Analysis and interpretation of the Seidel aberration coefficients in digital holography
The most commonly used configurations in digital holography-namely Fourier holograms, Fresnel holograms, and image-plane holograms-are analyzed with respect to Seidel's wave aberration theory. This analysis is performed by taking into account the phase terms involved in the recording and recons...
Gespeichert in:
Veröffentlicht in: | Applied Optics 2011-12, Vol.50 (34), p.H220-H229 |
---|---|
Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | H229 |
---|---|
container_issue | 34 |
container_start_page | H220 |
container_title | Applied Optics |
container_volume | 50 |
creator | Claus, Daniel Watson, John Rodenburg, John |
description | The most commonly used configurations in digital holography-namely Fourier holograms, Fresnel holograms, and image-plane holograms-are analyzed with respect to Seidel's wave aberration theory. This analysis is performed by taking into account the phase terms involved in the recording and reconstruction processes. The combined phase term from both processes is compared with the Gaussian-reference sphere, from which the wave aberration terms can be obtained. In conjunction with the analysis, for each of the aberration terms, conditions can be set to eliminate them. Wave aberrations are plotted to show how strongly different setups are affected. |
doi_str_mv | 10.1364/AO.50.00H220 |
format | Article |
fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_912641139</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>912641139</sourcerecordid><originalsourceid>FETCH-LOGICAL-c427t-6bb9df07205dcc162e3645bfc267df089a1741d9dda01d26f7e48e0e0da6d4913</originalsourceid><addsrcrecordid>eNp90DtPwzAUBWALgWgpbMzIGwyk-BE79VhVQJEqdQDEGDn2dWuUJsFOh_57jFIYmazr-_lIPghdUzKlXOYP8_VUkCkhS8bICRozKkTGqRSnaEwI4ZlUXIzQRYyfaRK5Ks7RiDGqOKFsjD7mja4P0UesG4t900PoAvS6922DW4f7LeBX8BZqrCsIYViYFpzzxkPTx_QIW7_xva7xtq3bTdDd9nCJzpyuI1wdzwl6f3p8Wyyz1fr5ZTFfZSZnRZ_JqlLWkYIRYY2hkkH6kqicYbJI9zOlaZFTq6zVhFomXQH5DAgQq6XNFeUTdDvkdqH92kPsy52PBupaN9DuY6kokzmlXCV596-khLGkucoTvR-oCW2MAVzZBb_T4ZBQ-VN6OV-XgpRD6YnfHJP31Q7sH_5tmX8DjwV83Q</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1022912394</pqid></control><display><type>article</type><title>Analysis and interpretation of the Seidel aberration coefficients in digital holography</title><source>Alma/SFX Local Collection</source><source>Optica Publishing Group Journals</source><creator>Claus, Daniel ; Watson, John ; Rodenburg, John</creator><creatorcontrib>Claus, Daniel ; Watson, John ; Rodenburg, John</creatorcontrib><description>The most commonly used configurations in digital holography-namely Fourier holograms, Fresnel holograms, and image-plane holograms-are analyzed with respect to Seidel's wave aberration theory. This analysis is performed by taking into account the phase terms involved in the recording and reconstruction processes. The combined phase term from both processes is compared with the Gaussian-reference sphere, from which the wave aberration terms can be obtained. In conjunction with the analysis, for each of the aberration terms, conditions can be set to eliminate them. Wave aberrations are plotted to show how strongly different setups are affected.</description><identifier>ISSN: 0003-6935</identifier><identifier>ISSN: 1559-128X</identifier><identifier>EISSN: 2155-3165</identifier><identifier>EISSN: 1539-4522</identifier><identifier>DOI: 10.1364/AO.50.00H220</identifier><identifier>PMID: 22193012</identifier><language>eng</language><publisher>United States</publisher><subject>Aberration ; Digital ; Fourier analysis ; Holograms ; Holography ; Reconstruction ; Recording</subject><ispartof>Applied Optics, 2011-12, Vol.50 (34), p.H220-H229</ispartof><rights>2011 Optical Society of America</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c427t-6bb9df07205dcc162e3645bfc267df089a1741d9dda01d26f7e48e0e0da6d4913</citedby><cites>FETCH-LOGICAL-c427t-6bb9df07205dcc162e3645bfc267df089a1741d9dda01d26f7e48e0e0da6d4913</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27901,27902</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/22193012$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Claus, Daniel</creatorcontrib><creatorcontrib>Watson, John</creatorcontrib><creatorcontrib>Rodenburg, John</creatorcontrib><title>Analysis and interpretation of the Seidel aberration coefficients in digital holography</title><title>Applied Optics</title><addtitle>Appl Opt</addtitle><description>The most commonly used configurations in digital holography-namely Fourier holograms, Fresnel holograms, and image-plane holograms-are analyzed with respect to Seidel's wave aberration theory. This analysis is performed by taking into account the phase terms involved in the recording and reconstruction processes. The combined phase term from both processes is compared with the Gaussian-reference sphere, from which the wave aberration terms can be obtained. In conjunction with the analysis, for each of the aberration terms, conditions can be set to eliminate them. Wave aberrations are plotted to show how strongly different setups are affected.