Characterization of a stress-applied polarization-maintaining (PM) fiber through photoelastic tomography
An accurate two-dimensional (2-D) axial stress profile of a polarization-maintaining (PM) fiber was determined using high-resolution photoelastic tomography. Likewise, determining all of the stress components of the fiber and the complete expression of stress-induced anisotropy was demonstrated. For...
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| Veröffentlicht in: | Journal of lightwave technology 2003-04, Vol.21 (4), p.997-1004 |
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| container_end_page | 1004 |
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| container_issue | 4 |
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| container_title | Journal of lightwave technology |
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| creator | PARK, Yongwoo PAEK, Un-Chul DUG YOUNG KIM |
| description | An accurate two-dimensional (2-D) axial stress profile of a polarization-maintaining (PM) fiber was determined using high-resolution photoelastic tomography. Likewise, determining all of the stress components of the fiber and the complete expression of stress-induced anisotropy was demonstrated. For the first time, we have expressed the anisotropy of a PM fiber in terms of birefringence distribution, and we have displayed the trajectories of principal axes on the cross section of the fiber. Mode coupling between the two orthogonal polarization modes due to the asymmetric stress applying parts of the PM fiber was also analyzed using an approximated coupled mode equation. |
| doi_str_mv | 10.1109/JLT.2003.810108 |
| format | Article |
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Likewise, determining all of the stress components of the fiber and the complete expression of stress-induced anisotropy was demonstrated. For the first time, we have expressed the anisotropy of a PM fiber in terms of birefringence distribution, and we have displayed the trajectories of principal axes on the cross section of the fiber. Mode coupling between the two orthogonal polarization modes due to the asymmetric stress applying parts of the PM fiber was also analyzed using an approximated coupled mode equation.</description><identifier>ISSN: 0733-8724</identifier><identifier>EISSN: 1558-2213</identifier><identifier>DOI: 10.1109/JLT.2003.810108</identifier><identifier>CODEN: JLTEDG</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Anisotropic magnetoresistance ; Anisotropy ; Applied sciences ; Approximation ; Birefringence ; Circuit properties ; Cross sections ; Electric, optical and optoelectronic circuits ; Electronics ; Exact sciences and technology ; Fibers ; Integrated optics. Optical fibers and wave guides ; Mathematical analysis ; Optical and optoelectronic circuits ; Optical fiber devices ; Optical fiber polarization ; Optical fiber sensors ; Optical fibers ; Photoelasticity ; Stress measurement ; Stresses ; Tomography ; Two dimensional displays</subject><ispartof>Journal of lightwave technology, 2003-04, Vol.21 (4), p.997-1004</ispartof><rights>2003 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2003</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c412t-9c94eca794a94bcfab1f526065d640b2c9299656f740ad9e591bf08b4d23e3fb3</citedby><cites>FETCH-LOGICAL-c412t-9c94eca794a94bcfab1f526065d640b2c9299656f740ad9e591bf08b4d23e3fb3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1207349$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27903,27904,54737</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1207349$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=14926176$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>PARK, Yongwoo</creatorcontrib><creatorcontrib>PAEK, Un-Chul</creatorcontrib><creatorcontrib>DUG YOUNG KIM</creatorcontrib><title>Characterization of a stress-applied polarization-maintaining (PM) fiber through photoelastic tomography</title><title>Journal of lightwave technology</title><addtitle>JLT</addtitle><description>An accurate two-dimensional (2-D) axial stress profile of a polarization-maintaining (PM) fiber was determined using high-resolution photoelastic tomography. Likewise, determining all of the stress components of the fiber and the complete expression of stress-induced anisotropy was demonstrated. For the first time, we have expressed the anisotropy of a PM fiber in terms of birefringence distribution, and we have displayed the trajectories of principal axes on the cross section of the fiber. Mode coupling between the two orthogonal polarization modes due to the asymmetric stress applying parts of the PM fiber was also analyzed using an approximated coupled mode equation.