Growth of GaN films with low oxygen concentration using Ga sub(2)O vapor and NH sub(3)

In this study, we investigated the relationship between surface morphology and oxygen concentration in GaN layers synthesized from Ga sub(2)O vapor and NH sub(3). The surface morphology of GaN layers changed from rough (with large numbers of pits) to (0 0 0 1) smooth planes with the increase in NH s...

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Veröffentlicht in:Journal of crystal growth 2011-07, Vol.327 (1), p.89-93
Hauptverfasser: Bu, Yuan, Imade, Mamoru, Kishimoto, Hiroki, Yoshimura, Masashi, Sasaki, Takatomo, Kitaoka, Yasuo, Isemura, Masashi, Mori, Yusuke
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container_end_page 93
container_issue 1
container_start_page 89
container_title Journal of crystal growth
container_volume 327
creator Bu, Yuan
Imade, Mamoru
Kishimoto, Hiroki
Yoshimura, Masashi
Sasaki, Takatomo
Kitaoka, Yasuo
Isemura, Masashi
Mori, Yusuke
description In this study, we investigated the relationship between surface morphology and oxygen concentration in GaN layers synthesized from Ga sub(2)O vapor and NH sub(3). The surface morphology of GaN layers changed from rough (with large numbers of pits) to (0 0 0 1) smooth planes with the increase in NH sub(3) concentration. SIMS mapping analysis revealed that the oxygen concentration was on the order of 10 super(17) atoms/cm super(3), the lowest level obtained in GaN layers synthesized from Ga sub(2)O vapor and NH sub(3), at the smooth (0 0 0 1) surfaces. By contrast, high oxygen concentration over 10 super(20) atoms/cm super(3) was detected at the pitted areas. We concluded that GaN films with low oxygen contamination can be obtained by suppressing pit formation and promoting the smoothness of the (0 0 0 1) surface, even when using Ga sub(2)O as the Ga source.
doi_str_mv 10.1016/j.jcrysgro.2011.06.001
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source Elsevier ScienceDirect Journals
subjects Contamination
Gallium
Gallium nitrides
Morphology
Pits
Retarding
Smoothness
title Growth of GaN films with low oxygen concentration using Ga sub(2)O vapor and NH sub(3)
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