A Time-Slicing Ring Oscillator for Capturing Time-Dependent Delay Degradation and Power Supply Voltage Fluctuation

A time-slicing ring oscillator (TSRO) which captures time-dependent delay degradation due to periodic transient voltage drop on a power supply network is proposed. An impact of the supply voltage fluctuations, including voltage drop and overshoot, on logic circuit delay is evaluated as a change of o...

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Veröffentlicht in:	IEICE Transactions on Electronics 2010/03/01, Vol.E93.C(3), pp.324-331
Hauptverfasser:	UEZONO, Takumi, MASU, Kazuya, SATO, Takashi
Format:	Artikel
Sprache:	eng
Schlagworte:	Degradation Delay Electric potential Fluctuation Oscillators power/signal integrity process variation spatial voltage drop fluctuation Voltage Voltage drop voltage measurement
Online-Zugang:	Volltext
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