Elimination of stress-induced curvature in thin-film structures

Argon ion machining of released thin-film devices is shown to alter the contour shape of free-standing thin-film structures by affecting their through-thickness stress distributions. In experiments conducted on MEMS thin-film mirrors it is demonstrated that post-release out-of-plane deformation of s...

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Veröffentlicht in:Journal of microelectromechanical systems 2002-10, Vol.11 (5), p.592-597
Hauptverfasser: Bifano, T.G., Johnson, H.T., Bierden, P., Mali, R.K.
Format: Artikel
Sprache:eng
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Zusammenfassung:Argon ion machining of released thin-film devices is shown to alter the contour shape of free-standing thin-film structures by affecting their through-thickness stress distributions. In experiments conducted on MEMS thin-film mirrors it is demonstrated that post-release out-of-plane deformation of such structures can be reduced using this ion beam machining method. In doing so optically flat surfaces (curvature
ISSN:1057-7157
1941-0158
DOI:10.1109/JMEMS.2002.802908