A new optical technique for investigations of low-Voltage circuit breakers
The technique of broad-band optical absorption spectroscopy has been successfully used for investigations of transient media in low-voltage circuit breakers, thanks to an intense radiation source developed at our laboratory. It enabled the determination of the concentration of copper atoms and C/sub...
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Veröffentlicht in: | IEEE transactions on plasma science 2005-04, Vol.33 (2), p.976-981 |
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creator | Dunpin Hong Sandolache, G. Bauchire, J.-M. Gentils, F. Fleurier, C. |
description | The technique of broad-band optical absorption spectroscopy has been successfully used for investigations of transient media in low-voltage circuit breakers, thanks to an intense radiation source developed at our laboratory. It enabled the determination of the concentration of copper atoms and C/sub 2/ molecules in hot gas behind a moving arc. The temperature of this gas was estimated using the molecular absorption spectrum of C/sub 2/ Swan bands. Thanks to the high-spectral intensity of the auxiliary source, measurements were also performed in an electrical arc. The measurements allowed the determination of the population of excited levels for several metallic atoms in the arc. Assuming local thermodynamic equilibrium, the electron temperature of the arc and the total concentration of these metallic atoms, coming from contacts and splitters, were deduced. This temperature is in good agreement with the one deduced from optical emission spectroscopy. |
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It enabled the determination of the concentration of copper atoms and C/sub 2/ molecules in hot gas behind a moving arc. The temperature of this gas was estimated using the molecular absorption spectrum of C/sub 2/ Swan bands. Thanks to the high-spectral intensity of the auxiliary source, measurements were also performed in an electrical arc. The measurements allowed the determination of the population of excited levels for several metallic atoms in the arc. Assuming local thermodynamic equilibrium, the electron temperature of the arc and the total concentration of these metallic atoms, coming from contacts and splitters, were deduced. This temperature is in good agreement with the one deduced from optical emission spectroscopy.</description><identifier>ISSN: 0093-3813</identifier><identifier>EISSN: 1939-9375</identifier><identifier>DOI: 10.1109/TPS.2005.844488</identifier><identifier>CODEN: ITPSBD</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Absorption ; Absorption spectroscopy ; Arcs, sparks, lightning ; Atom optics ; Atomic measurements ; Broad-band absorption spectroscopy ; Circuit breakers ; Circuits ; Copper ; Electric discharges ; Electric variables measurement ; Electron temperature ; Electrons ; Emissions ; Exact sciences and technology ; Laboratories ; Molecular absorption ; Optical (ultraviolet, visible, infrared) measurements ; optical diagnosis ; Optical emission spectroscopy ; Performance evaluation ; Physics ; Physics of gases, plasmas and electric discharges ; Physics of plasmas and electric discharges ; Plasma diagnostic techniques and instrumentation ; Plasma Physics ; Radiation ; Radiation sources ; Spectroscopy ; Swan bands ; Temperature ; Z-pinch radiation source</subject><ispartof>IEEE transactions on plasma science, 2005-04, Vol.33 (2), p.976-981</ispartof><rights>2005 INIST-CNRS</rights><rights>Copyright Institute of Electrical and Electronics Engineers, Inc. (IEEE) Apr 2005</rights><rights>Distributed under a Creative Commons Attribution 4.0 International License</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c492t-9e1561656b361a01f09272b5b2fa22a020ff1b64c2ab9dc848eada3e255a316e3</citedby><cites>FETCH-LOGICAL-c492t-9e1561656b361a01f09272b5b2fa22a020ff1b64c2ab9dc848eada3e255a316e3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1420652$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>230,309,310,314,780,784,789,790,796,885,23930,23931,25140,27924,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1420652$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=16697250$$DView record in Pascal Francis$$Hfree_for_read</backlink><backlink>$$Uhttps://hal.science/hal-01762356$$DView record in HAL$$Hfree_for_read</backlink></links><search><creatorcontrib>Dunpin Hong</creatorcontrib><creatorcontrib>Sandolache, G.