Analysis of the parameters of deep centers in the Al/i-GaAs detectors of charged particles and X-ray radiation

The parameters of deep centers in the barrier structures based on intrinsic gallium arsenide that are used in the detectors of charged particles and X-ray radiation are studied via the methods of the deep-level transient spectroscopy (DLTS) and the low-frequency-noise spectroscopy. Two deep levels (...

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Veröffentlicht in:	Journal of communications technology & electronics 2007-10, Vol.52 (10), p.1165-1170
Hauptverfasser:	Zhigal’skii, G. P., Kostryukov, S. A., Litvinov, V. G., Rodin, M. S., Kholomina, T. A.
Format:	Artikel
Sprache:	eng
Schlagworte:	Aluminum Charged particles Density Detectors Gallium arsenide Ionization Noise Radiation Spectra Spectroscopy Spectrum analysis X-rays
Online-Zugang:	Volltext
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