</description><subject>Anisotropic magnetoresistance</subject><subject>Anisotropy</subject><subject>Applied sciences</subject><subject>Approximation</subject><subject>Birefringence</subject><subject>Circuit properties</subject><subject>Cross sections</subject><subject>Electric, optical and optoelectronic circuits</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Fibers</subject><subject>Integrated optics. Optical fibers and wave guides</subject><subject>Mathematical analysis</subject><subject>Optical and optoelectronic circuits</subject><subject>Optical fiber devices</subject><subject>Optical fiber polarization</subject><subject>Optical fiber sensors</subject><subject>Optical fibers</subject><subject>Photoelasticity</subject><subject>Stress measurement</subject><subject>Stresses</subject><subject>Tomography</subject><subject>Two dimensional displays</subject><issn>0733-8724</issn><issn>1558-2213</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2003</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNp90b1vGyEYBnBUtVJdt3OHLqdKbdLhHHjhOBgrK_2IHLVDOp_ew-AjOh9XwEPy1wfLqSJ1yIAY-L2PgIeQ94yuGKP64mpzswJK-Uoxyqh6QRasaVQNwPhLsqAt57VqQbwmb1K6pZQJodoFGdYDRjTZRn-P2YepCq7CKuVoU6pxnkdvt9UcRvwH6j36KZflp111_vv6S-V8b2OVhxgOu6Gah5CDHTFlb6oc9mEXcR7u3pJXDsdk3z3uS_Ln2-XN-ke9-fX95_rrpjaCQa610cIabLVALXrjsGeuAUlls5WC9mA0aC0b6VpBcatto1nvqOrFFrjlrudLcnbKnWP4e7Apd3ufjB1HnGw4pE5TJtuW66bIz89KUEAFcFXg-bOQUQDN6PGLl-Tjf_Q2HOJUHtwpJUCCgGPexQmZGFKK1nVz9HuMdyWpO3bZlS67Y5fdqcsy8ekxFpPB0UWcjE9PY0KDZK0s7sPJeWvt0zGUqwnNHwCIe6eb</recordid><startdate>20030401</startdate><enddate>20030401</enddate><creator>PARK, Yongwoo</creator><creator>PAEK, Un-Chul</creator><creator>DUG YOUNG KIM</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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Optical fibers and wave guides</topic><topic>Mathematical analysis</topic><topic>Optical and optoelectronic circuits</topic><topic>Optical fiber devices</topic><topic>Optical fiber polarization</topic><topic>Optical fiber sensors</topic><topic>Optical fibers</topic><topic>Photoelasticity</topic><topic>Stress measurement</topic><topic>Stresses</topic><topic>Tomography</topic><topic>Two dimensional displays</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>PARK, Yongwoo</creatorcontrib><creatorcontrib>PAEK, Un-Chul</creatorcontrib><creatorcontrib>DUG YOUNG KIM</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of lightwave technology</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>PARK, Yongwoo</au><au>PAEK, Un-Chul</au><au>DUG YOUNG KIM</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Characterization of a stress-applied polarization-maintaining (PM) fiber through photoelastic tomography</atitle><jtitle>Journal of lightwave technology</jtitle><stitle>JLT</stitle><date>2003-04-01</date><risdate>2003</risdate><volume>21</volume><issue>4</issue><spage>997</spage><epage>1004</epage><pages>997-1004</pages><issn>0733-8724</issn><eissn>1558-2213</eissn><coden>JLTEDG</coden><abstract>An accurate two-dimensional (2-D) axial stress profile of a polarization-maintaining (PM) fiber was determined using high-resolution photoelastic tomography. Likewise, determining all of the stress components of the fiber and the complete expression of stress-induced anisotropy was demonstrated. For the first time, we have expressed the anisotropy of a PM fiber in terms of birefringence distribution, and we have displayed the trajectories of principal axes on the cross section of the fiber. Mode coupling between the two orthogonal polarization modes due to the asymmetric stress applying parts of the PM fiber was also analyzed using an approximated coupled mode equation.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/JLT.2003.810108</doi><tpages>8</tpages></addata></record> |
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| identifier | ISSN: 0733-8724 |
| ispartof | Journal of lightwave technology, 2003-04, Vol.21 (4), p.997-1004 |
| issn | 0733-8724 1558-2213 |
| language | eng |
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| source | IEEE Electronic Library (IEL) |
| subjects | Anisotropic magnetoresistance Anisotropy Applied sciences Approximation Birefringence Circuit properties Cross sections Electric, optical and optoelectronic circuits Electronics Exact sciences and technology Fibers Integrated optics. Optical fibers and wave guides Mathematical analysis Optical and optoelectronic circuits Optical fiber devices Optical fiber polarization Optical fiber sensors Optical fibers Photoelasticity Stress measurement Stresses Tomography Two dimensional displays |
| title | Characterization of a stress-applied polarization-maintaining (PM) fiber through photoelastic tomography |
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