</creatorcontrib><creatorcontrib>Bauchire, J.-M.</creatorcontrib><creatorcontrib>Gentils, F.</creatorcontrib><creatorcontrib>Fleurier, C.</creatorcontrib><title>A new optical technique for investigations of low-Voltage circuit breakers</title><title>IEEE transactions on plasma science</title><addtitle>TPS</addtitle><description>The technique of broad-band optical absorption spectroscopy has been successfully used for investigations of transient media in low-voltage circuit breakers, thanks to an intense radiation source developed at our laboratory. It enabled the determination of the concentration of copper atoms and C/sub 2/ molecules in hot gas behind a moving arc. The temperature of this gas was estimated using the molecular absorption spectrum of C/sub 2/ Swan bands. Thanks to the high-spectral intensity of the auxiliary source, measurements were also performed in an electrical arc. The measurements allowed the determination of the population of excited levels for several metallic atoms in the arc. Assuming local thermodynamic equilibrium, the electron temperature of the arc and the total concentration of these metallic atoms, coming from contacts and splitters, were deduced. This temperature is in good agreement with the one deduced from optical emission spectroscopy.</description><subject>Absorption</subject><subject>Absorption spectroscopy</subject><subject>Arcs, sparks, lightning</subject><subject>Atom optics</subject><subject>Atomic measurements</subject><subject>Broad-band absorption spectroscopy</subject><subject>Circuit breakers</subject><subject>Circuits</subject><subject>Copper</subject><subject>Electric discharges</subject><subject>Electric variables measurement</subject><subject>Electron temperature</subject><subject>Electrons</subject><subject>Emissions</subject><subject>Exact sciences and technology</subject><subject>Laboratories</subject><subject>Molecular absorption</subject><subject>Optical (ultraviolet, visible, infrared) measurements</subject><subject>optical diagnosis</subject><subject>Optical emission spectroscopy</subject><subject>Performance evaluation</subject><subject>Physics</subject><subject>Physics of gases, plasmas and electric discharges</subject><subject>Physics of plasmas and electric discharges</subject><subject>Plasma diagnostic techniques and instrumentation</subject><subject>Plasma Physics</subject><subject>Radiation</subject><subject>Radiation sources</subject><subject>Spectroscopy</subject><subject>Swan bands</subject><subject>Temperature</subject><subject>Z-pinch radiation source</subject><issn>0093-3813</issn><issn>1939-9375</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2005</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNqN0c9rFTEQB_AgFny2nj14WQQtHvZ1ZvJjN8dH0dbyQMHqNWTTbJu63bwm-1r875vnFgsexNNA5jMDky9jrxGWiKCPzr9-WxKAXLZCiLZ9xhaoua41b-RztgDQvOYt8hfsZc7XACgk0IKdrarR31dxMwVnh2ry7moMt1tf9TFVYbzzeQqXdgpxzFXsqyHe1z_iMNlLX7mQ3DZMVZe8_elTPmB7vR2yf_VY99n3Tx_Pj0_r9ZeTz8erde2EpqnWHqVCJVXHFVrAHjQ11MmOektkgaDvsVPCke30hWtF6-2F5Z6ktByV5_vsw7z3yg5mk8KNTb9MtMGcrtZm9wbYKOJS3WGxh7PdpFiuypO5Cdn5YbCjj9tsdLGIJGSR7_8pqUWhBOn_gCCJfsO3f8HruE1j-RqDWmIDWvKCjmbkUsw5-f7PRQhml6spuZpdrmbOtUy8e1xrc4msT3Z0IT-NKaUbklDcm9kF7_1TWxAoSfwBiSmo1Q</recordid><startdate>20050401</startdate><enddate>20050401</enddate><creator>Dunpin Hong</creator><creator>Sandolache, G.</creator><creator>Bauchire, J.-M.</creator><creator>Gentils, F.</creator><creator>Fleurier, C.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope><scope>8BQ</scope><scope>JG9</scope><scope>F28</scope><scope>FR3</scope><scope>1XC</scope></search><sort><creationdate>20050401</creationdate><title>A new optical technique for investigations of low-Voltage circuit breakers</title><author>Dunpin Hong ; Sandolache, G. ; Bauchire, J.-M. ; Gentils, F. ; Fleurier, C.