Compositional characterization of nickel silicides by HAADF-STEM imaging

A methodology for the quantitative compositional characterization of nickel silicides by high angle annular dark field scanning transmission electron microscopy (HAADF-STEM) imaging is presented. HAADF-STEM images of a set of nickel silicide reference samples Ni 3 Si, Ni 31 Si 12 , Ni 2 Si, NiSi and...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Veröffentlicht in:	Journal of materials science 2011-04, Vol.46 (7), p.2001-2008
Hauptverfasser:	Verleysen, E., Bender, H., Richard, O., Schryvers, D., Vandervorst, W.
Format:	Artikel
Sprache:	eng
Schlagworte:	Channeling Characterization and Evaluation of Materials Chemical properties Chemistry and Materials Science Classical Mechanics Crystallography and Scattering Methods Detectors Devices Diffraction Gates Image contrast Image detection Image transmission Imaging Intermetallic compounds Materials Science Methodology Nickel Nickel silicide Polymer Sciences Scanning electron microscopy Scanning transmission electron microscopy Silicides Silicon substrates Solid Mechanics Thickness Transmission electron microscopy Two dimensional analysis Variation
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Schreiben Sie den ersten Kommentar!