Entraining power-dropout events in an external-cavity semiconductor laser using weak modulation of the injection current
We measure experimentally the effects of injection current modulation on the statistical distribution of time intervals between power-dropout events occuring in an external-cavity semiconductor laser operating in the low-frequency fluctuation regime. These statistical distributions are sensitive ind...
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| Veröffentlicht in: | IEEE journal of quantum electronics 2000-02, Vol.36 (2), p.175-183 |
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| creator | Sukow, D.W. Gauthier, D.J. |
| description | We measure experimentally the effects of injection current modulation on the statistical distribution of time intervals between power-dropout events occuring in an external-cavity semiconductor laser operating in the low-frequency fluctuation regime. These statistical distributions are sensitive indicators of the presence of pump current modulation. Under most circumstances, we find that weak low-frequency (in the vicinity of 19 MHz) modulation of the current causes the dropouts to occur preferentially at intervals that are integral multiples of the modulation period. The dropout events can be entrained by the periodic perturbations when the modulation amplitude is large (peak-to-peak amplitude /spl ges/8% of the dc injection current). We conjecture that modulation induces a dropout when the modulation frequency is equal to the difference in frequency between a mode of the extended cavity laser and its adjacent antimode. We also find that the statistical distribution of the dropout events is unaffected by the periodic perturbations when the modulation frequency is equal to the free spectral range of the external cavity. Numerical simulations of the extended-cavity laser display qualitatively similar behavior. The relationship of these phenomena to stochastic resonance is discussed and a possible use of the modulated laser dynamics for chaos communication is described. |
| doi_str_mv | 10.1109/3.823463 |
| format | Article |
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These statistical distributions are sensitive indicators of the presence of pump current modulation. Under most circumstances, we find that weak low-frequency (in the vicinity of 19 MHz) modulation of the current causes the dropouts to occur preferentially at intervals that are integral multiples of the modulation period. The dropout events can be entrained by the periodic perturbations when the modulation amplitude is large (peak-to-peak amplitude /spl ges/8% of the dc injection current). We conjecture that modulation induces a dropout when the modulation frequency is equal to the difference in frequency between a mode of the extended cavity laser and its adjacent antimode. We also find that the statistical distribution of the dropout events is unaffected by the periodic perturbations when the modulation frequency is equal to the free spectral range of the external cavity. Numerical simulations of the extended-cavity laser display qualitatively similar behavior. The relationship of these phenomena to stochastic resonance is discussed and a possible use of the modulated laser dynamics for chaos communication is described.</description><identifier>ISSN: 0018-9197</identifier><identifier>EISSN: 1558-1713</identifier><identifier>DOI: 10.1109/3.823463</identifier><identifier>CODEN: IEJQA7</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Amplitude modulation ; Amplitudes ; Current measurement ; Dropouts ; Dynamical laser instabilities; noisy laser behavior ; Dynamics of nonlinear optical systems; optical instabilities, optical chaos and complexity, and optical spatio-temporal dynamics ; Exact sciences and technology ; Fluctuations ; Frequency modulation ; Fundamental areas of phenomenology (including applications) ; Holes ; Injection current ; Intervals ; Laser modes ; Laser optical systems: design and operation ; Lasers ; Modulation ; Nonlinear optics ; Optics ; Physics ; Power lasers ; Probability distribution ; Pump lasers ; Semiconductor lasers ; Semiconductor lasers; laser diodes ; Statistical distributions ; Time measurement</subject><ispartof>IEEE journal of quantum electronics, 2000-02, Vol.36 (2), p.175-183</ispartof><rights>2000 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2000</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c463t-269914e1cbe6779ed4e503262169db0eee58b779bd8203ac1fd7107e3c4a399c3</citedby><cites>FETCH-LOGICAL-c463t-269914e1cbe6779ed4e503262169db0eee58b779bd8203ac1fd7107e3c4a399c3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/823463$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/823463$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=1364128$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Sukow, D.W.