</description><subject>Aberration</subject><subject>Digital</subject><subject>Fourier analysis</subject><subject>Holograms</subject><subject>Holography</subject><subject>Reconstruction</subject><subject>Recording</subject><issn>0003-6935</issn><issn>1559-128X</issn><issn>2155-3165</issn><issn>1539-4522</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2011</creationdate><recordtype>article</recordtype><recordid>eNp90DtPwzAUBWALgWgpbMzIGwyk-BE79VhVQJEqdQDEGDn2dWuUJsFOh_57jFIYmazr-_lIPghdUzKlXOYP8_VUkCkhS8bICRozKkTGqRSnaEwI4ZlUXIzQRYyfaRK5Ks7RiDGqOKFsjD7mja4P0UesG4t900PoAvS6922DW4f7LeBX8BZqrCsIYViYFpzzxkPTx_QIW7_xva7xtq3bTdDd9nCJzpyuI1wdzwl6f3p8Wyyz1fr5ZTFfZSZnRZ_JqlLWkYIRYY2hkkH6kqicYbJI9zOlaZFTq6zVhFomXQH5DAgQq6XNFeUTdDvkdqH92kPsy52PBupaN9DuY6kokzmlXCV596-khLGkucoTvR-oCW2MAVzZBb_T4ZBQ-VN6OV-XgpRD6YnfHJP31Q7sH_5tmX8DjwV83Q</recordid><startdate>20111201</startdate><enddate>20111201</enddate><creator>Claus, Daniel</creator><creator>Watson, John</creator><creator>Rodenburg, John</creator><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope><scope>7X8</scope></search><sort><creationdate>20111201</creationdate><title>Analysis and interpretation of the Seidel aberration coefficients in digital holography</title><author>Claus, Daniel ; Watson, John ; Rodenburg, John</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c427t-6bb9df07205dcc162e3645bfc267df089a1741d9dda01d26f7e48e0e0da6d4913</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2011</creationdate><topic>Aberration</topic><topic>Digital</topic><topic>Fourier analysis</topic><topic>Holograms</topic><topic>Holography</topic><topic>Reconstruction</topic><topic>Recording</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Claus, Daniel</creatorcontrib><creatorcontrib>Watson, John</creatorcontrib><creatorcontrib>Rodenburg, John</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>MEDLINE - Academic</collection><jtitle>Applied Optics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Claus, Daniel</au><au>Watson, John</au><au>Rodenburg, John</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Analysis and interpretation of the Seidel aberration coefficients in digital holography</atitle><jtitle>Applied Optics</jtitle><addtitle>Appl Opt</addtitle><date>2011-12-01</date><risdate>2011</risdate><volume>50</volume><issue>34</issue><spage>H220</spage><epage>H229</epage><pages>H220-H229</pages><issn>0003-6935</issn><issn>1559-128X</issn><eissn>2155-3165</eissn><eissn>1539-4522</eissn><abstract>The most commonly used configurations in digital holography-namely Fourier holograms, Fresnel holograms, and image-plane holograms-are analyzed with respect to Seidel's wave aberration theory. This analysis is performed by taking into account the phase terms involved in the recording and reconstruction processes. The combined phase term from both processes is compared with the Gaussian-reference sphere, from which the wave aberration terms can be obtained. In conjunction with the analysis, for each of the aberration terms, conditions can be set to eliminate them. Wave aberrations are plotted to show how strongly different setups are affected.</abstract><cop>United States</cop><pmid>22193012</pmid><doi>10.1364/AO.50.00H220</doi><oa>free_for_read</oa></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0003-6935 |
ispartof | Applied Optics, 2011-12, Vol.50 (34), p.H220-H229 |
issn | 0003-6935 1559-128X 2155-3165 1539-4522 |
language | eng |
recordid | cdi_proquest_miscellaneous_912641139 |
source | Alma/SFX Local Collection; Optica Publishing Group Journals |
subjects | Aberration Digital Fourier analysis Holograms Holography Reconstruction Recording |
title | Analysis and interpretation of the Seidel aberration coefficients in digital holography |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-07T01%3A49%3A15IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Analysis%20and%20interpretation%20of%20the%20Seidel%20aberration%20coefficients%20in%20digital%20holography&rft.jtitle=Applied%20Optics&rft.au=Claus,%20Daniel&rft.date=2011-12-01&rft.volume=50&rft.issue=34&rft.spage=H220&rft.epage=H229&rft.pages=H220-H229&rft.issn=0003-6935&rft.eissn=2155-3165&rft_id=info:doi/10.1364/AO.50.00H220&rft_dat=%3Cproquest_cross%3E912641139%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1022912394&rft_id=info:pmid/22193012&rfr_iscdi=true |