Effects of the swift iron ions in indium phosphide

Indium phosphide samples were irradiated with swift (100 MeV) 56Fe 7+ ions with different fluences varying from 5 × 10 12 to 2 × 10 14 ions cm − 2 at room temperature. Atomic force microscopy (AFM) and X-ray diffraction (XRD) techniques have been used to investigate the irradiation effects. Atomic f...

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Veröffentlicht in:	Surface & coatings technology 2009-06, Vol.203 (17), p.2637-2641
Hauptverfasser:	Dubey, R.L., Dubey, S.K., Yadav, A.D., Kanjilal, D.
Format:	Artikel
Sprache:	eng
Schlagworte:	Atomic force microscopy Cross-disciplinary physics: materials science rheology Exact sciences and technology Fe ions InP Materials science Physics Surface treatments Swift heavy ion irradiation X-ray diffraction
Online-Zugang:	Volltext
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