</creatorcontrib><creatorcontrib>Gauthier, D.J.</creatorcontrib><title>Entraining power-dropout events in an external-cavity semiconductor laser using weak modulation of the injection current</title><title>IEEE journal of quantum electronics</title><addtitle>JQE</addtitle><description>We measure experimentally the effects of injection current modulation on the statistical distribution of time intervals between power-dropout events occuring in an external-cavity semiconductor laser operating in the low-frequency fluctuation regime. These statistical distributions are sensitive indicators of the presence of pump current modulation. Under most circumstances, we find that weak low-frequency (in the vicinity of 19 MHz) modulation of the current causes the dropouts to occur preferentially at intervals that are integral multiples of the modulation period. The dropout events can be entrained by the periodic perturbations when the modulation amplitude is large (peak-to-peak amplitude /spl ges/8% of the dc injection current). We conjecture that modulation induces a dropout when the modulation frequency is equal to the difference in frequency between a mode of the extended cavity laser and its adjacent antimode. We also find that the statistical distribution of the dropout events is unaffected by the periodic perturbations when the modulation frequency is equal to the free spectral range of the external cavity. Numerical simulations of the extended-cavity laser display qualitatively similar behavior. The relationship of these phenomena to stochastic resonance is discussed and a possible use of the modulated laser dynamics for chaos communication is described.</description><subject>Amplitude modulation</subject><subject>Amplitudes</subject><subject>Current measurement</subject><subject>Dropouts</subject><subject>Dynamical laser instabilities; noisy laser behavior</subject><subject>Dynamics of nonlinear optical systems; optical instabilities, optical chaos and complexity, and optical spatio-temporal dynamics</subject><subject>Exact sciences and technology</subject><subject>Fluctuations</subject><subject>Frequency modulation</subject><subject>Fundamental areas of phenomenology (including applications)</subject><subject>Holes</subject><subject>Injection current</subject><subject>Intervals</subject><subject>Laser modes</subject><subject>Laser optical systems: design and operation</subject><subject>Lasers</subject><subject>Modulation</subject><subject>Nonlinear optics</subject><subject>Optics</subject><subject>Physics</subject><subject>Power lasers</subject><subject>Probability distribution</subject><subject>Pump lasers</subject><subject>Semiconductor lasers</subject><subject>Semiconductor lasers; laser diodes</subject><subject>Statistical distributions</subject><subject>Time measurement</subject><issn>0018-9197</issn><issn>1558-1713</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2000</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNp9kUtLLDEQRoMoOD7A9V2Fi6ib1qTz6GQp4gsEN7puMulqzdyeZEzSPv69GWe4ggtXRdV3OFBVCB1Qckop0WfsVNWMS7aBJlQIVdGGsk00IYSqSlPdbKOdlGal5VyRCXq_9Dka551_wovwBrHqYliEMWN4BZ8Tdh4bj-E9Q_RmqKx5dfkDJ5g7G3w32hwiHkyCiMe0lLyB-YfnoRsHk13wOPQ4P0PRzMB-DewYYzHvoa3eDAn213UXPV5dPlzcVHf317cX53eVLUvkqpZaUw7UTkE2jYaOgyCsljWVupsSABBqWoJpp2rCjKV911DSALPcMK0t20XHK-8ihpcRUm7nLlkYBuMhjKktdsmEYE0hj34la8WFaJQs4N8f4CyMy-ukVilBuBRKFOhkBdkYUorQt4vo5iZ-tJS0y0-1rF19qqCHa59J1gx9NN669M0zyWmtCvZnhbmy9f907fgE-66cFw</recordid><startdate>20000201</startdate><enddate>20000201</enddate><creator>Sukow, D.W.</creator><creator>Gauthier, D.J.