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c492t-9e1561656b361a01f09272b5b2fa22a020ff1b64c2ab9dc848eada3e255a316e3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2005</creationdate><topic>Absorption</topic><topic>Absorption spectroscopy</topic><topic>Arcs, sparks, lightning</topic><topic>Atom optics</topic><topic>Atomic measurements</topic><topic>Broad-band absorption spectroscopy</topic><topic>Circuit breakers</topic><topic>Circuits</topic><topic>Copper</topic><topic>Electric discharges</topic><topic>Electric variables measurement</topic><topic>Electron temperature</topic><topic>Electrons</topic><topic>Emissions</topic><topic>Exact sciences and technology</topic><topic>Laboratories</topic><topic>Molecular absorption</topic><topic>Optical (ultraviolet, visible, infrared) measurements</topic><topic>optical diagnosis</topic><topic>Optical emission spectroscopy</topic><topic>Performance evaluation</topic><topic>Physics</topic><topic>Physics of gases, plasmas and electric discharges</topic><topic>Physics of plasmas and electric discharges</topic><topic>Plasma diagnostic techniques and instrumentation</topic><topic>Plasma Physics</topic><topic>Radiation</topic><topic>Radiation sources</topic><topic>Spectroscopy</topic><topic>Swan bands</topic><topic>Temperature</topic><topic>Z-pinch radiation source</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Dunpin Hong</creatorcontrib><creatorcontrib>Sandolache, G.</creatorcontrib><creatorcontrib>Bauchire, J.-M.</creatorcontrib><creatorcontrib>Gentils, F.</creatorcontrib><creatorcontrib>Fleurier, C.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>METADEX</collection><collection>Materials Research Database</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Hyper Article en Ligne (HAL)</collection><jtitle>IEEE transactions on plasma science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Dunpin Hong</au><au>Sandolache, G.</au><au>Bauchire, J.-M.</au><au>Gentils, F.</au><au>Fleurier, C.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A new optical technique for investigations of low-Voltage circuit breakers</atitle><jtitle>IEEE transactions on plasma science</jtitle><stitle>TPS</stitle><date>2005-04-01</date><risdate>2005</risdate><volume>33</volume><issue>2</issue><spage>976</spage><epage>981</epage><pages>976-981</pages><issn>0093-3813</issn><eissn>1939-9375</eissn><coden>ITPSBD</coden><abstract>The technique of broad-band optical absorption spectroscopy has been successfully used for investigations of transient media in low-voltage circuit breakers, thanks to an intense radiation source developed at our laboratory. It enabled the determination of the concentration of copper atoms and C/sub 2/ molecules in hot gas behind a moving arc. The temperature of this gas was estimated using the molecular absorption spectrum of C/sub 2/ Swan bands. Thanks to the high-spectral intensity of the auxiliary source, measurements were also performed in an electrical arc. The measurements allowed the determination of the population of excited levels for several metallic atoms in the arc. Assuming local thermodynamic equilibrium, the electron temperature of the arc and the total concentration of these metallic atoms, coming from contacts and splitters, were deduced. This temperature is in good agreement with the one deduced from optical emission spectroscopy.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/TPS.2005.844488</doi><tpages>6</tpages></addata></record> |
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subjects | Absorption Absorption spectroscopy Arcs, sparks, lightning Atom optics Atomic measurements Broad-band absorption spectroscopy Circuit breakers Circuits Copper Electric discharges Electric variables measurement Electron temperature Electrons Emissions Exact sciences and technology Laboratories Molecular absorption Optical (ultraviolet, visible, infrared) measurements optical diagnosis Optical emission spectroscopy Performance evaluation Physics Physics of gases, plasmas and electric discharges Physics of plasmas and electric discharges Plasma diagnostic techniques and instrumentation Plasma Physics Radiation Radiation sources Spectroscopy Swan bands Temperature Z-pinch radiation source |
title | A new optical technique for investigations of low-Voltage circuit breakers |
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