Temporal response of CZT detectors under intense irradiation
The temporal response of CdZnTe (CZT) detectors is measured under different X-ray flux, spectra, and detector bias conditions. A comprehensive model has been developed to investigate the detector response under these conditions. The calculations have been compared with our measured results. Reasonab...
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| Veröffentlicht in: | IEEE transactions on nuclear science 2003-08, Vol.50 (4), p.1031-1035 |
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| container_title | IEEE transactions on nuclear science |
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| creator | Yanfeng Du LeBlanc, J. Possin, G.E. Yanoff, B.D. Bogdanovich, S. |
| description | The temporal response of CdZnTe (CZT) detectors is measured under different X-ray flux, spectra, and detector bias conditions. A comprehensive model has been developed to investigate the detector response under these conditions. The calculations have been compared with our measured results. Reasonable qualitative agreement is shown between the model and measurement results. This model provides a powerful tool to understand the detector temporal response, photocurrent dependence on the irradiation intensity, bias voltage, and defect characteristics. Understanding the detector response from a microscopic level can provide a guide to improve material properties and detector device design. |
| doi_str_mv | 10.1109/TNS.2003.815348 |
| format | Article |
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A comprehensive model has been developed to investigate the detector response under these conditions. The calculations have been compared with our measured results. Reasonable qualitative agreement is shown between the model and measurement results. This model provides a powerful tool to understand the detector temporal response, photocurrent dependence on the irradiation intensity, bias voltage, and defect characteristics. 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A comprehensive model has been developed to investigate the detector response under these conditions. The calculations have been compared with our measured results. Reasonable qualitative agreement is shown between the model and measurement results. This model provides a powerful tool to understand the detector temporal response, photocurrent dependence on the irradiation intensity, bias voltage, and defect characteristics. Understanding the detector response from a microscopic level can provide a guide to improve material properties and detector device design.</description><subject>Bias</subject><subject>Biomedical imaging</subject><subject>Cathodes</subject><subject>CZT</subject><subject>Detectors</subject><subject>Irradiation</subject><subject>Photoconductivity</subject><subject>Photocurrent</subject><subject>Pixel</subject><subject>Polarization</subject><subject>Radiation detectors</subject><subject>Spectra</subject><subject>Temporal logic</subject><subject>Voltage</subject><subject>X-ray detection</subject><subject>X-ray detectors</subject><subject>X-ray imaging</subject><issn>0018-9499</issn><issn>1558-1578</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2003</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNp9kLtLxEAQhxdR8HzUFjbBQqvc7ewru2Ajhy84tDA2NsteMoEcuWzcTQr_e_c4QbCwGmbm-w3MR8gF0DkANYvy5W3OKOVzDZILfUBmIKXOQRb6kMwoBZ0bYcwxOYlxk1ohqZyR2xK3gw-uywLGwfcRM99ky48yq3HEavQhZlNfY8jafsTdug3B1a0bW9-fkaPGdRHPf-opeX-4L5dP-er18Xl5t8orLsyY6zUXrlJrCZSBFpqJmilkxuG6kLTWUFMNTaU5FFSLRso6DVllUDElC0P5KbnZ3x2C_5wwjnbbxgq7zvXop2gNBaWNpjyR1_-STCtFBVMJvPoDbvwU-vSFNYwxzYUsErTYQ1XwMQZs7BDarQtfFqjdSbdJut1Jt3vpKXG5T7SI-EszBgYU_wYhjnr-</recordid><startdate>20030801</startdate><enddate>20030801</enddate><creator>Yanfeng Du</creator><creator>LeBlanc, J.</creator><creator>Possin, G.E.</creator><creator>Yanoff, B.D.</creator><creator>Bogdanovich, S.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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| issn | 0018-9499 1558-1578 |
| language | eng |
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| source | IEEE Electronic Library (IEL) |
| subjects | Bias Biomedical imaging Cathodes CZT Detectors Irradiation Photoconductivity Photocurrent Pixel Polarization Radiation detectors Spectra Temporal logic Voltage X-ray detection X-ray detectors X-ray imaging |
| title | Temporal response of CZT detectors under intense irradiation |
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