Molecular weight effect on surface morphology of bonded lubricant layer for hard disk-replica-AFM observation
Atomic Force Microscope (AFM) imaging with plasma-polymerized-carbon (PPC) replication allows us to observe the lubricating layer on hard disks and analyze the effect of Molecular Weight (MW) of the lubricating liquid on the surface shape. Larger molecular weight caused; thicker bonded lubricant lay...
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| Veröffentlicht in: | IEEE transactions on magnetics 2000-09, Vol.36 (5), p.2714-2717 |
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| container_title | IEEE transactions on magnetics |
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| creator | Sakane, Y. Nakao, M. |
| description | Atomic Force Microscope (AFM) imaging with plasma-polymerized-carbon (PPC) replication allows us to observe the lubricating layer on hard disks and analyze the effect of Molecular Weight (MW) of the lubricating liquid on the surface shape. Larger molecular weight caused; thicker bonded lubricant layer; smoother coating on carbon surface; increase in aggregated lubricant clusters; and higher clusters. When the carbon overcoat holds a larger amount of bonded lubricant, the lubricant coverage of the carbon surface widens for the surface to withstand repeated contact-start-stop operations. We conclude that saturating the carbon surface with bonded lubricant prevents direct contact between the head and the disk. |
| doi_str_mv | 10.1109/20.908568 |
| format | Article |
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Larger molecular weight caused; thicker bonded lubricant layer; smoother coating on carbon surface; increase in aggregated lubricant clusters; and higher clusters. When the carbon overcoat holds a larger amount of bonded lubricant, the lubricant coverage of the carbon surface widens for the surface to withstand repeated contact-start-stop operations. We conclude that saturating the carbon surface with bonded lubricant prevents direct contact between the head and the disk.</description><identifier>ISSN: 0018-9464</identifier><identifier>EISSN: 1941-0069</identifier><identifier>DOI: 10.1109/20.908568</identifier><identifier>CODEN: IEMGAQ</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; Atomic force microscopy ; Atomic layer deposition ; Bonding ; Carbon ; Clusters ; Coatings ; Disks ; Electronics ; Exact sciences and technology ; Hard disks ; Image analysis ; Liquids ; Lubricants ; Lubrication ; Magnetic devices ; Magnetism ; Molecular weight ; Other magnetic recording and storage devices (including tapes, disks, and drums) ; Plasmas ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; Shape ; Surface morphology</subject><ispartof>IEEE transactions on magnetics, 2000-09, Vol.36 (5), p.2714-2717</ispartof><rights>2001 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. 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Larger molecular weight caused; thicker bonded lubricant layer; smoother coating on carbon surface; increase in aggregated lubricant clusters; and higher clusters. When the carbon overcoat holds a larger amount of bonded lubricant, the lubricant coverage of the carbon surface widens for the surface to withstand repeated contact-start-stop operations. We conclude that saturating the carbon surface with bonded lubricant prevents direct contact between the head and the disk.</description><subject>Applied sciences</subject><subject>Atomic force microscopy</subject><subject>Atomic layer deposition</subject><subject>Bonding</subject><subject>Carbon</subject><subject>Clusters</subject><subject>Coatings</subject><subject>Disks</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Hard disks</subject><subject>Image analysis</subject><subject>Liquids</subject><subject>Lubricants</subject><subject>Lubrication</subject><subject>Magnetic devices</subject><subject>Magnetism</subject><subject>Molecular weight</subject><subject>Other magnetic recording and storage devices (including tapes, disks, and drums)</subject><subject>Plasmas</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>Shape</subject><subject>Surface morphology</subject><issn>0018-9464</issn><issn>1941-0069</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2000</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNqF0c9rFTEQB_AgCj5rD149BYWWHrad_HzJsZT-EFq86HlJspO-rXmbZ7Lb8v57t2xR8KCnYZjPfGEYQj4wOGUM7BmHUwtGafOKrJiVrAHQ9jVZATDTWKnlW_Ku1oe5lYrBimzvcsIwJVfoE_b3m5FijBhGmgdapxJdQLrNZbfJKd_vaY7U56HDjqbJlz64YaTJ7bHQmAvduNLRrq8_moK7NE-b86s7mn3F8ujGPg_vyZvoUsXDl3pAvl9dfru4aW6_Xn-5OL9tgrQwNoF5DhFj8BZV1wGLOjoplZMYATWLMgoFPPKopRe6Mx69sE5qy4Q3UogDcrzk7kr-OWEd221fA6bkBsxTbS2TWmim5SyP_im5EWatOfs_XCsjtVIz_PQXfMhTGeZzW2MUByH0ekYnCwol11owtrvSb13Ztwza50e2HNrlkbP9_BLoanApFjeEvv5esHItgc_q46J6RPwzXCJ-AZZIpSA</recordid><startdate>20000901</startdate><enddate>20000901</enddate><creator>Sakane, Y.</creator><creator>Nakao, M.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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Microelectronics. Optoelectronics. Solid state devices</topic><topic>Shape</topic><topic>Surface morphology</topic><toplevel>online_resources</toplevel><creatorcontrib>Sakane, Y.</creatorcontrib><creatorcontrib>Nakao, M.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><jtitle>IEEE transactions on magnetics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Sakane, Y.</au><au>Nakao, M.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Molecular weight effect on surface morphology of bonded lubricant layer for hard disk-replica-AFM observation</atitle><jtitle>IEEE transactions on magnetics</jtitle><stitle>TMAG</stitle><date>2000-09-01</date><risdate>2000</risdate><volume>36</volume><issue>5</issue><spage>2714</spage><epage>2717</epage><pages>2714-2717</pages><issn>0018-9464</issn><eissn>1941-0069</eissn><coden>IEMGAQ</coden><abstract>Atomic Force Microscope (AFM) imaging with plasma-polymerized-carbon (PPC) replication allows us to observe the lubricating layer on hard disks and analyze the effect of Molecular Weight (MW) of the lubricating liquid on the surface shape. Larger molecular weight caused; thicker bonded lubricant layer; smoother coating on carbon surface; increase in aggregated lubricant clusters; and higher clusters. When the carbon overcoat holds a larger amount of bonded lubricant, the lubricant coverage of the carbon surface widens for the surface to withstand repeated contact-start-stop operations. We conclude that saturating the carbon surface with bonded lubricant prevents direct contact between the head and the disk.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/20.908568</doi><tpages>4</tpages></addata></record> |
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| issn | 0018-9464 1941-0069 |
| language | eng |
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| source | IEEE Electronic Library (IEL) |
| subjects | Applied sciences Atomic force microscopy Atomic layer deposition Bonding Carbon Clusters Coatings Disks Electronics Exact sciences and technology Hard disks Image analysis Liquids Lubricants Lubrication Magnetic devices Magnetism Molecular weight Other magnetic recording and storage devices (including tapes, disks, and drums) Plasmas Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Shape Surface morphology |
| title | Molecular weight effect on surface morphology of bonded lubricant layer for hard disk-replica-AFM observation |
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