Scanning Tunneling Microscope Observations of Non-AB Stacking of Graphene on Ni Films

Microscopic features of graphene segregated on Ni films prior to chemical transfer--including atomic structures of monolayers and bilayers, Moire patterns due to non-AB stacking, as well as wrinkles and ripples caused by strain effects-have been characterized in detail by high-resolution scanning tu...

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Veröffentlicht in:	Nano research 2011-07, Vol.4 (7), p.712-721
Hauptverfasser:	Zhao, Ruiqi, Zhang, Yanfeng, Gao, Teng, Gao, Yabo, Liu, Nan, Fu, Lei, Liu, Zhongfan
Format:	Artikel
Sprache:	eng
Schlagworte:	Annealing Atomic/Molecular Structure and Spectra Biomedicine Biotechnology Chemistry Chemistry and Materials Science Condensed Matter Physics Electronics Electrons Graphene Materials Science Microscopy Moire patterns Morphology Nanostructure Nanotechnology Nickel Research Article Ripples Scanning tunneling microscopy Single crystals Stacking 原子结构堆叠扫描隧道显微镜显微分离显微镜观察石墨镍薄膜高分辨率
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