Influence of annealing temperature on the structural, topographical and optical properties of sol–gel derived ZnO thin films
This investigation deals with the effect of annealing temperature on the structural, topographical and optical properties of Zinc Oxide thin films prepared by sol–gel method. The structural properties were studied using X-ray diffraction and the recorded patterns indicated that all the films had a p...
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| Veröffentlicht in: | Materials letters 2011-09, Vol.65 (17), p.2572-2574 |
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| container_title | Materials letters |
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| creator | Sengupta, Joydip Sahoo, R.K. Bardhan, K.K. Mukherjee, C.D. |
| description | This investigation deals with the effect of annealing temperature on the structural, topographical and optical properties of Zinc Oxide thin films prepared by sol–gel method. The structural properties were studied using X-ray diffraction and the recorded patterns indicated that all the films had a preferred orientation along (002) plane and the crystallinity along with the grain size were augmented with annealing temperature. The topographical modification of the films due to heat treatment was probed by atomic force microscopy which revealed that annealing roughened the surface of the film. The optical properties were examined by a UV–visible spectrophotometer which exhibited that maximum transmittance reached nearly 90% and it diminished with increasing annealing temperature. |
| doi_str_mv | 10.1016/j.matlet.2011.06.021 |
| format | Article |
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The structural properties were studied using X-ray diffraction and the recorded patterns indicated that all the films had a preferred orientation along (002) plane and the crystallinity along with the grain size were augmented with annealing temperature. The topographical modification of the films due to heat treatment was probed by atomic force microscopy which revealed that annealing roughened the surface of the film. 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The optical properties were examined by a UV–visible spectrophotometer which exhibited that maximum transmittance reached nearly 90% and it diminished with increasing annealing temperature.</description><subject>Annealing</subject><subject>Atomic force microscopy</subject><subject>Crystallinity</subject><subject>Grain size</subject><subject>Optical properties</subject><subject>Sol gel process</subject><subject>Sol–gel preparation</subject><subject>Thin films</subject><subject>Transmittance</subject><subject>X-ray diffraction</subject><subject>Zinc oxide</subject><subject>Zinc oxide thin film</subject><issn>0167-577X</issn><issn>1873-4979</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2011</creationdate><recordtype>article</recordtype><recordid>eNp9kMFu1DAQhi1EJZaWN-DgGxcSxnFsxxckVFGoVKkXKiEulutMtl45TrCdSlwQ78Ab9knwspw5zWjm_3_NfIS8ZtAyYPLdoZ1tCVjaDhhrQbbQsWdkxwbFm14r_Zzsqkw1QqmvL8jLnA8A0Gvod-TndZzChtEhXSZqY0QbfNzTgvOKyZYt1UWk5QFpLmlzdWDDW1qWddknuz54Z0O1jXRZy99-TUs1Fo_5GJiX8PTr9x4DHTH5Rxzpt3hb03ykkw9zviBnkw0ZX_2r5-Tu6uOXy8_Nze2n68sPN43jfCjNBL1wXAKzXPSgBIC0gnd26AeQw9B1I1qu7CCtvO_A6clJIZXS3b2WAoXm5-TNKbee933DXMzss8MQbMRly0aD0qLneqjK_qR0ack54WTW5GebfhgG5kjbHMyJtjnSNiBNpV1t7082rF88ekwmO3_EOvqErphx8f8P-AOfU4ze</recordid><startdate>20110901</startdate><enddate>20110901</enddate><creator>Sengupta, Joydip</creator><creator>Sahoo, R.K.</creator><creator>Bardhan, K.K.</creator><creator>Mukherjee, C.D.</creator><general>Elsevier B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope></search><sort><creationdate>20110901</creationdate><title>Influence of annealing temperature on the structural, topographical and optical properties of sol–gel derived ZnO thin films</title><author>Sengupta, Joydip ; Sahoo, R.K. ; Bardhan, K.K. ; Mukherjee, C.D.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c338t-f045c3601a354075006a532a848068822dea37a86a6b20c9fc6567792b965e593</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2011</creationdate><topic>Annealing</topic><topic>Atomic force microscopy</topic><topic>Crystallinity</topic><topic>Grain size</topic><topic>Optical properties</topic><topic>Sol gel process</topic><topic>Sol–gel preparation</topic><topic>Thin films</topic><topic>Transmittance</topic><topic>X-ray diffraction</topic><topic>Zinc oxide</topic><topic>Zinc oxide thin film</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Sengupta, Joydip</creatorcontrib><creatorcontrib>Sahoo, R.K.</creatorcontrib><creatorcontrib>Bardhan, K.K.</creatorcontrib><creatorcontrib>Mukherjee, C.D.</creatorcontrib><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>Materials letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Sengupta, Joydip</au><au>Sahoo, R.K.</au><au>Bardhan, K.K.</au><au>Mukherjee, C.D.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Influence of annealing temperature on the structural, topographical and optical properties of sol–gel derived ZnO thin films</atitle><jtitle>Materials letters</jtitle><date>2011-09-01</date><risdate>2011</risdate><volume>65</volume><issue>17</issue><spage>2572</spage><epage>2574</epage><pages>2572-2574</pages><issn>0167-577X</issn><eissn>1873-4979</eissn><abstract>This investigation deals with the effect of annealing temperature on the structural, topographical and optical properties of Zinc Oxide thin films prepared by sol–gel method. 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| ispartof | Materials letters, 2011-09, Vol.65 (17), p.2572-2574 |
| issn | 0167-577X 1873-4979 |
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| source | Access via ScienceDirect (Elsevier) |
| subjects | Annealing Atomic force microscopy Crystallinity Grain size Optical properties Sol gel process Sol–gel preparation Thin films Transmittance X-ray diffraction Zinc oxide Zinc oxide thin film |
| title | Influence of annealing temperature on the structural, topographical and optical properties of sol–gel derived ZnO thin films |
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