Pulsed laser deposition of bismuth telluride thin film and annealing effects

Pulsed laser deposition method was used to prepare Bi2Te3 thermoelectric thin films on a soda lime glass substrate at room temperature. Surface morphology of Bi2Te3 thin films was studied by AFM (atomic force microscopy) images. The influence of thermal annealing in vacuum condition on microstructur...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Veröffentlicht in:	European physical journal. Applied physics 2009-05, Vol.46 (2), p.20501
Hauptverfasser:	Faraji, L. S., Singh, R. P., Allahkarami, M.
Format:	Artikel
Sprache:	eng
Schlagworte:	61.05.-a 61.05.cp 68.37.Ps 85.30.De Applied sciences Cold working, work hardening annealing, quenching, tempering, recovery, and recrystallization textures Condensed matter: structure, mechanical and thermal properties Cross-disciplinary physics: materials science rheology Electron, ion, and scanning probe microscopy Electronics Exact sciences and technology Materials science Miscellaneous Physics Scanning probe microscopy: scanning tunneling, atomic force, scanning optical, magnetic force, etc Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Structure of solids and liquids crystallography Treatment of materials and its effects on microstructure and properties
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Schreiben Sie den ersten Kommentar!