A comprehensive signature analysis scheme for oscillation-test

A low-cost and comprehensive built-in self-test (BIST) methodology for analog and mixed-signal circuits is described. We implement a time-division multiplexing (TDM) comparator to analyze the response of a circuit under test with minimum hardware overhead. The TDM comparator scheme is an effective s...

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Veröffentlicht in:	IEEE transactions on computer-aided design of integrated circuits and systems 2003-10, Vol.22 (10), p.1409-1423
Hauptverfasser:	Jeongjin Roh, Abraham, J.A.
Format:	Artikel
Sprache:	eng
Schlagworte:	Amplitudes Analog circuits Built-in self-test Circuit faults Circuit simulation Circuit testing Circuits Compaction Comparators Failure analysis Faults Frequency measurement Hardware Methodology Oscillations Time division multiplexing
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