Elimination of stress-induced curvature in thin-film structures
Argon ion machining of released thin-film devices is shown to alter the contour shape of free-standing thin-film structures by affecting their through-thickness stress distributions. In experiments conducted on MEMS thin-film mirrors it is demonstrated that post-release out-of-plane deformation of s...
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Veröffentlicht in: | Journal of microelectromechanical systems 2002-10, Vol.11 (5), p.592-597 |
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Hauptverfasser: | , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | Argon ion machining of released thin-film devices is shown to alter the contour shape of free-standing thin-film structures by affecting their through-thickness stress distributions. In experiments conducted on MEMS thin-film mirrors it is demonstrated that post-release out-of-plane deformation of such structures can be reduced using this ion beam machining method. In doing so optically flat surfaces (curvature |
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ISSN: | 1057-7157 1941-0158 |
DOI: | 10.1109/JMEMS.2002.802908 |