The examination of works of art using in situ XRF line and area scans

Spatially resolved element distributions generated by in situ X‐ray fluorescence (XRF) line and area scans are shown to provide information about works of art which may not be obtainable from single spot spectra. In addition to generating visually powerful element maps and line profiles, this method...

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Veröffentlicht in:X-ray spectrometry 2010-05, Vol.39 (3), p.159-166
Hauptverfasser: Trentelman, Karen, Bouchard, Michel, Ganio, Monica, Namowicz, Carole, Patterson, Catherine Schmidt, Walton, Marc
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Sprache:eng
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