTQY7RBFOpUowlPkVnIWwwJlxQPUEfSwh93a4S27U9tH1qytJDCKZwkDTQdL6GkAxhR6qhtX3dtcYllRlcnzRdCS4kpi2Txni7Tl39CYlxq9jVr5twjk4q4wJc7OMUvT89Lucv6eLt-XX-sEgt06pPiSQCcAEatC3BSq0qapkUBQfJY1aUtuBMksJII7KMSQWCl4Jza3RhhWBTdDvO3frua4gL5U0dLDhnWuiGkGvCM04ySqO8-VdSjSXTGT8MlaREcXkYZhlhjOEIr__ATTf4eMyQKyUwx1SxiO5GZH0Xgocq3_o63vY7JzjfPTjnLB8fHO3VaGsA-HX74g82saBF</recordid><startdate>20000501</startdate><enddate>20000501</enddate><creator>Lin, Kun-Jin</creator><creator>Wu, Cheng-Wen</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SC</scope><scope>7SP</scope><scope>8FD</scope><scope>JQ2</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope><scope>7U5</scope><scope>7TB</scope><scope>FR3</scope><scope>F28</scope></search><sort><creationdate>20000501</creationdate><title>Testing content-addressable memories using functional fault models and march-like algorithms</title><author>Lin, Kun-Jin ; Wu, Cheng-Wen</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c398t-1715e0be9e9cdec798f2c375b4e74e9e5dcb4371ba7a566378e54d544ca9bc553</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2000</creationdate><topic>Algorithms</topic><topic>Application software</topic><topic>CADCAM</topic><topic>Circuit faults</topic><topic>Circuit testing</topic><topic>Circuits</topic><topic>Computer aided design</topic><topic>Computer aided manufacturing</topic><topic>Computer networks</topic><topic>Design engineering</topic><topic>Faults</topic><topic>Integrated circuits</topic><topic>Logic testing</topic><topic>Mathematical models</topic><topic>Random access memory</topic><topic>Read-write memory</topic><topic>Signal processing algorithms</topic><topic>Stuck open faults</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Lin, Kun-Jin</creatorcontrib><creatorcontrib>Wu, Cheng-Wen</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Computer and Information Systems Abstracts</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>Engineering Research Database</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><jtitle>IEEE transactions on computer-aided design of integrated circuits and systems</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Lin, Kun-Jin</au><au>Wu, Cheng-Wen</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Testing content-addressable memories using functional fault models and march-like algorithms</atitle><jtitle>IEEE transactions on computer-aided design of integrated circuits and systems</jtitle><stitle>TCAD</stitle><date>2000-05-01</date><risdate>2000</risdate><volume>19</volume><issue>5</issue><spage>577</spage><epage>588</epage><pages>577-588</pages><issn>0278-0070</issn><eissn>1937-4151</eissn><coden>ITCSDI</coden><abstract>Functional tests for content-addressable memories (CAM's) are presented in this paper. In addition to several traditional functional fault models for RAM's, we also consider the fault models based on physical defects, such as shorts between two circuit nodes and transistor stuck-on and stuck open faults. Accordingly, several functional fault models are proposed. In order to make our approach suited to various application-specific CAM's, we propose tests which require only three fundamental types of operation (i.e., write, erase, and compare), and the test results can be observed entirely from the single-bit Hit output. A complete, compact test is also proposed, which has low complexity and is suitable for modern high-density and large-capacity CAMs-it requires only 2N+3w+2 compare operations and 8N write operations to cover the functional fault models discussed, where N is the number of words and w is the word length.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/43.845082</doi><tpages>12</tpages></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISSN: 0278-0070 |
| ispartof | IEEE transactions on computer-aided design of integrated circuits and systems, 2000-05, Vol.19 (5), p.577-588 |
| issn | 0278-0070 1937-4151 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_914641622 |
| source | IEEE Electronic Library (IEL) |
| subjects | Algorithms Application software CADCAM Circuit faults Circuit testing Circuits Computer aided design Computer aided manufacturing Computer networks Design engineering Faults Integrated circuits Logic testing Mathematical models Random access memory Read-write memory Signal processing algorithms Stuck open faults |
| title | Testing content-addressable memories using functional fault models and march-like algorithms |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-08T04%3A37%3A41IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Testing%20content-addressable%20memories%20using%20functional%20fault%20models%20and%20march-like%20algorithms&rft.jtitle=IEEE%20transactions%20on%20computer-aided%20design%20of%20integrated%20circuits%20and%20systems&rft.au=Lin,%20Kun-Jin&rft.date=2000-05-01&rft.volume=19&rft.issue=5&rft.spage=577&rft.epage=588&rft.pages=577-588&rft.issn=0278-0070&rft.eissn=1937-4151&rft.coden=ITCSDI&rft_id=info:doi/10.1109/43.845082&rft_dat=%3Cproquest_RIE%3E26613330%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=885040283&rft_id=info:pmid/&rft_ieee_id=845082&rfr_iscdi=true |