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>RIA</scope><scope>RIE</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope><scope>F28</scope><scope>FR3</scope><scope>H8D</scope></search><sort><creationdate>20000201</creationdate><title>Entraining power-dropout events in an external-cavity semiconductor laser using weak modulation of the injection current</title><author>Sukow, D.W. ; Gauthier, D.J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c463t-269914e1cbe6779ed4e503262169db0eee58b779bd8203ac1fd7107e3c4a399c3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2000</creationdate><topic>Amplitude modulation</topic><topic>Amplitudes</topic><topic>Current measurement</topic><topic>Dropouts</topic><topic>Dynamical laser instabilities; noisy laser behavior</topic><topic>Dynamics of nonlinear optical systems; optical instabilities, optical chaos and complexity, and optical spatio-temporal dynamics</topic><topic>Exact sciences and technology</topic><topic>Fluctuations</topic><topic>Frequency modulation</topic><topic>Fundamental areas of phenomenology (including applications)</topic><topic>Holes</topic><topic>Injection current</topic><topic>Intervals</topic><topic>Laser modes</topic><topic>Laser optical systems: design and operation</topic><topic>Lasers</topic><topic>Modulation</topic><topic>Nonlinear optics</topic><topic>Optics</topic><topic>Physics</topic><topic>Power lasers</topic><topic>Probability distribution</topic><topic>Pump lasers</topic><topic>Semiconductor lasers</topic><topic>Semiconductor lasers; laser diodes</topic><topic>Statistical distributions</topic><topic>Time measurement</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Sukow, D.W.</creatorcontrib><creatorcontrib>Gauthier, D.J.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Aerospace Database</collection><jtitle>IEEE journal of quantum electronics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Sukow, D.W.</au><au>Gauthier, D.J.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Entraining power-dropout events in an external-cavity semiconductor laser using weak modulation of the injection current</atitle><jtitle>IEEE journal of quantum electronics</jtitle><stitle>JQE</stitle><date>2000-02-01</date><risdate>2000</risdate><volume>36</volume><issue>2</issue><spage>175</spage><epage>183</epage><pages>175-183</pages><issn>0018-9197</issn><eissn>1558-1713</eissn><coden>IEJQA7</coden><abstract>We measure experimentally the effects of injection current modulation on the statistical distribution of time intervals between power-dropout events occuring in an external-cavity semiconductor laser operating in the low-frequency fluctuation regime. These statistical distributions are sensitive indicators of the presence of pump current modulation. Under most circumstances, we find that weak low-frequency (in the vicinity of 19 MHz) modulation of the current causes the dropouts to occur preferentially at intervals that are integral multiples of the modulation period. The dropout events can be entrained by the periodic perturbations when the modulation amplitude is large (peak-to-peak amplitude /spl ges/8% of the dc injection current). We conjecture that modulation induces a dropout when the modulation frequency is equal to the difference in frequency between a mode of the extended cavity laser and its adjacent antimode. We also find that the statistical distribution of the dropout events is unaffected by the periodic perturbations when the modulation frequency is equal to the free spectral range of the external cavity. Numerical simulations of the extended-cavity laser display qualitatively similar behavior. The relationship of these phenomena to stochastic resonance is discussed and a possible use of the modulated laser dynamics for chaos communication is described.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/3.823463</doi><tpages>9</tpages><oa>free_for_read</oa></addata></record> |
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| subjects | Amplitude modulation Amplitudes Current measurement Dropouts Dynamical laser instabilities noisy laser behavior Dynamics of nonlinear optical systems optical instabilities, optical chaos and complexity, and optical spatio-temporal dynamics Exact sciences and technology Fluctuations Frequency modulation Fundamental areas of phenomenology (including applications) Holes Injection current Intervals Laser modes Laser optical systems: design and operation Lasers Modulation Nonlinear optics Optics Physics Power lasers Probability distribution Pump lasers Semiconductor lasers Semiconductor lasers laser diodes Statistical distributions Time measurement |
| title | Entraining power-dropout events in an external-cavity semiconductor laser using weak modulation of the injection current |
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